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Chin. Phys. B, 2011, Vol. 20(4): 048502    DOI: 10.1088/1674-1056/20/4/048502
INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY Prev   Next  

Comparison of nitride-based dual-wavelength light- emitting diodes with an InAlN electron-blocking layer and with p-type doped barriers

Zhang Yun-Yan(张运炎) and Fan Guang-Han(范广涵)
Institute of Opto-Electronic Materials and Technology, South China Normal University, Guangzhou 510631, China
Abstract  The advantages of nitride-based dual-wavelength light-emitting diodes (LEDs) with an InAlN electron blocking layer (EBL) are studied. The emission spectra, carrier concentration in the quantum wells (QWs), energy band and internal quantum efficiency (IQE) are investigated. The simulation results indicate that an LED with an InAlN EBL performs better over a conventional LED with an AlGaN EBL and an LED with p-type-doped QW barriers. All of the advantages are due to the enhancement of carrier confinement and the lower electron leakage current. The simulation results also show that the efficiency droop is markedly improved and the luminous intensity is greatly enhanced when an InAlN EBL is used.
Keywords:  InAlN electron-blocking layer      p-type doped barriers      numerical simulation      dual-wavelength LED  
Received:  10 October 2010      Revised:  28 November 2010      Accepted manuscript online: 
PACS:  85.60.Jb (Light-emitting devices)  
  85.50.-n (Dielectric, ferroelectric, and piezoelectric devices)  
  87.15.A- (Theory, modeling, and computer simulation)  
  78.60.Fi (Electroluminescence)  
Fund: Project supported by the Project of Combination of Production and Research Guided by Ministry in 2009, China (Grant No. 2009B090300338), the Doctorate Foundation of the State Education Ministry of China (Grant No. 350163) and the Crucial Field and Key Breakthrough Project of Guangdong Province and Hongkong, China (Grant No. 2007A010501008).

Cite this article: 

Zhang Yun-Yan(张运炎) and Fan Guang-Han(范广涵) Comparison of nitride-based dual-wavelength light- emitting diodes with an InAlN electron-blocking layer and with p-type doped barriers 2011 Chin. Phys. B 20 048502

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