Effects of atomic corrugations on electronic structures in Pb1-xBix thin films
Pengju Li(李鹏举)1,2, Kun Xie(谢鹍)1,2, Yumin Xia(夏玉敏)1,2, Desheng Cai(蔡德胜)1,2, and Shengyong Qin(秦胜勇)1,2,†
1 International Centre for Quantum Design of Functional Materials(ICQD), University of Science and Technology of China, Hefei 230026, China; 2 CAS Key Laboratory of Strongly-Coupled Quantum Matter Physics, Department of Physics, University of Science and Technology of China, Hefei 230026, China
Abstract We carried out experimental investigations of the geometric effect on the electronic behavior in PbBi thin films by scanning tunneling microscopy and spectroscopy. Single crystal monolayer PbBi and two-monolayer PbBi PbBi thin films were fabricated by molecular beam epitaxy, where large surface corrugations were observed. Combined with tunneling spectroscopic measurements, it is found that atomic corrugations can widely change the electronic behaviors. These findings show that the PbBi system can be a promising platform to further explore geometry-decorated electronic behavior in two-dimensional metallic thin films.
Fund: Project supported by the National Key Basic Research Program of China (Grant No. 2017YFA0205004), the National Natural Science Foundation of China (Grant Nos. 92165201, 11474261, and 11634011), and the Fundamental Research Funds for the Central Universities (Grant No. WK3510000006), and the Anhui Initiative Fund in Quantum Information Technologies (Grant No. AHY170000).
Pengju Li(李鹏举), Kun Xie(谢鹍), Yumin Xia(夏玉敏), Desheng Cai(蔡德胜), and Shengyong Qin(秦胜勇) Effects of atomic corrugations on electronic structures in Pb1-xBix thin films 2023 Chin. Phys. B 32 066101
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