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0.15-μm T-gate In0.52Al0.48As/In0.53Ga0.47As InP-based HEMT with fmax of 390 GHz |
Zhong Ying-Hui (钟英辉)a, Zhang Yu-Ming (张玉明)a, Zhang Yi-Men (张义门)a, Wang Xian-Tai (王显泰)b, Lü Hong-Liang (吕红亮)a, Liu Xin-Yu (刘新宇)b, Jin Zhi (金智)b |
a School of Microelectronics, Xidian University, Xi’an 710071, China;
b Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China |
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Abstract In this paper, 0.15-μm gate-length In0.52Al0.48As/In0.53Ga0.47As InP-based high electron mobility transistors (HEMTs) each with a gate-width of 2×50 μm are designed and fabricated. Their excellent DC and RF characterizations are demonstrated. Their full channel currents and extrinsic maximum transconductance (gm,max) values are measured to be 681 mA/mm and 952 mS/mm, respectively. The off-state gate-to-drain breakdown voltage (BVGD) defined at a gate current of-1 mA/mm is 2.85 V. Additionally, a current-gain cut-off frequency (fT) of 164 GHz and a maximum oscillation frequency (fmax) of 390 GHz are successfully obtained; moreover, the fmax of our device is one of the highest values in the reported 0.15-μm gate-length lattice-matched InP-based HEMTs operating in a millimeter wave frequency range. The high gm,max, BVGD, fmax, and channel current collectively make this device a good candidate for high frequency power applications.
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Received: 06 March 2013
Revised: 08 April 2013
Accepted manuscript online:
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PACS:
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85.30.-z
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(Semiconductor devices)
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73.40.Qv
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(Metal-insulator-semiconductor structures (including semiconductor-to-insulator))
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85.30.Tv
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(Field effect devices)
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Fund: Project supported by the National Basic Research Program of China (Grant Nos. 2010CB327502 and 2010CB327505) and the Advance Research Project (Grant No. 5130803XXXX). |
Corresponding Authors:
Jin Zhi
E-mail: jinzhi@ime.ac.cn
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Cite this article:
Zhong Ying-Hui (钟英辉), Zhang Yu-Ming (张玉明), Zhang Yi-Men (张义门), Wang Xian-Tai (王显泰), Lü Hong-Liang (吕红亮), Liu Xin-Yu (刘新宇), Jin Zhi (金智) 0.15-μm T-gate In0.52Al0.48As/In0.53Ga0.47As InP-based HEMT with fmax of 390 GHz 2013 Chin. Phys. B 22 128503
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