Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy

doi:10.1088/1674-1056/abad1e

Abstract

The various morphologies of tracks in MoS₂ irradiated by swift heavy ions at normal and 30° incidence with 9.5–25.0 MeV/u ⁸⁶Kr, ¹²⁹Xe, ¹⁸¹Ta, and ²⁰⁹Bi ions were investigated by transmission electron microscopy. The diameter of ion tracks increases from 1.9 nm to 4.5 nm with increasing electronic energy loss. The energy loss threshold of the track formation in MoS₂ is predicted as about 9.7 keV/nm based on the thermal spike model and it seems consistent with the experimental results. It is shown that the morphology of ion tracks is related to the penetration length of ions in MoS₂. The formation process of ion tracks is discussed based on the cooperative process of outflow and recrystallization of the molten phase during rapid quenching.

Keywords: ion track MoS₂ transmission electron microscopy (TEM) recrystallization

Received: 27 April 2020
Revised: 06 August 2020
Accepted manuscript online: 07 August 2020

PACS:	61.80.-x	(Physical radiation effects, radiation damage)
	61.82.-d	(Radiation effects on specific materials)
	68.37.Lp	(Transmission electron microscopy (TEM))

Corresponding Authors: ^†Corresponding author. E-mail: zhaipengfei@impcas.ac.cn ^‡Corresponding author. E-mail: j.liu@impcas.ac.cn

About author:

†Corresponding author. E-mail: zhaipengfei@impcas.ac.cn

‡Corresponding author. E-mail: j.liu@impcas.ac.cn

* Project supported by the National Natural Science Foundation of China (Grant Nos. 11675233, 11690041, 11405229, 11705246, and 11505243), Chinese Academy of Sciences “Light of West China” Program, and the Youth Innovation Promotion Association of Chinese Academy of Sciences (Grant No. 2020412).

Cite this article:

Li-Jun Xu(徐丽君), Peng-Fei Zhai(翟鹏飞)†, Sheng-Xia Zhang(张胜霞), Jian Zeng(曾健), Pei-Pei Hu(胡培培), Zong-Zhen Li(李宗臻), Li Liu(刘丽), You-Mei Sun(孙友梅), and Jie Liu(刘杰)‡ Characterization of swift heavy ion tracks in MoS₂ by transmission electron microscopy 2020 Chin. Phys. B 29 106103

Fig. 1.

A sketch map of experiment process.

Table 1.

Irradiation parameters for MoS₂.

Fig. 2.

Plan-view TEM images of MoS₂ after swift heavy ion irradiation with (a), (b) ¹²⁹Xe 5×10¹² ions/cm², (c), (d) ¹⁸¹Ta 5×10¹⁰ ions/cm², and (e), (f) ²⁰⁹Bi 5×10¹¹ ions/cm². The left and right rows are the phase contrast images obtained at under-focus and over-focus conditions, respectively.

Fig. 3.

Statistical diameter distribution of ion tracks in irradiated MoS₂ with different electronic energy losses. The average diameters of the ion tracks (D_a) are fitted according to Gaussian curve.

Fig. 4.

TEM images of different ion track morphologies of MoS₂ irradiated at 30° with 1785.7 MeV ¹⁸¹Ta ions. (a) Nearly cylindrical ion tracks consist of two spherical hillocks at each end. (b) Sandglass-like ion tracks. The apparent length in MoS₂ sample is about 180 nm. (c) The q-tips-like ion tracks. The size of hillocks increases with increasing apparent length.

Fig. 5.

Schematics of the formation process of ion track in irradiated MoS₂ with SHIs. (a) SHIs bombardment. (b) Target material melting along the ion path. (c) Outflow of molten phase towards the free surface. (d) Recrystallization in ion damage zone.

Table 2.

Track related parameters of MoS₂ with different morphologies. Morphology, hillock diameter (D_h), apparent track length (L_ap), and actual track length (L_ac) were obtained from TEM measurements in Fig. 3.

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Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy

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Characterization of swift heavy ion tracks in MoS₂ by transmission electron microscopy