Other articles related with "transistors":
68401 Yalin Li(李亚霖), Kailu Shi(时凯璐), Yixin Zhu(朱一新), Xiao Fang(方晓), Hangyuan Cui(崔航源), Qing Wan(万青), and Changjin Wan(万昌锦)
  One memristor-one electrolyte-gated transistor-based high energy-efficient dropout neuronal units
    Chin. Phys. B   2024 Vol.33 (6): 68401-068401 [Abstract] (104) [HTML 1 KB] [PDF 923 KB] (126)
48102 Liping Zhang(张丽萍), Zongyao Sun(孙宗耀), Jiani Li(李佳妮), and Junyan Su(苏俊燕)
  Effect of external magnetic field on the instability of THz plasma waves in nanoscale graphene field-effect transistors
    Chin. Phys. B   2024 Vol.33 (4): 48102-048102 [Abstract] (179) [HTML 1 KB] [PDF 690 KB] (67)
118101 Yang Yang(杨洋), Chuanyu Fu(傅传玉), Shuo Ke(柯硕), Hangyuan Cui(崔航源), Xiao Fang(方晓), Changjin Wan(万昌锦), and Qing Wan(万青)
  W-doped In2O3 nanofiber optoelectronic neuromorphic transistors with synergistic synaptic plasticity
    Chin. Phys. B   2023 Vol.32 (11): 118101-118101 [Abstract] (164) [HTML 1 KB] [PDF 1331 KB] (121)
108101 Xuerui Niu(牛雪锐), Bin Hou(侯斌), Meng Zhang(张濛), Ling Yang(杨凌), Mei Wu(武玫), Xinchuang Zhang(张新创), Fuchun Jia(贾富春), Chong Wang(王冲), Xiaohua Ma(马晓华), and Yue Hao(郝跃)
  Novel GaN-based double-channel p-heterostructure field-effect transistors with a p-GaN insertion layer
    Chin. Phys. B   2023 Vol.32 (10): 108101-108101 [Abstract] (168) [HTML 0 KB] [PDF 720 KB] (148)
98503 Xiaoyu Pan(潘霄宇), Hongxia Guo(郭红霞), Yahui Feng(冯亚辉), Yinong Liu(刘以农), Jinxin Zhang(张晋新), Jun Fu(付军), and Guofang Yu(喻国芳)
  Temperature dependence of single-event transients in SiGe heterojunction bipolar transistors for cryogenic applications
    Chin. Phys. B   2023 Vol.32 (9): 98503-098503 [Abstract] (174) [HTML 1 KB] [PDF 6512 KB] (96)
87701 Xiaoqing Sun(孙晓清), Hao Xu(徐昊), Junshuai Chai(柴俊帅), Xiaolei Wang(王晓磊), and Wenwu Wang(王文武)
  Charge trapping effect at the interface of ferroelectric/interlayer in the ferroelectric field effect transistor gate stack
    Chin. Phys. B   2023 Vol.32 (8): 87701-087701 [Abstract] (182) [HTML 1 KB] [PDF 716 KB] (368)
78504 Jiale Sun(孙佳乐), Yuming Zhang(张玉明), Hongliang Lu(吕红亮), Zhijun Lyu(吕智军),Yi Zhu(朱翊), Yuche Pan(潘禹澈), and Bin Lu(芦宾)
  High on-state current p-type tunnel effect transistor based on doping modulation
    Chin. Phys. B   2023 Vol.32 (7): 78504-078504 [Abstract] (205) [HTML 0 KB] [PDF 663 KB] (74)
28504 Hong Zhang(张鸿), Hongxia Guo(郭红霞), Zhifeng Lei(雷志锋), Chao Peng(彭超), Zhangang Zhang(张战刚), Ziwen Chen(陈资文), Changhao Sun(孙常皓), Yujuan He(何玉娟), Fengqi Zhang(张凤祁), Xiaoyu Pan(潘霄宇), Xiangli Zhong(钟向丽), and Xiaoping Ouyang(欧阳晓平)
  Experiment and simulation on degradation and burnout mechanisms of SiC MOSFET under heavy ion irradiation
    Chin. Phys. B   2023 Vol.32 (2): 28504-028504 [Abstract] (371) [HTML 1 KB] [PDF 1582 KB] (175)
88101 Tianyuan Song(宋天源), Dongli Zhang(张冬利), Mingxiang Wang(王明湘), and Qi Shan(单奇)
  Degradation mechanisms for a-InGaZnO thin-film transistors functioning under simultaneous DC gate and drain biases
    Chin. Phys. B   2022 Vol.31 (8): 88101-088101 [Abstract] (430) [HTML 1 KB] [PDF 813 KB] (141)
57301 Xinchuang Zhang(张新创), Mei Wu(武玫), Bin Hou(侯斌), Xuerui Niu(牛雪锐), Hao Lu(芦浩), Fuchun Jia(贾富春), Meng Zhang(张濛), Jiale Du(杜佳乐), Ling Yang(杨凌), Xiaohua Ma(马晓华), and Yue Hao(郝跃)
  Improved device performance of recessed-gate AlGaN/GaN HEMTs by using in-situ N2O radical treatment
    Chin. Phys. B   2022 Vol.31 (5): 57301-057301 [Abstract] (461) [HTML 1 KB] [PDF 2309 KB] (187)
28502 Yuan-Ting Huang(黄垣婷), Xiu-Hai Cui(崔秀海), Jian-Qun Yang(杨剑群), Tao Ying(应涛), Xue-Qiang Yu(余雪强), Lei Dong(董磊), Wei-Qi Li(李伟奇), and Xing-Ji Li(李兴冀)
  Radiation effects of 50-MeV protons on PNP bipolar junction transistors
    Chin. Phys. B   2022 Vol.31 (2): 28502-028502 [Abstract] (413) [HTML 0 KB] [PDF 908 KB] (121)
17701 Yang-Yan Guo(郭仰岩), Wei-Hua Han(韩伟华), Xiao-Di Zhang(张晓迪), Jun-Dong Chen(陈俊东), and Fu-Hua Yang(杨富华)
  Observation of source/drain bias-controlled quantum transport spectrum in junctionless silicon nanowire transistor
    Chin. Phys. B   2022 Vol.31 (1): 17701-017701 [Abstract] (554) [HTML 1 KB] [PDF 3301 KB] (160)
118102 Jianing Guo(郭佳宁), Dongli Zhang(张冬利), Mingxiang Wang(王明湘), and Huaisheng Wang(王槐生)
  Degradation and its fast recovery in a-IGZO thin-film transistors under negative gate bias stress
    Chin. Phys. B   2021 Vol.30 (11): 118102-118102 [Abstract] (509) [HTML 0 KB] [PDF 1026 KB] (77)
116105 Jia-Ning Liu(刘嘉宁), Feng-Xiang Chen(陈凤翔), Wen Deng(邓文), Xue-Ling Yu(余雪玲), and Li-Sheng Wang(汪礼胜)
  Optically-controlled resistive switching effectsof CdS nanowire memtransistor
    Chin. Phys. B   2021 Vol.30 (11): 116105-116105 [Abstract] (608) [HTML 0 KB] [PDF 1569 KB] (84)
78502 Xi-Kun Feng(冯希昆), Xiao-Feng Gu(顾晓峰), Qin-Ling Ma(马琴玲), Yan-Ni Yang(杨燕妮), and Hai-Lian Liang(梁海莲)
  Design and investigation of novel ultra-high-voltage junction field-effect transistor embedded with NPN
    Chin. Phys. B   2021 Vol.30 (7): 78502-078502 [Abstract] (459) [HTML 1 KB] [PDF 1964 KB] (143)
58102 Rui Liu(刘锐), Yongli He(何勇礼), Shanshan Jiang(姜珊珊), Li Zhu(朱力), Chunsheng Chen(陈春生), Ying Zhu(祝影), and Qing Wan(万青)
  Synaptic plasticity and classical conditioning mimicked in single indium-tungsten-oxide based neuromorphic transistor
    Chin. Phys. B   2021 Vol.30 (5): 58102-058102 [Abstract] (539) [HTML 1 KB] [PDF 900 KB] (312)
47103 Si-De Song(宋思德), Su-Zhen Wu(吴素贞), Guo-Zhu Liu(刘国柱), Wei Zhao(赵伟), Yin-Quan Wang(王印权), Jian-Wei Wu(吴建伟), and Qi He(贺琪)
  Analysis on degradation mechanisms of normally-off p-GaN gate AlGaN/GaN high-electron mobility transistor
    Chin. Phys. B   2021 Vol.30 (4): 47103- [Abstract] (422) [HTML 1 KB] [PDF 2118 KB] (134)
40502 Hao Zou(邹浩), Lin-An Yang(杨林安), Xiao-Hua Ma(马晓华), and Yue Hao(郝跃)
  Effects of notch structures on DC and RF performances of AlGaN/GaN high electron mobility transistors
    Chin. Phys. B   2021 Vol.30 (4): 40502- [Abstract] (615) [HTML 1 KB] [PDF 3285 KB] (145)
28503 Si-Cheng Liu(刘思成), Xiao-Yan Tang(汤晓燕), Qing-Wen Song(宋庆文), Hao Yuan(袁昊), Yi-Meng Zhang(张艺蒙), Yi-Men Zhang(张义门), and Yu-Ming Zhang(张玉明)
  Lateral depletion-mode 4H-SiC n-channel junction field-effect transistors operational at 400 °C
    Chin. Phys. B   2021 Vol.30 (2): 28503-0 [Abstract] (409) [HTML 1 KB] [PDF 876 KB] (86)
118101 Yalan Wang(王雅兰), Mingxiang Wang(王明湘), Dongli Zhang(张冬利), and Huaisheng Wang(王槐生)
  A systematic study of light dependency of persistent photoconductivity in a-InGaZnO thin-film transistors
    Chin. Phys. B   2020 Vol.29 (11): 118101- [Abstract] (561) [HTML 1 KB] [PDF 951 KB] (212)
97701 Bo-Bo Tian(田博博), Ni Zhong(钟妮), Chun-Gang Duan(段纯刚)
  Recent advances, perspectives, and challenges inferroelectric synapses
    Chin. Phys. B   2020 Vol.29 (9): 97701-097701 [Abstract] (651) [HTML 0 KB] [PDF 5166 KB] (240)
118501 M Micjan, M Novota, P Telek, M Donoval, M Weis
  Hunting down the ohmic contact of organic field-effect transistor
    Chin. Phys. B   2019 Vol.28 (11): 118501-118501 [Abstract] (624) [HTML 1 KB] [PDF 579 KB] (121)
107301 Mei Ge(葛梅), Qing Cai(蔡青), Bao-Hua Zhang(张保花), Dun-Jun Chen(陈敦军), Li-Qun Hu(胡立群), Jun-Jun Xue(薛俊俊), Hai Lu(陆海), Rong Zhang(张荣), You-Dou Zheng(郑有炓)
  Negative transconductance effect in p-GaN gate AlGaN/GaN HEMTs by traps in unintentionally doped GaN buffer layer
    Chin. Phys. B   2019 Vol.28 (10): 107301-107301 [Abstract] (907) [HTML 1 KB] [PDF 1005 KB] (283)
107303 Yang-Yan Guo(郭仰岩), Wei-Hua Han(韩伟华), Xiao-Song Zhao(赵晓松), Ya-Mei Dou(窦亚梅), Xiao-Di Zhang(张晓迪), Xin-Yu Wu(吴歆宇), Fu-Hua Yang(杨富华)
  Observation of hopping transitions for delocalized electrons by temperature-dependent conductance in siliconjunctionless nanowire transistors
    Chin. Phys. B   2019 Vol.28 (10): 107303-107303 [Abstract] (617) [HTML 1 KB] [PDF 1057 KB] (148)
98502 Rui Chen(陈蕊), Dong-Yue Jin(金冬月), Wan-Rong Zhang(张万荣), Li-Fan Wang(王利凡), Bin Guo(郭斌), Hu Chen(陈虎), Ling-Han Yin(殷凌寒), Xiao-Xue Jia(贾晓雪)
  Thermal resistance matrix representation of thermal effects and thermal design of microwave power HBTs with two-dimensional array layout
    Chin. Phys. B   2019 Vol.28 (9): 98502-098502 [Abstract] (707) [HTML 1 KB] [PDF 2321 KB] (1079)
68504 Zheng-Xin Wen(温正欣), Feng Zhang(张峰), Zhan-Wei Shen(申占伟), Jun Chen(陈俊), Ya-Wei He(何亚伟), Guo-Guo Yan(闫果果), Xing-Fang Liu(刘兴昉), Wan-Shun Zhao(赵万顺), Lei Wang(王雷), Guo-Sheng Sun(孙国胜), Yi-Ping Zeng(曾一平)
  Design and fabrication of 10-kV silicon-carbide p-channel IGBTs with hexagonal cells and step space modulated junction termination extension
    Chin. Phys. B   2019 Vol.28 (6): 68504-068504 [Abstract] (776) [HTML 1 KB] [PDF 1521 KB] (302)
67302 Yan Liu(刘岩), Wei Chen(陈伟), Chaohui He(贺朝会), Chunlei Su(苏春垒), Chenhui Wang(王晨辉), Xiaoming Jin(金晓明), Junlin Li(李俊霖), Yuanyuan Xue(薛院院)
  Analysis of displacement damage effects on bipolar transistors irradiated by spallation neutrons
    Chin. Phys. B   2019 Vol.28 (6): 67302-067302 [Abstract] (711) [HTML 1 KB] [PDF 1403 KB] (166)
17105 Zeng Liu(刘增), Pei-Gang Li(李培刚), Yu-Song Zhi(支钰崧), Xiao-Long Wang(王小龙), Xu-Long Chu(褚旭龙), Wei-Hua Tang(唐为华)
  Review of gallium oxide based field-effect transistors and Schottky barrier diodes
    Chin. Phys. B   2019 Vol.28 (1): 17105-017105 [Abstract] (972) [HTML 1 KB] [PDF 5647 KB] (918)
78502 Cong Li(李聪), Zhi-Rui Yan(闫志蕊), Yi-Qi Zhuang(庄奕琪), Xiao-Long Zhao(赵小龙), Jia-Min Guo(郭嘉敏)
  Ge/Si heterojunction L-shape tunnel field-effect transistors with hetero-gate-dielectric
    Chin. Phys. B   2018 Vol.27 (7): 78502-078502 [Abstract] (559) [HTML 0 KB] [PDF 1485 KB] (242)
48504 Xu-Yang Li(栗旭阳), Zhi-Nong Yu(喻志农), Jin Cheng(程锦), Yong-Hua Chen(陈永华), Jian-She Xue(薛建设), Jian Guo(郭建), Wei Xue(薛唯)
  Water-based processed and alkoxide-based processed indium oxide thin-film transistors at different annealing temperatures
    Chin. Phys. B   2018 Vol.27 (4): 48504-048504 [Abstract] (755) [HTML 1 KB] [PDF 4283 KB] (241)
47208 Su-Zhen Luan(栾苏珍), Yu-Cheng Wang(汪钰成), Yin-Tao Liu(刘银涛), Ren-Xu Jia(贾仁需)
  Effect of depositing PCBM on perovskite-based metal-oxide-semiconductor field effect transistors
    Chin. Phys. B   2018 Vol.27 (4): 47208-047208 [Abstract] (720) [HTML 1 KB] [PDF 1054 KB] (253)
16103 J Assaf
  Bulk and surface damages in complementary bipolar junction transistors produced by high dose irradiation
    Chin. Phys. B   2018 Vol.27 (1): 16103-016103 [Abstract] (612) [HTML 1 KB] [PDF 1198 KB] (252)
128101 Dong-Yu Qi(齐栋宇), Dong-Li Zhang(张冬利), Ming-Xiang Wang(王明湘)
  Positive gate bias stress-induced hump-effect in elevated-metal metal-oxide thin film transistors
    Chin. Phys. B   2017 Vol.26 (12): 128101-128101 [Abstract] (666) [HTML 0 KB] [PDF 443 KB] (485)
98502 Ya-Bin Sun(孙亚宾), Xiao-Jin Li(李小进), Jin-Zhong Zhang(张金中), Yan-Ling Shi(石艳玲)
  Improved high-frequency equivalent circuit model based on distributed effects for SiGe HBTs with CBE layout
    Chin. Phys. B   2017 Vol.26 (9): 98502-098502 [Abstract] (904) [HTML 0 KB] [PDF 612 KB] (247)
97104 Yan Liu(刘艳), Zhao-Jun Lin(林兆军), Yuan-Jie Lv(吕元杰), Peng Cui(崔鹏), Chen Fu(付晨), Ruilong Han(韩瑞龙), Yu Huo(霍宇), Ming Yang(杨铭)
  Parasitic source resistance at different temperatures for AlGaN/AlN/GaN heterostructure field-effect transistors
    Chin. Phys. B   2017 Vol.26 (9): 97104-097104 [Abstract] (740) [HTML 0 KB] [PDF 409 KB] (254)
97401 Shenyan Feng(冯申艳), Qiaoxuan Zhang(张巧璇), Jie Yang(杨洁), Ming Lei(雷鸣), Ruge Quhe(屈贺如歌)
  Tunneling field effect transistors based on in-plane and vertical layered phosphorus heterostructures
    Chin. Phys. B   2017 Vol.26 (9): 97401-097401 [Abstract] (619) [HTML 1 KB] [PDF 1008 KB] (258)
47307 Yong-Hui Zhang(张永晖), Zeng-Xia Mei(梅增霞), Hui-Li Liang(梁会力), Xiao-Long Du(杜小龙)
  Review of flexible and transparent thin-film transistors based on zinc oxide and related materials
    Chin. Phys. B   2017 Vol.26 (4): 47307-047307 [Abstract] (799) [HTML 1 KB] [PDF 7052 KB] (1761)
37307 Xuefei Li(李学飞), Xiong Xiong(熊雄), Yanqing Wu(吴燕庆)
  Toward high-performance two-dimensional black phosphorus electronic and optoelectronic devices
    Chin. Phys. B   2017 Vol.26 (3): 37307-037307 [Abstract] (824) [HTML 1 KB] [PDF 5935 KB] (504)
117305 Yun-Long He(何云龙), Chong Wang(王冲), Min-Han Mi(宓珉瀚), Xue-Feng Zheng(郑雪峰), Meng Zhang(张濛), Meng-Di Zhao(赵梦荻), Heng-Shuang Zhang(张恒爽), Li-Xiang Chen(陈立香), Jin-Cheng Zhang(张进成), Xiao-Hua Ma(马晓华), Yue Hao(郝跃)
  Recessed-gate quasi-enhancement-mode AlGaN/GaN high electron mobility transistors with oxygen plasma treatment
    Chin. Phys. B   2016 Vol.25 (11): 117305-117305 [Abstract] (948) [HTML 1 KB] [PDF 1879 KB] (453)
97202 Jun Chen(陈俊), Jiabing Lv(吕加兵)
  Spectral response modeling and analysis of p-n-p In0.53Ga0.47As/InP HPTs
    Chin. Phys. B   2016 Vol.25 (9): 97202-097202 [Abstract] (811) [HTML 1 KB] [PDF 233 KB] (284)
96110 Lili Ding(丁李利), Simone Gerardin, Marta Bagatin, Dario Bisello, Serena Mattiazzo, Alessandro Paccagnella
  Comparison of radiation degradation induced by x-rayand 3-MeV protons in 65-nm CMOS transistors
    Chin. Phys. B   2016 Vol.25 (9): 96110-096110 [Abstract] (861) [HTML 1 KB] [PDF 251 KB] (329)
57306 Chen-Fei Wu(武辰飞), Yun-Feng Chen(陈允峰), Hai Lu(陆海), Xiao-Ming Huang(黄晓明), Fang-Fang Ren(任芳芳), Dun-Jun Chen(陈敦军), Rong Zhang(张荣), You-Dou Zheng(郑有炓)
  Contact resistance asymmetry of amorphous indium-gallium-zinc-oxide thin-film transistors by scanning Kelvin probe microscopy
    Chin. Phys. B   2016 Vol.25 (5): 57306-057306 [Abstract] (792) [HTML 1 KB] [PDF 654 KB] (576)
46104 Qi-Feng Zhao(赵启凤), Yi-Qi Zhuang(庄奕琪), Jun-Lin Bao(包军林), Wei Hu(胡为)
  Radiation-induced 1/f noise degradation of PNP bipolar junction transistors at different dose rates
    Chin. Phys. B   2016 Vol.25 (4): 46104-046104 [Abstract] (788) [HTML 1 KB] [PDF 363 KB] (373)
37306 Qing-Wen Song(宋庆文), Xiao-Yan Tang(汤晓燕), Yan-Jing He(何艳静), Guan-Nan Tang(唐冠男),Yue-Hu Wang(王悦湖), Yi-Meng Zhang(张艺蒙), Hui Guo(郭辉), Ren-Xu Jia(贾仁需),Hong-Liang Lv(吕红亮), Yi-Men Zhang(张义门), Yu-Ming Zhang(张玉明)
  Fabrication and characterization of the normally-off N-channel lateral 4H-SiC metal-oxide-semiconductor field-effect transistors
    Chin. Phys. B   2016 Vol.25 (3): 37306-037306 [Abstract] (720) [HTML 0 KB] [PDF 923 KB] (419)
38503 Liuan Li(李柳暗), Jiaqi Zhang(张家琦), Yang Liu(刘扬), Jin-Ping Ao(敖金平)
  Evaluation of a gate-first process for AlGaN/GaN metal-oxide-semiconductor heterostructure field-effect transistors with low ohmic annealing temperature
    Chin. Phys. B   2016 Vol.25 (3): 38503-038503 [Abstract] (887) [HTML 0 KB] [PDF 371 KB] (381)
27701 Zhi Jiang(蒋 智), Yi-Qi Zhuang(庄奕琪), Cong Li(李 聪), Ping Wang(王 萍), Yu-Qi Liu(刘予琪)
  Influence of trap-assisted tunneling on trap-assisted tunneling current in double gate tunnel field-effect transistor
    Chin. Phys. B   2016 Vol.25 (2): 27701-027701 [Abstract] (855) [HTML 1 KB] [PDF 356 KB] (498)
27303 Jun Luo(罗俊), Sheng-Lei Zhao(赵胜雷), Min-Han Mi(宓珉瀚), Wei-Wei Chen(陈伟伟), Bin Hou(侯斌), Jin-Cheng Zhang(张进成), Xiao-Hua Ma(马晓华), Yue Hao(郝跃)
  Effect of gate length on breakdown voltage in AlGaN/GaN high-electron-mobility transistor
    Chin. Phys. B   2016 Vol.25 (2): 27303-027303 [Abstract] (1033) [HTML 1 KB] [PDF 496 KB] (946)
128101 Ma Liu-Hong (马刘红), Han Wei-Hua (韩伟华), Wang Hao (王昊), Yang Xiang (杨香), Yang Fu-Hua (杨富华)
  Charge trapping in surface accumulation layer of heavily doped junctionless nanowire transistors
    Chin. Phys. B   2015 Vol.24 (12): 128101-128101 [Abstract] (881) [HTML 1 KB] [PDF 1597 KB] (415)
127306 Zhang Peng (张鹏), Zhao Sheng-Lei (赵胜雷), Xue Jun-Shuai (薛军帅), Zhu Jie-Jie (祝杰杰), Ma Xiao-Hua (马晓华), Zhang Jin-Cheng (张进成), Hao Yue (郝跃)
  Investigation of trap states in Al2O3 InAlN/GaN metal-oxide-semiconductor high-electron-mobility transistors
    Chin. Phys. B   2015 Vol.24 (12): 127306-127306 [Abstract] (819) [HTML 1 KB] [PDF 472 KB] (532)
117305 Luo Jun (罗俊), Zhao Sheng-Lei (赵胜雷), Mi Min-Han (宓珉瀚), Hou Bin (侯斌), Yang Xiao-Lei (杨晓蕾), Zhang Jin-Cheng (张进成), Ma Xiao-Hua (马晓华), Hao Yue (郝跃)
  Trap states induced by reactive ion etching in AlGaN/GaN high-electron-mobility transistors
    Chin. Phys. B   2015 Vol.24 (11): 117305-117305 [Abstract] (835) [HTML 1 KB] [PDF 339 KB] (598)
117103 Yang Ming (杨铭), Lin Zhao-Jun (林兆军), Zhao Jing-Tao (赵景涛), Wang Yu-Tang (王玉堂), Li Zhi-Yuan (李志远), Lü Yuan-Jie (吕元杰), Feng Zhi-Hong (冯志红)
  Improvement of switching characteristics by substrate bias in AlGaN/AlN/GaN heterostructure field effect transistors
    Chin. Phys. B   2015 Vol.24 (11): 117103-117103 [Abstract] (531) [HTML 1 KB] [PDF 257 KB] (293)
96803 Xie Ying-Tao (谢应涛), Ouyang Shi-Hong (欧阳世宏), Wang Dong-Ping (王东平), Zhu Da-Long (朱大龙), Xu Xin (许鑫), Tan Te (谭特), Fong Hon-Hang (方汉铿)
  Performance improvement in polymeric thin film transistors using chemically modified both silver bottom contacts and dielectric surfaces
    Chin. Phys. B   2015 Vol.24 (9): 96803-096803 [Abstract] (778) [HTML 1 KB] [PDF 379 KB] (537)
88504 Tang Lan-Feng (汤兰凤), Yu Guang (于广), Lu Hai (陆海), Wu Chen-Fei (武辰飞), Qian Hui-Min (钱慧敏), Zhou Dong (周东), Zhang Rong (张荣), Zheng You-Dou (郑有炓), Huang Xiao-Ming (黄晓明)
  Influence of white light illumination on the performance of a-IGZO thin film transistor under positive gate-bias stress
    Chin. Phys. B   2015 Vol.24 (8): 88504-088504 [Abstract] (914) [HTML 1 KB] [PDF 398 KB] (988)
77307 Qian Hui-Min (钱慧敏), Yu Guang (于广), Lu Hai (陆海), Wu Chen-Fei (武辰飞), Tang Lan-Feng (汤兰凤), Zhou Dong (周东), Ren Fang-Fang (任芳芳), Zhang Rong (张荣), Zheng You-Liao (郑有炓), Huang Xiao-Ming (黄晓明)
  Temperature-dependent bias-stress-induced electrical instability of amorphous indium-gallium-zinc-oxide thin-film transistors
    Chin. Phys. B   2015 Vol.24 (7): 77307-077307 [Abstract] (742) [HTML 1 KB] [PDF 552 KB] (475)
67301 He Xiao-Guang (何晓光), Zhao De-Gang (赵德刚), Jiang De-Sheng (江德生)
  Formation of two-dimensional electron gas at AlGaN/GaN heterostructure and the derivation of its sheet density expression
    Chin. Phys. B   2015 Vol.24 (6): 67301-067301 [Abstract] (933) [HTML 1 KB] [PDF 473 KB] (2252)
58502 Fu Zong-Yuan (浮宗元), Zhang Jian-Chi (张剑驰), Hu Jing-Hang (胡静航), Jiang Yu-Long (蒋玉龙), Ding Shi-Jin (丁士进), Zhu Guo-Dong (朱国栋)
  Determining the influence of ferroelectric polarization on electrical characteristics in organic ferroelectric field-effect transistors
    Chin. Phys. B   2015 Vol.24 (5): 58502-058502 [Abstract] (565) [HTML 1 KB] [PDF 916 KB] (573)
37304 Zhang Peng (张鹏), Zhao Sheng-Lei (赵胜雷), Hou Bin (侯斌), Wang Chong (王冲), Zheng Xue-Feng (郑雪峰), Ma Xiao-Hua (马晓华), Zhang Jin-Cheng (张进成), Hao Yue (郝跃)
  Improvement of the off-state breakdown voltage with field plate and low-density drain in AlGaN/GaN high-electron mobility transistors
    Chin. Phys. B   2015 Vol.24 (3): 37304-037304 [Abstract] (691) [HTML 0 KB] [PDF 347 KB] (475)
114402 Fu Qiang (付强), Zhang Wan-Rong (张万荣), Jin Dong-Yue (金冬月), Ding Chun-Bao (丁春宝), Zhao Yan-Xiao (赵彦晓), Lu Dong (鲁东)
  Collector optimization for tradeoff between breakdown voltage and cut-off frequency in SiGe HBT
    Chin. Phys. B   2014 Vol.23 (11): 114402-114402 [Abstract] (676) [HTML 1 KB] [PDF 1131 KB] (468)
107303 Zhao Sheng-Lei (赵胜雷), Mi Min-Han (宓珉瀚), Hou Bin (侯斌), Luo Jun (罗俊), Wang Yi (王毅), Dai Yang (戴杨), Zhang Jin-Cheng (张进成), Ma Xiao-Hua (马晓华), Hao Yue (郝跃)
  Mechanism of improving forward and reverse blocking voltages in AlGaN/GaN HEMTs by using Schottky drain
    Chin. Phys. B   2014 Vol.23 (10): 107303-107303 [Abstract] (559) [HTML 1 KB] [PDF 1455 KB] (893)
97305 Zhao Sheng-Lei (赵胜雷), Wang Yuan (王媛), Yang Xiao-Lei (杨晓蕾), Lin Zhi-Yu (林志宇), Wang Chong (王冲), Zhang Jin-Cheng (张进成), Ma Xiao-Hua (马晓华), Hao Yue (郝跃)
  Reverse blocking enhancement of drain field plate in Schottky-drain AlGaN/GaN high-electron mobility transistors
    Chin. Phys. B   2014 Vol.23 (9): 97305-097305 [Abstract] (670) [HTML 1 KB] [PDF 1027 KB] (911)
88107 Wang Hao (王昊), Han Wei-Hua (韩伟华), Ma Liu-Hong (马刘红), Li Xiao-Ming (李小明), Yang Fu-Hua (杨富华)
  Quantum transport characteristics in single and multiple N-channel junctionless nanowire transistors at low temperatures
    Chin. Phys. B   2014 Vol.23 (8): 88107-088107 [Abstract] (643) [HTML 1 KB] [PDF 1831 KB] (483)
68501 Liu Yu-Rong (刘玉荣), Su Jing (苏晶), Lai Pei-Tao (黎沛涛), Yao Ruo-He (姚若河)
  Positive gate-bias temperature instability of ZnO thin-film transistor
    Chin. Phys. B   2014 Vol.23 (6): 68501-068501 [Abstract] (800) [HTML 1 KB] [PDF 445 KB] (934)
47201 Yu Ying-Xia (于英霞), Lin Zhao-Jun (林兆军), Luan Chong-Biao (栾崇彪), Lü Yuan-Jie (吕元杰), Feng Zhi-Hong (冯志红), Yang Ming (杨铭), Wang Yu-Tang (王玉堂)
  Influence of the channel electric field distribution on the polarization Coulomb field scattering in In0.18Al0.82N/AlN/GaN heterostructure field-effect transistors
    Chin. Phys. B   2014 Vol.23 (4): 47201-047201 [Abstract] (553) [HTML 1 KB] [PDF 336 KB] (482)
38505 Li Hai-Qiang (李海强), Yu Jun-Sheng (于军胜), Huang Wei (黄伟), Shi Wei (施薇), Huang Jiang (黄江)
  High performance pentacene organic field-effect transistors consisting of biocompatible PMMA/silk fibroin bilayer dielectric
    Chin. Phys. B   2014 Vol.23 (3): 38505-038505 [Abstract] (924) [HTML 1 KB] [PDF 492 KB] (62436)
26101 Chen Yong-Yue (陈勇跃), Wang Xiong (王雄), Cai Xi-Kun (才玺坤), Yuan Zi-Jian (原子健), Zhu Xia-Ming (朱夏明), Qiu Dong-Jiang (邱东江), Wu Hui-Zhen (吴惠桢)
  Effects of annealing process on characteristics of fully transparent zinc tin oxide thin-film transistor
    Chin. Phys. B   2014 Vol.23 (2): 26101-026101 [Abstract] (716) [HTML 1 KB] [PDF 1013 KB] (1161)
128503 Zhong Ying-Hui (钟英辉), Zhang Yu-Ming (张玉明), Zhang Yi-Men (张义门), Wang Xian-Tai (王显泰), Lü Hong-Liang (吕红亮), Liu Xin-Yu (刘新宇), Jin Zhi (金智)
  0.15-μm T-gate In0.52Al0.48As/In0.53Ga0.47As InP-based HEMT with fmax of 390 GHz
    Chin. Phys. B   2013 Vol.22 (12): 128503-128503 [Abstract] (658) [HTML 1 KB] [PDF 1012 KB] (503)
98505 Wang Xin-Ran (王欣然), Shi Yi (施毅), Zhang Rong (张荣)
  Field-effect transistors based on two-dimensional materials for logic applications
    Chin. Phys. B   2013 Vol.22 (9): 98505-098505 [Abstract] (780) [HTML 1 KB] [PDF 3245 KB] (3812)
67203 Yu Ying-Xia (于英霞), Lin Zhao-Jun (林兆军), Luan Chong-Biao (栾崇彪), Wang Yu-Tang (王玉堂), Chen Hong (陈弘), Wang Zhan-Guo (王占国)
  Electron mobility in the linear region of AlGaN/AlN/GaN heterostructure field-effect transistor
    Chin. Phys. B   2013 Vol.22 (6): 67203-067203 [Abstract] (727) [HTML 1 KB] [PDF 550 KB] (674)
57304 Zhang Kai (张凯), Cao Meng-Yi (曹梦逸), Chen Yong-He (陈永和), Yang Li-Yuan (杨丽媛), Wang Chong (王冲), Ma Xiao-Hua (马晓华), Hao Yue (郝跃)
  Fabrication and characterization of V-gate AlGaN/GaN high electron mobility transistors
    Chin. Phys. B   2013 Vol.22 (5): 57304-057304 [Abstract] (696) [HTML 1 KB] [PDF 610 KB] (1069)
104211 Liu Chao-Ming (刘超铭), Li Xing-Ji (李兴冀), Geng Hong-Bin (耿洪滨), Rui Er-Ming (芮二明), Guo Li-Xin (郭立新), Yang Jian-Qun (杨剑群)
  Incident particle range dependence of radiation damage in a power bipolar junction transistor
    Chin. Phys. B   2012 Vol.21 (10): 104211-104211 [Abstract] (1124) [HTML 1 KB] [PDF 503 KB] (632)
80703 Liu Chao-Ming (刘超铭), Li Xing-Ji (李兴冀), Geng Hong-Bin (耿洪滨), Yang De-Zhuang (杨德庄), He Shi-Yu (何世禹 )
  Effect of bias condition on heavy ion radiation in bipolar junction transistor
    Chin. Phys. B   2012 Vol.21 (8): 80703-080703 [Abstract] (1565) [HTML 1 KB] [PDF 171 KB] (711)
88502 Zhang Qian (张倩), Zhang Yu-Ming (张玉明), Yuan Lei (元磊), Zhang Yi-Men (张义门), Tang Xiao-Yan (汤晓燕), Song Qing-Wen (宋庆文 )
  Fabrication and characterization of 4H–SiC bipolar junction transistor with double base epilayer
    Chin. Phys. B   2012 Vol.21 (8): 88502-088502 [Abstract] (1467) [HTML 1 KB] [PDF 907 KB] (1237)
88104 Xuan Rui-Jie (轩瑞杰), Liu Hui-Xuan (刘慧宣 )
  Low-voltage antimony-doped SnO2 nanowire transparent transistors gated by microporous SiO2-based proton conductors
    Chin. Phys. B   2012 Vol.21 (8): 88104-088104 [Abstract] (1311) [HTML 1 KB] [PDF 3444 KB] (1117)
78503 Chen Chao (陈超), Tian Ben-Lang (田本朗), Liu Xing-Zhao (刘兴钊), Dai Li-Ping (戴丽萍), Deng Xin-Wu (邓新武), Chen Yuan-Fu (陈远富 )
  The effects of 60Co γ-ray irradiation on the DC characteristics of enhancement-mode AlGaN/GaN high-electron-mobility transistors
    Chin. Phys. B   2012 Vol.21 (7): 78503-078503 [Abstract] (1474) [HTML 1 KB] [PDF 123 KB] (898)
77304 Yang Li-Yuan(杨丽媛), Xue Xiao-Yong(薛晓咏), Zhang Kai(张凯) Zheng Xue-Feng(郑雪峰), Ma Xiao-Hua(马晓华), and Hao Yue(郝跃)
  Channel temperature determination of multifinger AlGaN/GaN high electron mobility transistor using micro-Raman technique
    Chin. Phys. B   2012 Vol.21 (7): 77304-077304 [Abstract] (1779) [HTML 1 KB] [PDF 288 KB] (1204)
58501 Ge Ji(葛霁), Liu Hong-Gang(刘洪刚), Su Yong-Bo(苏永波), Cao Yu-Xiong(曹玉雄), and Jin Zhi(金智)
  Physical modeling based on hydrodynamic simulation for the design of InGaAs/InP double heterojunction bipolar transistors
    Chin. Phys. B   2012 Vol.21 (5): 58501-058501 [Abstract] (1513) [HTML 1 KB] [PDF 187 KB] (1050)
57201 Duan Bao-Xing(段宝兴) and Yang Yin-Tang(杨银堂)
  Breakdown voltage analysis of Al0.25Ga0.75N/GaN high electron mobility transistors with partial silicon doping in the AlGaN layer
    Chin. Phys. B   2012 Vol.21 (5): 57201-057201 [Abstract] (1449) [HTML 1 KB] [PDF 562 KB] (1517)
47303 Zhang Jian(张健), He Jin(何进), Zhou Xing-Ye(周幸叶), Zhang Li-Ning(张立宁), Ma Yu-Tao(马玉涛), Chen Qin(陈沁), Zhang Xu-Kai(张勖凯), Yang Zhang(杨张), Wang Rui-Fei(王睿斐), HanYu(韩雨), and Chan Mansun(陈文新)
  A unified charge-based model for SOI MOSFETs applicable from intrinsic to heavily doped channel
    Chin. Phys. B   2012 Vol.21 (4): 47303-047303 [Abstract] (1405) [HTML 1 KB] [PDF 303 KB] (731)
27305 Zhou Jian-Lin(周建林), Yu Jun-Sheng(于军胜), Yu Xin-Ge(于欣格), and Cai Xin-Yang(蔡欣洋)
  A high mobility C60 field-effect transistor with an ultrathin pentacene passivation layer and bathophenanthroline/metal bilayer electrodes
    Chin. Phys. B   2012 Vol.21 (2): 27305-027305 [Abstract] (1098) [HTML 1 KB] [PDF 1560 KB] (1538)
27304 Jiang Xiang-Wei(姜向伟) and Li Shu-Shen(李树深)
  Quantum confinement effects and source-to-drain tunneling in ultra-scaled double-gate silicon n-MOSFETs
    Chin. Phys. B   2012 Vol.21 (2): 27304-027304 [Abstract] (1300) [HTML 1 KB] [PDF 748 KB] (1249)
87306 Wang Hong(王宏), Ji Zhuo-Yu(姬濯宇), Shang Li-Wei(商立伟), Liu Xing-Hua(刘兴华), Peng Ying-Quan(彭应全), and Liu Ming(刘明)
  Top contact organic field effect transistors fabricated using a photolithographic process
    Chin. Phys. B   2011 Vol.20 (8): 87306-087306 [Abstract] (1457) [HTML 1 KB] [PDF 873 KB] (967)
67304 Ma Xiao-Hua(马晓华), Ma Ji-Gang(马骥刚), Yang Li-Yuan(杨丽媛), He Qiang(贺强), Jiao Ying(焦颖), Ma Ping(马平), and Hao Yue(郝跃)
  Kink effect in AlGaN/GaN high electron mobility transistors by electrical stress
    Chin. Phys. B   2011 Vol.20 (6): 67304-067304 [Abstract] (1598) [HTML 1 KB] [PDF 450 KB] (1994)
58501 Quan Si(全思), Hao Yue(郝跃), Ma Xiao-Hua(马晓华), and Yu Hui-You(于惠游)
  Influence of 60Co gamma radiation on fluorine plasma treated enhancement-mode high- electron-mobility transistor
    Chin. Phys. B   2011 Vol.20 (5): 58501-058501 [Abstract] (1561) [HTML 0 KB] [PDF 284 KB] (863)
57201 Zhang An(张安), Zhao Xiao-Ru(赵小如), Duan Li-Bing(段利兵), Liu Jin-Ming(刘金铭), and Zhao Jian-Lin(赵建林)
  Numerical study on the dependence of ZnO thin-film transistor characteristics on grain boundary position
    Chin. Phys. B   2011 Vol.20 (5): 57201-057201 [Abstract] (1510) [HTML 0 KB] [PDF 1041 KB] (1736)
27303 Ma Xiao-Hua(马晓华), Yu Hui-You(于惠游), Quan Si(全思), Yang Li-Yuan(杨丽媛), Pan Cai-Yuan(潘才渊), Yang Ling(杨凌), Wang Hao(王昊), Zhang Jin-Cheng(张进成), and Hao Yue(郝跃)
  Enhancement-mode AlGaN/GaN high electronic mobility transistors with thin barrier
    Chin. Phys. B   2011 Vol.20 (2): 27303-027303 [Abstract] (1721) [HTML 1 KB] [PDF 838 KB] (1087)
18502 Xu Xiao-Bo(徐小波), Zhang He-Ming(张鹤鸣), Hu Hui-Yong(胡辉勇), Ma Jian-Li(马建立), and Xu Li-Jun(许立军)
  Analytical base–collector depletion capacitance in vertical SiGe heterojunction bipolar transistors fabricated on CMOS-compatible silicon on insulator
    Chin. Phys. B   2011 Vol.20 (1): 18502-018502 [Abstract] (1689) [HTML 0 KB] [PDF 263 KB] (1078)
18101 Quan Si(全思), Hao Yue(郝跃), Ma Xiao-Hua(马晓华), and Yu Hui-You(于惠游)
  Investigation of AlGaN/GaN fluorine plasma treatment enhancement-mode high electronic mobility transistors by frequency-dependent capacitance and conductance analysis
    Chin. Phys. B   2011 Vol.20 (1): 18101-018101 [Abstract] (1782) [HTML 1 KB] [PDF 634 KB] (1119)
17306 Sun Qin-Jun(孙钦军), Xu Zheng(徐征), Zhao Su-Ling(赵谡玲), Zhang Fu-Jun(张福俊), and Gao Li-Yan(高利岩)
  Performance improvement in pentacene organic thin film transistors by inserting a C60 ultrathin layer
    Chin. Phys. B   2011 Vol.20 (1): 17306-017306 [Abstract] (1553) [HTML 1 KB] [PDF 480 KB] (1236)
17304 Deng Xiao-Chuan(邓小川), Zhang Bo(张波), Zhang You-Run(张有润), Wang Yi(王易), and Li Zhao-Ji(李肇基)
  Improved performance of 4H-SiC metal-semiconductor field-effect transistors with step p-buffer layer
    Chin. Phys. B   2011 Vol.20 (1): 17304-017304 [Abstract] (2087) [HTML 0 KB] [PDF 602 KB] (998)
16102 He Jin(何进), Liu Feng(刘峰), Zhou Xing-Ye(周幸叶), Zhang Jian(张健), and Zhang Li-Ning(张立宁)
  A continuous analytic channel potential solution to doped symmetric double-gate MOSFETs from the accumulation to the strong-inversion region
    Chin. Phys. B   2011 Vol.20 (1): 16102-016102 [Abstract] (1716) [HTML 1 KB] [PDF 589 KB] (1360)
97306 Cao Yan-Rong(曹艳荣), Ma Xiao-Hua(马晓华), Hao Yue(郝跃), and Tian Wen-Chao(田文超)
  The study on mechanism and model of negative bias temperature instability degradation in P-channel metal–oxide–semiconductor field-effect transistors
    Chin. Phys. B   2010 Vol.19 (9): 97306-097306 [Abstract] (1660) [HTML 1 KB] [PDF 785 KB] (773)
77305 Zhou Jian-Lin (周建林), Niu Qiao-Li (牛巧利)
  Properties of C60 thin film transistor based on polystyrene
    Chin. Phys. B   2010 Vol.19 (7): 77305-077305 [Abstract] (1393) [HTML 1 KB] [PDF 2677 KB] (949)
66103 Li Xing-Ji(李兴冀), Geng Hong-Bin(耿洪滨), Lan Mu-Jie(兰慕杰), Yang De-Zhuang(杨德庄), He Shi-Yu(何世禹), and Liu Chao-Ming(刘超铭)
  Degradation mechanisms of current gain in NPN transistors
    Chin. Phys. B   2010 Vol.19 (6): 66103-066103 [Abstract] (1638) [HTML 1 KB] [PDF 268 KB] (1933)
47301 Yang Ling(杨凌), Hu Gui-Zhou(胡贵州), Hao Yue(郝跃), Ma Xiao-Hua(马晓华), Quan Si(全思), Yang Li-Yuan(杨丽媛), and Jiang Shou-Gao(姜守高)
  Electric-stress reliability and current collapse of different thickness SiNx passivated AlGaN/GaN high electron mobility transistors
    Chin. Phys. B   2010 Vol.19 (4): 47301-047301 [Abstract] (1627) [HTML 1 KB] [PDF 409 KB] (1467)
18103 Tian Xue-Yan(田雪雁), Xu Zheng(徐征), Zhao Su-Ling(赵谡玲), Zhang Fu-Jun(张福俊), Yuan Guang-Cai(袁广才),Li Jing(李婧), Sun Qin-Jun(孙钦军),Wang Yun(王赟), and Xu Xu-Rong(徐叙瑢)
  Thickness dependence of surface morphology and charge carrier mobility in organic field-effect transistors
    Chin. Phys. B   2010 Vol.19 (1): 18103-018103 [Abstract] (1504) [HTML 0 KB] [PDF 5000 KB] (906)
3568 Tian Xue-Yan(田雪雁), Xu Zheng(徐征), Zhao Su-Ling(赵谡玲), Zhang Fu-Jun(张福俊), Yuan Guang-Cai(袁广才), and Xu Xu-Rong(徐叙瑢)
  Effects of concentration and annealing on the performance of regioregular poly(3-hexylthiophene) field-effect transistors
    Chin. Phys. B   2009 Vol.18 (8): 3568-3572 [Abstract] (1286) [HTML 1 KB] [PDF 1344 KB] (647)
3002 Li Jian-Feng(李建丰), Chang Wen-Li(常文利), Ou Gu-Ping(欧谷平), and Zhang Fu-Jia(张福甲)
  Air-stable ambipolar organic field effect transistors with heterojunction of pentacene and N,N'-bis(4-trifluoromethylben-zyl)perylene-3,4,9,10-tetracarboxylic diimide
    Chin. Phys. B   2009 Vol.18 (7): 3002-3007 [Abstract] (1454) [HTML 1 KB] [PDF 1577 KB] (887)
1601 Gu Wen-Ping(谷文萍), Duan Huan-Tao(段焕涛), Ni Jin-Yu(倪金玉), Hao Yue(郝跃), Zhang Jin-Cheng(张进城), Feng Qian(冯倩), and Ma Xiao-Hua(马晓华)
  High-electric-field-stress-induced degradation of SiN passivated AlGaN/GaN high electron mobility transistors
    Chin. Phys. B   2009 Vol.18 (4): 1601-1608 [Abstract] (1721) [HTML 1 KB] [PDF 1865 KB] (1056)
5078 Tian Xue-Yan(田雪雁), Xu Zheng(徐征), Zhao Su-Ling(赵谡玲), Zhang Fu-Jun(张福俊), Xu Xu-Rong(徐叙瑢), Yuan Guang-Cai(袁广才), Li Jing(李婧), Sun Qin-Jun(孙钦军), and Wang Ying(王赟)
  Vacuum relaxation and annealing-induced enhancement of mobility of regioregular poly(3-hexylthiophene) field-effect transistors
    Chin. Phys. B   2009 Vol.18 (11): 5078-5083 [Abstract] (1474) [HTML 1 KB] [PDF 3151 KB] (547)
1119 Gao Hong-Ling(高宏玲), Zeng Yi-Ping(曾一平), Wang Bao-Qiang(王宝强), Zhu Zhan-Ping(朱战平), and Wang Zhan-Guo(王占国)
  Influence of V/III ratio on the structural and photoluminescence properties of In0.52AlAs/ In0.53GaAs metamorphic high electron mobility transistor grown by olecular beam epitaxy
    Chin. Phys. B   2008 Vol.17 (3): 1119-1123 [Abstract] (1571) [HTML 1 KB] [PDF 380 KB] (777)
3822 Yuan Guang-Cai(袁广才), Xu Zheng(徐征), Zhao Su-Ling(赵谡玲), Zhang Fu-Jun(张福俊), Huang Jin-Zhao(黄金昭), Huang Jin-Ying (黄金英), Tian Xue-Yan(田雪雁), and Xu Xu-Rong (徐叙瑢)
  The effect of annealing temperature and film thickness on the phase of pentacene on the p+-Si substrate
    Chin. Phys. B   2008 Vol.17 (10): 3822-3826 [Abstract] (1287) [HTML 1 KB] [PDF 1006 KB] (560)
3760 Li Dong-Mei(李冬梅), Wang Zhi-Hua(王志华), Huangfu Li-Ying(皇甫丽英), and Gou Qiu-Jing(勾秋静),
  Study of total ionizing dose radiation effects on enclosed gate transistors in a commercial CMOS technology
    Chin. Phys. B   2007 Vol.16 (12): 3760-3765 [Abstract] (1491) [HTML 1 KB] [PDF 991 KB] (1760)
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