CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Prev
Next
|
|
|
A low on-resistance buried current path SOI p-channel LDMOS compatible with n-channel LDMOS |
Zhou Kun (周坤), Luo Xiao-Rong (罗小蓉), Fan Yuan-Hang (范远航), Luo Yin-Chun (罗尹春), Hu Xia-Rong (胡夏融), Zhang Bo (张波) |
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China |
|
|
Abstract A novel low specific on-resistance (Ron,sp) silicon-on-insulator (SOI) p-channel lateral double-diffused metal-oxide semiconductor (pLDMOS) compatible with high voltage (HV) n-channel LDMOS (nLDMOS) is proposed. The pLDMOS is built in the N-type SOI layer with a buried P-type layer acting as a current conduction path in the on-state (BP SOI pLDMOS). Its superior compatibility with the HV nLDMOS and low voltage (LV) complementary metal-oxide semiconductor (CMOS) circuitry which are formed on the N-SOI layer can be obtained. In the off-state the P-buried layer built in the N-SOI layer causes multiple depletion and electric field reshaping, leading to an enhanced (reduced surface field) (RESURF) effect. The proposed BP SOI pLDMOS achieves not only an improved breakdown voltage (BV) but also a significantly reduced Ron,sp. The BV of the BP SOI pLDMOS increases to 319 V from 215 V of the conventional SOI pLDMOS at the same half cell pitch of 25 μ, and Ron,sp decreases from 157 mΩ·cm2 to 55 mΩ·cm2. Compared with the PW SOI pLDMOS, the BP SOI pLDMOS also reduces the Ron,sp by 34% with almost the same BV.
|
Received: 09 August 2012
Revised: 05 January 2013
Accepted manuscript online:
|
PACS:
|
73.40.Ty
|
(Semiconductor-insulator-semiconductor structures)
|
|
73.90.+f
|
(Other topics in electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures)
|
|
73.61.Ng
|
(Insulators)
|
|
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 61176069), the State Key Laboratory Science Fund of Electronic Thin Films and Integrated Devices of China (Grant No. CXJJ201004), and the National Key Laboratory Science Fund of Analog Integrated Circuit, China (Grant No. 9140C090304110C0905). |
Corresponding Authors:
Luo Xiao-Rong
E-mail: xrluo@uestc.edu.cn
|
Cite this article:
Zhou Kun (周坤), Luo Xiao-Rong (罗小蓉), Fan Yuan-Hang (范远航), Luo Yin-Chun (罗尹春), Hu Xia-Rong (胡夏融), Zhang Bo (张波) A low on-resistance buried current path SOI p-channel LDMOS compatible with n-channel LDMOS 2013 Chin. Phys. B 22 067306
|
[1] |
Zhou M J, De Bruycker A, Van Calster A, Wittters J and Schols G 1992 Electron. Lett. 28 1537
|
[2] |
Colak S, Singer B and Stupp E 1980 IEEE Electron Dev. Lett. 1 51
|
[3] |
Luo X R, Zhang B and Li Z J 2007 Solid-State Electron. 51 493
|
[4] |
Luo X R, Li Z J, Zhang B, Fu D P, Zhan Z, Chen K F, Hu S D, Zhang Z Y, Feng Z C and Yan B 2008 IEEE Electron Dev. Lett. 29 1395
|
[5] |
Luo X R, Zhang B and Li Z J 2007 IEEE Electron Dev. Lett. 28 422
|
[6] |
Luo X R, Wang Y G, Deng H and Udrea F 2010 Chin. Phys. B 19 077306
|
[7] |
Hu S D, Li Z J and Zhang B 2009 Chin. Phys. B 18 315
|
[8] |
Hu S D, Li Z J, Zhang B and Luo X R 2010 Chin. Phys. B 19 037303
|
[9] |
Palumbo V, Venturato M, Gallo M, Pozzobon F, Galbiati M P and Contiero C 2008 20th International Symposium on Power Semiconductor Devices and ICs, May 18-22, 2008, Oralando, FL, USA pp. 283-286
|
[10] |
Podgaynaya A, Rudolf R, Pogany D, Gornik E and Stecher M 2010 IEEE Electron Dev. Lett. 31 1440
|
[11] |
Jin S Z, Sdrulla D, Dahwen Tsang, Frey D and Krausse G 2008 38th European Solid-State Device Reference, September 15-19, Edingburgh, UK pp. 71-74
|
[12] |
Schwantes S, Graf M and Dudek V 2005 35th European Solid-State Device Research Conference, September 12-16, Grenoble, France, pp. 237-240
|
[13] |
Schwantes S, Florian T, Stephan T, Graf M and Dudek V 2005 IEEE Trans. Electron. Dev. 52 1649
|
[14] |
Lu D H, Mizushima T, Sumida H, Saito M and Nakazawa H 2009 21th International Symposium on Power Semiconductor Devices and ICs, Barcelona, Spain pp. 17-20
|
[15] |
Sang-Koo Chung and Seung-Youp Han 1998 IEEE Trans. Electron. Dev. 45 1374
|
[16] |
Kobayashi K, Yanagigawa H, Mori K, Yamanaka S and Fujiwara A 1998 10th International Symposium on Power Semiconductor Devices and ICs, Kyoto, Japan pp.141-144
|
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|