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Measurement of far-infrared surface phonon polaritons in AlN nanowires via electron microscope |
| Chao He(何超)1,7, Ze Hua(华泽)2, Peiyi He(何沛一)3, Ruishi Qi(亓瑞时)4, Yuehui Li(李跃辉)3,5, Ruiwen Shao(邵瑞文)2, Weikang Dong(董伟康)6, Ruochen Shi(时若晨)3,†, Yeliang Wang(王业亮)1,‡, and Peng Gao(高鹏)3,§ |
1 School of Integrated Circuits and Electronics, Beijing Institute of Technology, Beijing 100081, China;
2 Beijing Advanced Innovation Center for Intelligent Robots and Systems and School of Medical Technology, Beijing Institute of Technology, Beijing 100081, China;
3 International Center for Quantum Materials and Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871, China;
4 Physics Department, University of California at Berkeley, Berkeley, CA 94720, USA;
5 Institute of Quantum Materials and Physics, Henan Academy of Sciences, Zhengzhou 450002, China;
6 The Institute of Scientific and Industrial Research, The University of Osaka, Ibaraki, Japan;
7 Beijing Goldenscope Technology Co., Ltd., Beijing 100096, China |
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Abstract Surface phonon polaritons (SPhPs) exhibit promising advantages (e.g., low loss, long lifetimes) for mid/far-infrared (MIR/FIR) nanophotonics. However, FIR SPhPs experiments remain challenging for conventional optics and scattering-type scanning near-field optical microscopy (s-SNOM) due to the lack of compatible light sources/detectors. In this work, we characterized $\sim 75$-110 meV SPhPs in AlN nanowires using a monochromated scanning transmission electron microscope (STEM) equipped with electron energy loss spectroscopy (EELS). This technique provided exceptional 4.3 meV energy resolution and sub-angstrom spatial resolution. We observed the evolution of SPhP interference fringes with propagation distance, derived the dispersion curve, and clarified size effects on SPhP propagation by tuning AlN structure dimensions. Experimental-numerical cross-validation confirmed that the local continuum model (LCM) accurately describes AlN's SPhP behaviors. This work advances the understanding of FIR SPhPs in polar dielectrics and establishes a robust platform for studying FIR phonon polariton materials.
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Received: 11 October 2025
Revised: 26 November 2025
Accepted manuscript online: 09 December 2025
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PACS:
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79.20.Uv
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(Electron energy loss spectroscopy)
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78.55.Cr
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(III-V semiconductors)
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| Fund: The work was supported by the National Key R&D Program of China (Grant No. 2023YFB3609903), the National Natural Science Foundation of China (Grant Nos. 52125307 and 12404192), the “2011 Program” from the Peking– Tsinghua–IOP Collaborative Innovation Center of Quantum Matter. P.G. acknowledges the support from the New Cornerstone Science Foundation through the XPLORER PRIZE. We acknowledge Electron Microscopy Laboratory of Peking University for the use of electron microscopes. We acknowledge High-performance Computing Platform of Peking University for providing computational resources. |
Corresponding Authors:
Ruochen Shi, Yeliang Wang, Peng Gao
E-mail: shirc1993@pku.edu.cn;yeliang.wang@bit.edu.cn;pgao@pku.edu.cn
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Cite this article:
Chao He(何超), Ze Hua(华泽), Peiyi He(何沛一), Ruishi Qi(亓瑞时), Yuehui Li(李跃辉), Ruiwen Shao(邵瑞文), Weikang Dong(董伟康), Ruochen Shi(时若晨), Yeliang Wang(王业亮), and Peng Gao(高鹏) Measurement of far-infrared surface phonon polaritons in AlN nanowires via electron microscope 2026 Chin. Phys. B 35 037901
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