CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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A super-junction SOI-LDMOS with low resistance electron channel |
Wei-Zhong Chen(陈伟中)1,2, Yuan-Xi Huang(黄元熙)1,†, Yao Huang(黄垚)1, Yi Huang(黄义)1, and Zheng-Sheng Han(韩郑生)2,3 |
1 College of Electronics Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China; 2 Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; 3 University of Chinese Academy of Sciences, Beijing 100049, China |
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Abstract A novel super-junction LDMOS with low resistance channel (LRC), named LRC-LDMOS based on the silicon-on-insulator (SOI) technology is proposed. The LRC is highly doped on the surface of the drift region, which can significantly reduce the specific on resistance (Ron,sp) in forward conduction. The charge compensation between the LRC, N-pillar, and P-pillar of the super-junction are adjusted to satisfy the charge balance, which can completely deplete the whole drift, thus the breakdown voltage (BV) is enhanced in reverse blocking. The three-dimensional (3D) simulation results show that the BV and Ron,sp of the device can reach 253 V and 15.5 mΩ·cm2, respectively, and the Baliga's figure of merit (FOM=BV2/Ron,sp) of 4.1 MW/cm2 is achieved, breaking through the silicon limit.
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Received: 07 December 2020
Revised: 18 January 2021
Accepted manuscript online: 05 February 2021
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PACS:
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73.40.Ty
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(Semiconductor-insulator-semiconductor structures)
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77.55.df
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(For silicon electronics)
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85.30.De
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(Semiconductor-device characterization, design, and modeling)
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51.50.+v
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(Electrical properties)
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Corresponding Authors:
Yuan-Xi Huang
E-mail: hyx115@126.com
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Cite this article:
Wei-Zhong Chen(陈伟中), Yuan-Xi Huang(黄元熙), Yao Huang(黄垚), Yi Huang(黄义), and Zheng-Sheng Han(韩郑生) A super-junction SOI-LDMOS with low resistance electron channel 2021 Chin. Phys. B 30 057303
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[1] Qiao M, Zhang B, Xiao Z, Fang J and Li Z 2008 20th International Symposium on Power Semiconductor Devices and IC's, May 18-22, 2008, Orlando, USA, p. 52 [2] Qiao M, Jiang L L, Wang M, Huang Y, Liao H, Liang T, Sun Z, Zhang B, Li Z j, Huang G Z, Zhao Y Y, Lai L, Hu X, Zhuang X, Luo X R and Wang Z 2011 Proceedings of the 23rd International Symposium on Power Semiconductor Devices & IC's, May 18-22, San Diego, CA, p. 834 [3] Chen W, He L, Han Z and Huang Y 2018 J. Electron Dev. Soc. 6 708 [4] Li Z H, Ren M, Zhang B, Ma J, Hu T, Zhang S, Wang F and Chen J 2010 J. Semicond. 31 48 [5] Duan B, Cao Z, Yuan S and Yang Y 2015 IEEE Electron Dev. Lett. 36 1348 [6] Zhang G S, Zhang W T, He J Q, Zhu X H, Zhang S, Zhao J C, Zhang Z L, Qiao M, Zhou X, Li Z J and Zhang B 2019 31st International Symposium on Power Semiconductor Devices and ICs, May 19-23, 2019, Shanghai, China, p. 507 [7] Zhang W T, Wang R, Cheng S K, Gu Y, Zhang S, He B Y, Qiao M, Li Z J and Zhang B 2019 IEEE Electron Dev. Lett. 40 1969 [8] Nassif-Khalil S G and Salama C A T 2003 IEEE Trans. Electron Dev. 50 1385 [9] Zhang B, Wang W L, Chen W J, Li Z H and Li Z J 2009 IEEE Electron Dev. Lett. 30 849 [10] Yang S M, Tseng W C and Sheu G 2009 9th International Conference on Electronic Measurement & Instruments, August 16-19, 2009, Beijing, China, p. 4-594-4-597 [11] Chen W, Zhang B and Li Z 2007 Semicond. Soc. Technol. 22 464 [12] Park I and Salama C A T 2006 IEEE Trans. Electron Dev. 53 1909 [13] McPherson J W, Jinyoung Kim, Shanware A, Mogul H and Rodriguez J 2003 IEEE Trans. Electron Dev. 50 1771 [14] Kong M F, Liu C, Chen H Z, Yi B and Chen X B 2019 IEEE International Conference on Integrated Circuits, Technologies and Applications, November 13-15, 2019, Chengdu, China, p. 119 [15] Tian R C, Luo X R, Zhou K, Xu Q, Wei J, Zhang B and Li Z J 2015 J. Semicond. 36 79 [16] Guo Y F, Yao J F, Zhang B, Lin H and Zhang C C 2015 IEEE Electron Dev. Lett. 36 262 [17] Zhang W T, Zhan Z Y, Yu Y, Cheng S K, Gu Y, Zhang S, Luo X R, Li Z H, Qiao M, Li Z J and Zhang B 2017 IEEE Electron Dev. Lett. 38 1555 [18] Tang P P, Wang Y, Bao M T, Luo X, Cao F and Yu C H 2019 Micro Nano Lett. 14 420 [19] Duan B X, Cao Z, Yuan X N, Yuan S and Yang Y T 2015 IEEE Electron Dev. Lett. 36 47 [20] Cao Z, Duan B X, Yuan S, Guo H J, Lv J M, Shi T T and Yang Y T 2017 29th International Symposium on Power Semiconductor Devices and IC's, 28 May-1 June, 2017, Sapporo, Japan, p. 283 [21] Wu W, Zhang B, Fang J and Li Z 2012 11th International Conference on Solid-State and Integrated Circuit Technology, 29 October-1 November, 2012, Xi'an, China, p. 1 [22] Iqbal M M H, Udrea F and Napoli E 2009 21st International Symposium on Power Semiconductor Devices & IC's, June 14-18, 2009, Barcelona, Spain, p. 247 [23] Guo S, Huang H and Chen X B 2018 IEEE Trans. Electron Dev. 65 1645 [24] Zhang W T, Li L, Qiao M, Zhan Z Y and Zhang B 2019 IEEE Electron Dev. Lett. 40 1151 [25] Kim M H, Kim J J, Choi Y S, Jeon C K, Kim S L, Kang H S and Song C S 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, April 14-17, 2003, Cambridge, UK, 2003, p. 220 [26] Zhang W T, Qiao M, Wu L J, Ye K, Wang Z, Wang Z G, Luo X R, Zhang S, Su W, Zhang B and Li Z J 2013 25th International Symposium on Power Semiconductor Devices and IC's, May 26-30, 2013, Kanazawa, Japan, p. 329 [27] Li Z H, Wu L J, Zhang B, Li Z J 2008 J. Semicond. 29 2153 [28] Li Q, Zhang Z Y, Li H O, Sun T Y, Chen Y H and Zuo Y 2019 Chin. Phys. B 28 037201 [29] Yao J F, Guo Y F, Zhang Z Y, Yang K M, Zhang M L and Xia T 2020 Chin. Phys. B 29 038503 [30] Cheng J J, Wu S Y, Chen W Z, Huang H M and Yi B 2019 J. Electron Dev. Soc. 7 682 [31] Guo S N, Cheng J J and Chen X B 2019 13th International Conference on Power Electronics and Drive Systems (PEDS), July 9-12, 2019, Toulouse, France, p. 1 [32] Cao Z and Jiao L C 2020 J. Electron Dev. Soc. 8 890 [33] Duan B X, Li M Z, Dong Z M, Wang Y D and Yang Y T 2019 IEEE Trans. Electron Dev. 66 4836 [34] Wei Y X, Luo X R, Ge W W, Zhao Z Y, Ma Z and Wei J 2019 IEEE Trans. Electron Dev. 66 2669 |
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