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An accurate analytical surface potential model of heterojunction tunnel FET |
Yunhe Guan(关云鹤)†, Huan Li(黎欢), Haifeng Chen(陈海峰), and Siwei Huang(黄思伟) |
School of Electronic Engineering, Xi'an University of Posts and Telecommunications, Xi'an 710121, China |
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Abstract Based on the accurate and efficient thermal injection method, we develop a fully analytical surface potential model for the heterojunction tunnel field-effect transistor (H-TFET). This model accounts for both the effects of source depletion and inversion charge, which are the key factors influencing the charge, capacitance and current in H-TFET. The accuracy of the model is validated against TCAD simulation and is greatly improved in comparison with the conventional model based on Maxwell-Boltzmann approximation. Furthermore, the dependences of the surface potential and electric field on biases are well predicted and thoroughly analyzed.
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Received: 27 December 2022
Revised: 13 April 2023
Accepted manuscript online: 16 April 2023
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PACS:
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85.30.De
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(Semiconductor-device characterization, design, and modeling)
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85.30.Mn
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(Junction breakdown and tunneling devices (including resonance tunneling devices))
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85.30.Tv
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(Field effect devices)
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Fund: Project supported in part by the National Natural Science Foundation of China (Grant No. 62104192) and in part by the Natural Science Basic Research Program of Shaanxi Province (Grant No. 2021JQ-717). |
Corresponding Authors:
Yunhe Guan
E-mail: gyhflc@xupt.edu.cn
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Cite this article:
Yunhe Guan(关云鹤), Huan Li(黎欢), Haifeng Chen(陈海峰), and Siwei Huang(黄思伟) An accurate analytical surface potential model of heterojunction tunnel FET 2023 Chin. Phys. B 32 108506
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