INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
Prev
Next
|
|
|
Performance improvement of 4H-SiC PIN ultraviolet avalanche photodiodes with different intrinsic layer thicknesses |
Xiaolong Cai(蔡小龙)1,2, Dong Zhou(周东)1, Liang Cheng(程亮)1, Fangfang Ren(任芳芳)1, Hong Zhong(钟宏)2, Rong Zhang(张荣)1, Youdou Zheng(郑有炓)1, Hai Lu(陆海)1 |
1 School of Electronic Science and Engineering, Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials, Nanjing University, Nanjing 210093, China;
2 Technology Planning Department, State Key Laboratory of Mobile Network and Mobile Multimedia Technology, ZTE Corporation, Nanjing 210012, China |
|
|
Abstract Four 4H-SiC p-i-n ultraviolet (UV) avalanche photodiode (APD) samples PIN-0.1, PIN-0.35, PIN-0.5, and PIN-1.0 with different intrinsic layer thicknesses (0.1 μm, 0.35 μm, 0.5 μm, and 1.0 μm, respectively) are designed and fabricated. Single photon detection efficiency (SPDE) performance becomes better as the intrinsic layer thickness increases, which is attributed to the inhibitation of tunneling. Dark count origin is also investigated, an activation energy as small as 0.22 eV of the dark count rate (DCR) confirms that the trap-assisted tunneling (TAT) process is the main source of DCR. The temperature coefficient ranges from -2.6 mV/℃ to 18.3 mV/℃, demonstrating that the TAT process is dominant in APDs with thinner intrinsic layers. Additionally, the room temperature maximum quantum efficiency at 280 nm differs from 48% to 65% for PIN-0.35, PIN-0.5, and PIN-1.0 under 0 V bias, and UV/visible rejection ratios higher than 104 are obtained.
|
Received: 10 April 2019
Revised: 25 June 2019
Accepted manuscript online:
|
PACS:
|
85.30.-z
|
(Semiconductor devices)
|
|
85.30.De
|
(Semiconductor-device characterization, design, and modeling)
|
|
Fund: Project supported by the National Key Research and Development Program of China (Grant No. 2016YFB0400902) and the Priority Academic Program Development of Jiangsu Higher Education Institutions, China. |
Corresponding Authors:
Hai Lu
E-mail: hailu@nju.edu.cn
|
Cite this article:
Xiaolong Cai(蔡小龙), Dong Zhou(周东), Liang Cheng(程亮), Fangfang Ren(任芳芳), Hong Zhong(钟宏), Rong Zhang(张荣), Youdou Zheng(郑有炓), Hai Lu(陆海) Performance improvement of 4H-SiC PIN ultraviolet avalanche photodiodes with different intrinsic layer thicknesses 2019 Chin. Phys. B 28 098503
|
[1] |
Sciuto A, Mazzillo M, Di Franco S, Roccaforte F and D'Arrigo G 2015 IEEE Photon. J. 7 1
|
[2] |
Burenkov A, Matthus C D and Erlbacher T 2016 IEEE Sens. J. 16 4246
|
[3] |
Zhou X Y, Li J, Lu W, Wang Y G, Song X B, Yin S Z, Tan X, Lü Y J, Guo H Y and Gu G D 2018 Chin. Opt. Lett. 16 060401
|
[4] |
Su L L, Cai X L, Lu H, Zhou D, Xu W Z, Chen D J, Ren F F, Zhang R, Zheng Y d and Li G L 2019 IEEE Photon. Technol. Lett. 31 447
|
[5] |
Chong E, Koh Y J, Lee D H, Bae I H, Kim J S, Jeong Y S, Ryu J Y, Lee J Y, Kang M J and Park J H 2019 Solid-State Electron. 156 1
|
[6] |
Zappa F, Tisa S, Tosi A and Cova S 2007 Sens. Actuators A 140 103
|
[7] |
Zhou D, Liu F, Lu H, Chen D J, Ren F F, Zhang R and Zheng Y D 2014 IEEE Photon. Technol. Lett. 26 1136
|
[8] |
Bai X G, Mcintosh D, Liu H D and Campbell J C 2007 IEEE Photon. Technol. Lett. 19 1822
|
[9] |
Bai X G, Liu H D, Mcintosh D C and Campbell J C 2009 IEEE J. Quantum Elect. 45 300
|
[10] |
Konstantinov A, Wahab Q, Nordell N and Lindefelt U 1997 Appl. Phys. Lett. 71 90
|
[11] |
Vilá A, Trenado J, Arbat A, Comerma A, Gascon D, Garrido L and Dieguez A 2011 Sens. Actuators A 172 181
|
[12] |
Liu M G, Hu C, Bai X G, Guo X Y, Campbell J C, Pan Z and Tashima M M 2007 IEEE J. Sel. Top. Quantum Electron. 13 887
|
[13] |
Neudeck P G and Fazi C 1997 IEEE Electron Device Lett. 18 96
|
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|