Chin. Phys. B
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Chin. Phys. B  2011, Vol. 20 Issue (2): 026802    DOI: 10.1088/1674-1056/20/2/026802
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Study on the defect-related emissions in the light self-ion-implanted Si films by a silicon-on-insulator structure
Bao Ji-Minga, Wang Chongb, Li Liangb, Xiong Feib, Yang Yuc, Yang Rui-Dongd
a Department of Electrical and Computer Engineering, University of Houston, Houston, Texas 77204, USA; b Institute of Optoelectronic Information Materials, Yunnan University, Kunming 650091, China; c Institute of Optoelectronic Information Materials, Yunnan University, Kunming 650091, China; Department of Electrical and Computer Engineering, University of Houston, Houston, Texas 77204, USA; d Institute of Optoelectronic Information Materials, Yunnan University, Kunming 650091, China; Departm

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