TOPICAL REVIEW—Overcoming doping bottleneck in widegap semiconductors |
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Growth and doping of bulk GaN by hydride vapor phase epitaxy |
Yu-Min Zhang(张育民)1,2, Jian-Feng Wang(王建峰)1,2, De-Min Cai(蔡德敏)2, Guo-Qiang Ren(任国强)1, Yu Xu(徐俞)1,2, Ming-Yue Wang(王明月)1,2, Xiao-Jian Hu(胡晓剑)1,2, Ke Xu(徐科)1,2 |
1 Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou 215123, China; 2 Suzhou Nanowin Science and Technology Co., Ltd., Suzhou 215123, China |
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Abstract Doping is essential in the growth of bulk GaN substrates, which could help control the electrical properties to meet the requirements of various types of GaN-based devices. The progresses in the growth of undoped, Si-doped, Ge-doped, Fe-doped, and highly pure GaN by hydride vapor phase epitaxy (HVPE) are reviewed in this article. The growth technology and precursors of each type of doping are introduced. Besides, the influence of doping on the optical and electrical properties of GaN are presented in detail. Furthermore, the problems caused by doping, as well as the methods to solve them are also discussed. At last, highly pure GaN is briefly introduced, which points out a new way to realize high-purity semi-insulating (HPSI) GaN.
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Received: 31 October 2019
Revised: 14 December 2019
Accepted manuscript online:
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PACS:
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61.72.uj
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(III-V and II-VI semiconductors)
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81.05.Ea
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(III-V semiconductors)
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81.10.Bk
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(Growth from vapor)
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61.72.-y
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(Defects and impurities in crystals; microstructure)
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Fund: Project supported by the National Key Research and Development Program of China (Grant Nos. 2017YFB0404100 and 2016YFA0201101), the National Natural Science Foundation of China (Grant Nos. 61574164, 61704187, and 61604170), the Key Research Program of the Frontier Science of the Chinese Academy of Sciences (Grant No. QYZDB-SSW-SLH042), the State Key Program of the National Natural Science Foundation of China (Grant Nos. 61734008 and 11435010), and the National Key Scientific Instrument and Equipment Development Project, China (Grant No. 11327804). |
Corresponding Authors:
Jian-Feng Wang, Ke Xu
E-mail: jfwang2006@sinano.ac.cn;kxu2006@sinano.ac.cn
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Cite this article:
Yu-Min Zhang(张育民), Jian-Feng Wang(王建峰), De-Min Cai(蔡德敏), Guo-Qiang Ren(任国强), Yu Xu(徐俞), Ming-Yue Wang(王明月), Xiao-Jian Hu(胡晓剑), Ke Xu(徐科) Growth and doping of bulk GaN by hydride vapor phase epitaxy 2020 Chin. Phys. B 29 026104
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[1] |
Miyoshi T, Masui S, Okada T, Yanamoto T, Kozaki T, Nagahama S-i and Mukai T 2009 Appl. Phys. Express 2 062201
|
[2] |
Okur S, Shimada R, Zhang F, Hafiz S D A, Lee J, Avrutin V, Morkoc H, Franke A, Bertram F, Christen J and Oezguer U 2013 Jpn. J. Appl. Phys. 52 Unsp 08JH03
|
[3] |
Meyer D J, Deen D A, Storm D F, Ancona M G, Katzer D S, Bass R, Roussos J A, Downey B P, Binari S C, Gougousi T, Paskova T, Preble E A and Evans K R 2013 IEEE Electron Dev. Lett. 34 199
|
[4] |
Storm D F, Katzer D S, Roussos J A, Mittereder J A, Bass R, Binari S C, Hanser D, Preble E A and Evans K R 2007 J. Cryst. Growth 301 429
|
[5] |
Liu X, Liu Q, Li C, Wang J, Yu W, Xu K and Ao J P 2017 Jpn. J. Appl. Phys. 56 026501
|
[6] |
Gu H, Hu C, Wang J, Lu Y, Ao J P, Tian F, Zhang Y, Wang M, Liu X and Xu K 2019 J. Alloys Compd. 780 476
|
[7] |
Gu H, Tian F, Zhang C, Xu K, Wang J, Chen Y, Deng X and Liu X 2019 Nanoscale Res. Lett. 14 40
|
[8] |
Liu Z, Wang J, Gu H, Zhang Y, Wang W, Xiong R and Xu K 2019 AIP Adv. 9 055016
|
[9] |
Ji X, Dong W, Zhang Y, Wang J and Xu k 2019 Chin. Phys. B 28 067701
|
[10] |
Mulligan P, Wang J and Cao L 2013 Nucl. Instrum. Method A 719 13
|
[11] |
Fan Y, Xu K, Liu Z, Xu G, Zhong H, Huang Z, Zhang Y and Wang J 2017 Jpn. J. Appl. Phys. 56 050307
|
[12] |
Fu K, Yu G, Yao C, Wang G, Lu M and Zhang G 2011 Phys. Status Solidi-R 5 187
|
[13] |
Hibberd M T, Frey V, Spencer B F, Mitchell P W, Dawson P, Kappers M J, Oliver R A, Humphreys C J and Graham D M 2016 Solid State Commun. 247 68
|
[14] |
Harima H 2002 J. Phys.-Condens. Matter 14 967
|
[15] |
Xu K, Wang J F and Ren G Q 2015 Chin. Phys. B 24 066105
|
[16] |
Motoki K, Okahisa T, Matsumoto N, Matsushima M, Kimura H, Kasai H, Takemoto K, Uematsu K, Hirano T, Nakayama M, Nakahata S, Ueno M, Hara D, Kumagai Y, Koukitu A and Seki H 2001 Jpn. J. Appl. Phys. 40 L140
|
[17] |
Fujikura H, Yoshida T, Shibata M and Otoki Y 2017 Conference on Gallium Nitride Materials and Devices XII, January 30-February 2, 2017, San Francisco, USA, p. 1010403
|
[18] |
Yoshida T, Imanishi M, Kitamura T, Otaka K, Imade M, Shibata M and Mori Y 2017 Phys. Status Solidi B 254 1600671
|
[19] |
Gu H, Ren G, Zhou T, Tian F, Xu Y, Zhang Y, Wang M, Wang J and Xu K 2016 J. Cryst. Growth 436 76
|
[20] |
Fan Y, Liu Z, Xu G, Zhong H, Huang Z, Zhang Y, Wang J and Xu K 2014 Appl. Phys. Lett. 105 062108
|
[21] |
Lu M, Zhang G G, Fu K and Yu G H 2010 Chin. Phys. Lett. 27 052901
|
[22] |
Yao C, Fu K, Wang G, Yu G and Lu M 2012 Phys. Status Solidi A 209 204
|
[23] |
Usui A, Sunakawa H, Kuroda N, Kimura A, Sakai A and Yamaguchi A A 1998 2nd International Symposium on Blue Laser and Light Emitting Diodes (2nd ISBLLED), September 29-October 2, 1998, Chiba, Japan, pp. 17-21
|
[24] |
Iwinska M, Sochacki T, Amilusik M, Kempisty P, Lucznik B, Fijalkowski M, Litwin-Staszewska E, Smalc-Koziorowska J, Khapuridze A, Staszczak G, Grzegory I and Bockowski M 2016 J. Cryst. Growth 456 91
|
[25] |
Hofmann P, Krupinski M, Habel F, Leibiger G, Weinert B, Eichler S and Mikolajick T 2016 J. Cryst. Growth 450 61
|
[26] |
Oshima Y, Yoshida T, Watanabe K and Mishima T 2010 J. Cryst. Growth 312 3569
|
[27] |
Zvanut M E, Dashdorj J, Freitas J A, Glaser E R, Willoughby W R, Leach J H and Udwary K 2016 J. Electron. Mater. 45 2692
|
[28] |
Vaudo R P, Xu X P, Salant A, Malcarne J and Brandes G R 2003 Phys. Status Solidi A-Appl. Res. 200 18
|
[29] |
Richter E, Gridneva E, Weyers M and Traenkle G 2016 J. Cryst. Growth 456 97
|
[30] |
Zhang R and Kuech T F 1998 Appl. Phys. Lett. 72 1611
|
[31] |
Iwinska M, Piotrzkowski R, Litwin-Staszewska E, Sochacki T, Amilusik M, Fijalkowski M, Lucznik B and Bockowski M 2017 Appl. Phys. Express 10 011003
|
[32] |
Richter E, Hennig C, Zeimer U, Wang L, Weyers M and Tränkle G 2006 Phys. Status Solidi A 203 1658
|
[33] |
Oshima Y, Yoshida T, Eri T, Shibata M and Mishima T 2006 Jpn. J. Appl. Phys. 45 7685
|
[34] |
Foronda H M, Romanov A E, Young E C, Roberston C A, Beltz G E and Speck J S 2016 J. Appl. Phys. 120 035104
|
[35] |
Xie J Q, Mita S, Rice A, Tweedie J, Hussey L, Collazo R and Sitar Z 2011 Appl. Phys. Lett. 98 202101
|
[36] |
Fritze S, Dadgar A, Witte H, Bugler M, Rohrbeck A, Blasing J, Hoffmann A and Krost A 2012 Appl. Phys. Lett. 100 122104
|
[37] |
Markurt T, Lymperakis L, Neugebauer J, Drechsel P, Stauss P, Schulz T, Remmele T, Grillo V, Rotunno E and Albrecht M 2013 Phys. Rev. Lett. 110 036103
|
[38] |
Nakamura S, Mukai T and Senoh M 1992 Jpn. J. Appl. Phys. 31 2883
|
[39] |
Kirste R, Hoffmann M P, Sachet E, Bobea M, Bryan Z, Bryan I, Nenstiel C, Hoffmann A, Maria J P, Collazo R and Sitar Z 2013 Appl. Phys. Lett. 103 242107
|
[40] |
Gotz W, Kern R S, Chen C H, Liu H, Steigerwald D A and Fletcher R M 1999 Mater. Sci. Eng. B-Solid 59 211
|
[41] |
Wieneke M, Witte H, Lange K, Feneberg M, Dadgar A, Blasing J, Goldhahn R and Krost A 2013 Appl. Phys. Lett. 103 012103
|
[42] |
Kondo H, Oda S, Ogawa M and Zaima S 2008 3rd International SiGe, Ge and Related Compounds Symposium, October 12-17, 2008, Honolulu, USA, p. 717
|
[43] |
Nenstiel C, Bugler M, Callsen G, Nippert F, Kure T, Fritze S, Dadgar A, Witte H, Blasing J, Krost A and Hoffmann A 2015 Phys. Status Solidi-R 9 716
|
[44] |
Xie J Q, Mita S, Hussey L, Rice A, Tweedie J, LeBeau J, Collazo R and Sitar Z 2011 Appl. Phys. Lett. 99 141916
|
[45] |
Iwinska M, Takekawa N, Ivanov V Y, Amilusik M, Kruszewski P, Piotrzkowski R, Litwin-Staszewska E, Lucznik B, Fijalkowski M, Sochacki T, Teisseyre H, Murakami H and Bockowski M 2017 J. Cryst. Growth 480 102
|
[46] |
Sang L W, Ren B, Sumiya M, Liao M Y, Koide Y, Tanaka A, Cho Y J, Harada Y, Nabatame T, Sekiguchi T, Usami S, Honda Y and Amano H 2017 Appl. Phys. Lett. 111 122102
|
[47] |
Le L C, Zhao D G, Jiang D S, Li L, Wu L L, Chen P, Liu Z S, Li Z C, Fan Y M, Zhu J J, Wang H, Zhang S M and Yang H 2012 Appl. Phys. Lett. 101 252110
|
[48] |
Hofer A, Benstetter G, Biberger R, Leirer C and Bruderl G 2013 Thin Solid Films 544 139
|
[49] |
Montes Bajo M, Hodges C, Uren M J and Kuball M 2012 Appl. Phys. Lett. 101 033508
|
[50] |
Puzyrev Y S, Schrimpf R D, Fleetwood D M and Pantelides S T 2015 Appl. Phys. Lett. 106 053505
|
[51] |
Axelsson O, Billstrom N, Rorsman N and Thorsell M 2016 IEEE Microw. Wirel. Compon. Lett. 26 31
|
[52] |
Oshimura Y, Takeda K, Sugiyama T, Iwaya M, Kamiyama S, Amano H, Akasaki I, Bandoh A and Udagawa T 2010 8th International Conference on Nitride Semiconductors (ICNS), October 18-23, 2009, Jeju, South Korea, p. 1974
|
[53] |
Martin G M, Farges J P, Jacob G, Hallais J P and Poiblaud G 1980 J. Appl. Phys. 51 2840
|
[54] |
Jenny J R, Malta D P, Muller S G, Powell A R, Tsvetkov V F, Hobgood H M, Glass R C and Carter C H 2003 J. Electron. Mater. 32 432
|
[55] |
Kizilyalli I C, Edwards A P, Aktas O, Prunty T and Bour D 2015 IEEE T. Electron. Dev. 62 414
|
[56] |
Fujikura H, Konno T, Yoshida T and Horikiri F 2017 Jpn. J. Appl. Phys. 56 085503
|
[57] |
Maruska H P and Tietjen J J 1969 Appl. Phys. Lett. 15 327
|
[58] |
Lee M, Ahn C W, Vu T K O, Lee H U, Kim E K and Park S 2019 Sci. Rep.-UK 9 7128
|
[59] |
Park S S, Park I W and Choh S H 2000 Jpn. J. Appl. Phys. Part. 2-Letters 39 L1141
|
[60] |
Wong W S, Sands T and Cheung N W 1998 Appl. Phys. Lett. 72 599
|
[61] |
Kelly M K, Vaudo R P, Phanse V M, Gorgens L, Ambacher O and Stutzmann M 1999 Jpn. J. Appl. Phys. Part. 2-Letters 38 L217
|
[62] |
Usui A, Sunakawa H, Sakai A and Yamaguchi A A 1997 Jpn. J. Appl. Phys. Part. 2-Letters 36 L899
|
[63] |
Sakai A, Sunakawa H and Usui A 1997 Appl. Phys. Lett. 71 2259
|
[64] |
Motoki K, Okahisa T, Nakahata S, Matsumoto N, Kimura H, Kasai H, Takemoto K, Uematsu K, Ueno M, Kumagai Y, Koukitu A and Seki H 2002 J. Cryst. Growth 237 912
|
[65] |
Oshima Y, Eri T, Shibata M, Sunakawa H, Kobayashi K, Ichihashi T and Usui A 2003 Jpn. J. Appl. Phys. Part. 2-Letters 42 L1
|
[66] |
Liu J, Huang J, Gong X, Wang J, Xu K, Qiu Y, Cai D, Zhou T, Ren G and Yang H 2011 Crystengcomm 13 5929
|
[67] |
Vetterhoffer J and Weber J 1996 Phys. Rev. B 53 12835
|
[68] |
Wu S, Yang X, Zhang H, Shi L, Zhang Q, Shang Q, Qi Z, Xu Y, Zhang J, Tang N, Wang X, Ge W, Xu K and Shen B 2018 Phys. Rev. Lett. 121 145505
|
[69] |
Reshchikov M A and Morkoc H 2005 J. Appl. Phys. 97 061301
|
[70] |
Shi J Y, Yu L P, Wang Y Z, Zhang G Y and Zhang H 2002 Appl. Phys. Lett. 80 2293
|
[71] |
Ng H M, Doppalapudi D, Moustakas T D, Weimann N G and Eastman L F 1998 Appl. Phys. Lett. 73 821
|
[72] |
Weimann N G, Eastman L F, Doppalapudi D, Ng H M and Moustakas T D 1998 J. Appl. Phys. 83 3656
|
[73] |
Zhao D G, Yang H, Zhu J J, Jiang D S, Liu Z S, Zhang S M, Wang Y T and Liang J W 2006 Appl. Phys. Lett. 89 112106
|
[74] |
Abdel-Motaleb I M and Korotkov R Y 2005 J. Appl. Phys. 97 093715
|
[75] |
Khromov S, Hemmingsson C, Monemar B, Hultman L and Pozina G 2014 J. Appl. Phys. 116 223503
|
[76] |
Shalish I, Kronik L, Segal C, Rosenwaks Y, Shapira Y, Tisch U and Salzman J 1999 Phys. Rev. B 59 9748
|
[77] |
Lyons J L, Janotti A and Van de Walle C G 2010 Appl. Phys. Lett. 97 152108
|
[78] |
Neugebauer J and Van de Walle C G 1996 Appl. Phys. Lett. 69 503
|
[79] |
Chen H M, Chen Y F, Lee M C and Feng M S 1997 Phys. Rev. B 56 6942
|
[80] |
Elsner J, Jones R, Heggie M I, Sitch P K, Haugk M, Frauenheim T, Öberg S and Briddon P R 1998 Phys. Rev. B 58 12571
|
[81] |
Kang T S, Ren F, Gila B P, Pearton S J, Patrick E, Cheney D J, Law M and Zhang M L 2015 J. Vac. Sci. Technol. B 33 061202
|
[82] |
Gu H, Ren G, Zhou T, Tian F, Xu Y, Zhang Y, Wang M, Zhang Z, Cai D, Wang J and Xu K 2016 J. Alloy. Compd. 674 218
|
[83] |
Valente G, Cavallotti C, Masi M and Carra S 2001 J. Cryst. Growth 230 247
|
[84] |
Hofmann P, Roder C, Habel F, Leibiger G, Beyer F C, Gartner G, Eichler S and Mikolajick T 2016 J. Phys. D 49 075502
|
[85] |
Richter E, Stoica T, Zeimer U, Netzel C, Weyers M and Trankle G 2013 J. Electron. Mater. 42 820
|
[86] |
Fomin A V, Nikolaev A E, Nikitina I P, Zubrilov A S, Mynbaeva M G, Kuznetsov N I, Kovarsky A P and Ber B J 2001 Phys. Status Solidi A-Appl. Res. 188 433
|
[87] |
Noda S, Tanabe K, Yahiro T, Osawa T and Komiyama H 2004 J. Electrochem. Soc. 151 C399
|
[88] |
Romano L T, Van de Walle C G, Ager J W, Gotz W and Kern R S 2000 J. Appl. Phys. 87 7745
|
[89] |
Dadgar A, Veit P, Schulze F, Bläsing J, Krtschil A, Witte H, Diez A, Hempel T, Christen J, Clos R and Krost A 2007 Thin Solid Films 515 4356
|
[90] |
Romanov A E and Speck J S 2003 Appl. Phys. Lett. 83 2569
|
[91] |
Brunner F, Mogilatenko A, Knauer A, Weyers M and Zettler J T 2012 J. Appl. Phys. 112 033503
|
[92] |
Moram M A, Kappers M J, Massabuau F, Oliver R A and Humphreys C J 2011 J. Appl. Phys. 109 073509
|
[93] |
Follstaedt D M, Lee S R, Allerman A A and Floro J A 2009 J. Appl. Phys. 105 083507
|
[94] |
Usikov A, Kovalenkov O V, Mastro M M, Tsvetkov D V, Pechnikov A I, Soukhoveev V A, Shapovalova Y V and Gainer G H 2003 Symposium on GaN and Related Alloys held at the 2002 MRS Fall Meeting, December 2-6, 2002, Boston, USA, p. 231
|
[95] |
Munkholm A, Thompson C, Murty M V R, Eastman J A, Auciello O, Stephenson G B, Fini P, DenBaars S P and Speck J S 2000 Appl. Phys. Lett. 77 1626
|
[96] |
Tanaka S, Takeuchi M and Aoyagi Y 2000 Jpn. J. Appl. Phys. Part. 2-Lett. 39 L831
|
[97] |
Neugebauer J 2003 Phys. Stat. Sol. (c) 1651
|
[98] |
Neugebauer J, Zywietz T K, Scheffler M, Northrup J E, Chen H and Feenstra R M 2003 Phys. Rev. Lett. 90 056101
|
[99] |
Rosa A L, Neugebauer J, Northrup J E, Lee C D and Feenstra R M 2002 Appl. Phys. Lett. 80 2008
|
[100] |
Oshima Y, Yoshida T, Eri T, Shibata M and Mishima T 2007 International Workshop on Nitride Semiconductors 2006 (IWN 2006), October 22-27, 2006, Kyoto, Japan, p. 2215
|
[101] |
Schörmann J, Hille P, Schäfer M, Müßener J, Becker P, Klar P J, Kleine-Boymann M, Rohnke M, Mata M d l, Arbiol J, Hofmann D M, Teubert J and Eickhoff M 2013 J. Appl. Phys. 114 103505
|
[102] |
Walsh A, Da Silva J L F and Wei S H 2008 Phys. Rev. B 78 075211
|
[103] |
Wu J, Walukiewicz W, Shan W, Yu K M, Ager J W, Haller E E, Lu H and Schaff W J 2002 Phys. Rev. B 66 201403
|
[104] |
Cantu P, Wu F, Waltereit P, Keller S, Romanov A E, Mishra U K, DenBaars S P and Speck J S 2003 Appl. Phys. Lett. 83 674
|
[105] |
Yamane K, Matsubara T, Yamamoto T, Okada N, Wakahara A and Tadatomo K 2016 J. Appl. Phys. 119 045707
|
[106] |
Dadgar A, Blasing J, Diez A and Krost A 2011 Appl. Phys. Express 4 011001
|
[107] |
Voronenkov V, Bochkareva N, Gorbunov R, Latyshev P, Lelikov Y, Rebane Y, Tsyuk A, Zubrilov A and Shreter Y 2013 Jpn. J. Appl. Phys. 52 08JE14
|
[108] |
Leach J H, Wu M, Ni X, Li X, Xie J, Özgür Ü Morkoç H, Paskova T, Preble E, Evans K R and Lu C Z 2010 Appl. Phys. Lett. 96 102109
|
[109] |
Kubota M, Onuma T, Ishihara Y, Usui A, Uedono A and Chichibu S F 2009 J. Appl. Phys. 105 083542
|
[110] |
Gladkov P, Humlicek J, Hulicius E, Simecek T, Paskova T and Evans K 2010 J. Cryst. Growth 312 1205
|
[111] |
Malguth E, Hoffmann A and Phillips M R 2008 J. Appl. Phys. 104
|
[112] |
Ohba Y and Hatano A 1994 J. Cryst. Growth 145 214
|
[113] |
Heikman S, Keller S, Mates T, DenBaars S P and Mishra U K 2003 J. Cryst. Growth 248 513
|
[114] |
Malguth E, Hoffmann A, Gehlhoff W, Gelhausen O, Phillips M R and Xu X 2006 Phys. Rev. B 74 165202
|
[115] |
Maier K, Kunzer M, Kaufmann U, Schneider J, Monemar B, Akasaki I and Amano H 1994 17th International Conference on Defects in Semiconductors, July 18-23, 1993, Gmunden, Austria, p. 93 Maier K, Kunzer M, Kaufmann U, Schneider J, Monemar B, Akasaki I and Amano H 1994 17th International Conference on Defects in Semiconductors, July 18-23, 1993, Gmunden, Austria, p. 93 DOI: https://doi.org/10.4028/www.scientific.net/MSF.143-147.93
|
[116] |
Heitz R, Maxim P, Eckey L, Thurian P, Hoffmann A, Broser I, Pressel K and Meyer B K 1997 Phys. Rev. B 55 4382
|
[117] |
Malguth E, Hoffmann A and Xu X 2006 Phys. Rev. B 74 165201
|
[118] |
Zhang M, Zhou T F, Zhang Y M, Li B, Zheng S N, Huang J, Sun Y P, Ren G Q, Wang J F, Xu K and Yang H 2012 Appl. Phys. Lett. 100 041904
|
[119] |
Zhang Y, Wang J, Zheng S, Cai D, Xu Y, Wang M, Hu X, Zhao M and Xu K 2019 Appl. Phys. Express 12 074002
|
[120] |
Walsh A, Da Silva J L F and Wei S H 2008 Phys. Rev. B 78 075211
|
[121] |
Yoshikawa M, Kunzer M, Wagner J, Obloh H, Schlotter P, Schmidt R, Herres N and Kaufmann U 1999 J. Appl. Phys. 86 4400
|
[122] |
Xu S R, Hao Y, Zhang J C, Cao Y R, Zhou X W, Yang L A, Ou X X, Chen K and Mao W 2010 J. Cryst. Growth 312 3521
|
[123] |
Cruz S C, Keller S, Mates T E, Mishra U K and DenBaars S P 2009 J. Cryst. Growth 311 3817
|
[124] |
Tanaka T, Kaneda N, Mishima T, Kihara Y, Aoki T and Shiojima K 2015 Jpn. J. Appl. Phys. 54 041002
|
[125] |
Fujikura H, Konno T, Yoshida T and Horikiri F 2017 Jpn. J. Appl. Phys. 56 085503
|
[126] |
Tompkins R P, Khan M R, Green R, Jones K A and Leach J H 2016 J. Mater. Sci.: Mater. Electron. 27 6108
|
[127] |
Polyakov A Y, Smirnov N B, Govorkov A V, Yugova T G, Cox H, Usikov A S, Helava H and Makarov Y 2014 J. Appl. Phys. 115 183706
|
[128] |
Sumiya M, Yoshimura K, Ohtsuka K and Fuke S 2000 Appl. Phys. Lett. 76 2098
|
[129] |
Zywietz T K, Neugebauer J and Scheffler M 1999 Appl. Phys. Lett. 74 1695
|
[130] |
Zywietz T, Neugebauer J and Scheffler M 1998 Appl. Phys. Lett. 73 487
|
[131] |
Fichtenbaum N A, Mates T E, Keller S, DenBaars S P and Mishra U K 2008 J. Cryst. Growth 310 1124
|
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