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Nano LaAlO3 buffer layer-assisted tunneling current in manganite p-n heterojunction |
Ma Jun-Jie (马俊杰)a, Wang Deng-Jing (王登京)a b, Huang Hai-Lin (黄海林)a, Wang Ru-Wu (汪汝武)b, Li Yun-Bao (李云宝)a |
a Department of Applied Physics, Wuhan University of Science and Technology, Wuhan 430081, China; b Hubei Provincial Key Laboratory of System Science in Metallurgical Process, Wuhan 430065, China |
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Abstract An oxide p-n heterojunction composed of a 150-nm La0.67Ca0.33MnO3 (LCMO) film, 0.05 wt% Nb doped SrTiO3 substrate (STON), and sandwiched 5-nm LaAlO3 (LAO) thin film is fabricated with the pulsed laser deposition technique and the interfacial transport properties are experimentally studied. The rectifying behavior of the junction is in agreement with Newman's equation, indicating that tunneling is the dominant process for the carriers to pass through the interface while thermal emission is the dominant transport model of an LCMO/STON heterojunction with no LAO buffer layer.
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Received: 23 April 2015
Revised: 18 May 2015
Accepted manuscript online:
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PACS:
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72.20.-i
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(Conductivity phenomena in semiconductors and insulators)
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73.40.Lq
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(Other semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions)
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73.40.Gk
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(Tunneling)
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Fund: Project supported by the National Natural Science Foundation of China (Grant No. 10804089). |
Corresponding Authors:
Wang Deng-Jing
E-mail: d.j.wang@163.com
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Cite this article:
Ma Jun-Jie (马俊杰), Wang Deng-Jing (王登京), Huang Hai-Lin (黄海林), Wang Ru-Wu (汪汝武), Li Yun-Bao (李云宝) Nano LaAlO3 buffer layer-assisted tunneling current in manganite p-n heterojunction 2015 Chin. Phys. B 24 107102
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