Characterization of CoPt nanowire fabricated by glancing angle deposition

doi:10.1088/1674-1056/24/5/056201

Abstract CoPt and Co nanowire films were deposited by the Glancing Angle Deposition (GLAD) method. All samples are deposited on Si substrates that were covered by polystyrene spheres to assist the alignment of nanowires. SEM observation results show that the length and diameter of nanowires are uniform for all samples. According to the result of XRD, the crystal structure of CoPt is fcc. The angular dependence of magnetization of the nanowires shows that the easy axis of magnetization is along the growth direction of the nanowires.

Keywords: nanowires magnetic anisotropy magnetic properties

Received: 16 October 2014
Revised: 17 December 2014
Accepted manuscript online:

PACS:	62.23.Hj	(Nanowires)
	75.75.-c	(Magnetic properties of nanostructures)
	81.16.-c	(Methods of micro- and nanofabrication and processing)

Corresponding Authors: Satoshi Kitai
E-mail: kita.s.aa@m.titech.ac.jp

About author: 62.23.Hj; 75.75.-c; 81.16.-c

Cite this article:

Satoshi Kitai (锻代聪), Zhang Zheng-Jun (张政军), Shi Ji (史蹟), Yoshio Nakamura (中村吉男) Characterization of CoPt nanowire fabricated by glancing angle deposition 2015 Chin. Phys. B 24 056201

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