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Modeling and experiments of N-doped vanadium oxide prepared by a reactive sputtering process |
Wang Tao (王涛)a, Yu He (于贺)a, Dong Xiang (董翔)a, Jiang Ya-Dong (蒋亚东)a, Wu Rui-Lin (胡锐麟)b |
a School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China;
b Center for Plasma Material Interaction, Department of Nuclear, Plasma and Radiological Engineering, University of Illinois at Urbana-Champaign, IL 61801, USA |
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Abstract An original numerical model, based on the standard Berg model, is used to simulate the growth mechanism of N-doped VOx deposited with changing oxygen flow in the reactive gas mixture. In order to compare with the numerical model, N-doped VOx films are prepared by reactive magnetron sputtering from a metallic vanadium target immersed in a reactive gas mixture of Ar+O2+N2. Both experimental and numerical results show that the addition of N2 to the process alleviates the hysteresis effect with respect to the oxygen supply. Film compositions obtained from the XPS analysis are compared to the numerical results and the agreement is satisfactory. The results also show that the compound of VN is only found at very low O concentration because of the replacement reaction of VN by O2 atoms with higher oxygen flow rate.
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Received: 01 July 2014
Revised: 28 September 2014
Accepted manuscript online:
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PACS:
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81.15.Cd
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(Deposition by sputtering)
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Corresponding Authors:
Yu He
E-mail: yuhe@uestc.edu.cn
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Cite this article:
Wang Tao (王涛), Yu He (于贺), Dong Xiang (董翔), Jiang Ya-Dong (蒋亚东), Wu Rui-Lin (胡锐麟) Modeling and experiments of N-doped vanadium oxide prepared by a reactive sputtering process 2015 Chin. Phys. B 24 038102
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