| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Influence of sputtering ambient with hydrogen gas on optoelectrical properties of Ta-doped tin oxide |
| Haozhen Li(李昊臻)1,2,4, Xingqian Chen(陈兴谦)1,2,4, Minqiu Du(杜敏求)1,4, Wei Chen(陈伟)2,3,†, and Xiaolong Du(杜小龙)1,2,3,‡ |
1 Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; 2 Songshan Lake Materials Laboratory, Dongguan 523808, China; 3 Guangdong SinoPrime Technology Co. Ltd., Dongguan 523808, China; 4 School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China |
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Abstract Ta-doped SnO$_{2}$ (TTO) is a suitable candidate to replace transparent conductive oxide (TCO) composed of expensive indium used for optoelectronics and silicon heterojunction solar cells fabricated below 200 ${^\circ}$C. However, TTO films fabricated by sputtering at low temperature still demonstrate too high resistance and optical absorptance for application in industry. In this study, we investigate the influence of sputtering ambient on the optoelectrical properties of TTO films. The addition of hydrogen and oxygen to argon during sputtering leads to a large improvement in the optoelectrical properties of TTO films. The best TTO film has a low average absorptance of 1.9% and a low resistance of $3.8\times 10^{-3}$ $\Omega \cdot$cm with a high carrier density of $9.3\times 10^{19}$ cm$^{-3}$ and mobility of 17.8 cm$^{2}\cdot$V$^{-1}\cdot$s$^{-1}$. The microstructural and compositional properties of TTO films were characterized using x-ray diffraction, x-ray photoelectron spectroscopy and UV-Vis spectrophotometry. A proper ratio of hydrogen to oxygen in the sputtering gas improves the crystallinity and the doping efficiency of Ta. Optical absorptance is also reduced with suppressed formation of Sn(II) in the TTO films. Therefore, our findings exhibit remarkable potential for the industrial application of TTO as a low-cost TCO.
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Received: 19 February 2025
Revised: 02 April 2025
Accepted manuscript online: 07 April 2025
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PACS:
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73.61.-r
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(Electrical properties of specific thin films)
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78.66.-w
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(Optical properties of specific thin films)
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01.50.ff
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(Films; electronic video devices)
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68.35.bg
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(Semiconductors)
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| Fund: Project supported by the Key-Area Research and Development Program of Guangdong Province, China (Grant No. 2021B0101260001) and the Guangdong Basic and Applied Basic Research Foundation (Grant No. 2019A1515110411). |
Corresponding Authors:
Wei Chen, Xiaolong Du
E-mail: wchen@sslab.org.cn;xldu@iphy.ac.cn
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Cite this article:
Haozhen Li(李昊臻), Xingqian Chen(陈兴谦), Minqiu Du(杜敏求), Wei Chen(陈伟), and Xiaolong Du(杜小龙) Influence of sputtering ambient with hydrogen gas on optoelectrical properties of Ta-doped tin oxide 2025 Chin. Phys. B 34 077303
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