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Quantum-mathematical model of edge and peak point in Fresnel diffraction through a slit |
Xiao-He Luo(罗晓贺), Hui Mei(惠梅), Qiu-Dong Zhu(朱秋东), Shan-Shan Wang(王姗姗), Yin-Long Hou(侯银龙) |
Beijing Key Laboratory of Precision Photoelectric Measuring Instrument and Technology, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China |
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Abstract The intensity distribution in Fresnel diffraction through a slit includes numerous small fluctuations referred to as ripples. These ripples make the modelling of the intensity distribution complicated. In this study, we examine the characteristics of the Fresnel diffraction intensity distribution to deduce the rule for the peak position and then propose two types of quantum-mathematical models to obtain the distance between the edge and the peak point. The analysis and simulation indicate that the error in the models is below 0.50 μm. The models can also be used to detect the edges of a diffraction object, and we conduct several experiments to measure the slit width. The experimental results reveal that the repetition accuracy of the method can reach 0.23 μm.
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Received: 24 October 2016
Revised: 19 December 2016
Accepted manuscript online:
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PACS:
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42.25.Fx
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(Diffraction and scattering)
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42.25.Gy
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(Edge and boundary effects; reflection and refraction)
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46.40.Cd
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(Mechanical wave propagation (including diffraction, scattering, and dispersion))
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Fund: Project supported by the National Natural Science Foundation of China (Grant No. 61475018). |
Corresponding Authors:
Hui Mei
E-mail: huim@bit.edu.cn
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Cite this article:
Xiao-He Luo(罗晓贺), Hui Mei(惠梅), Qiu-Dong Zhu(朱秋东), Shan-Shan Wang(王姗姗), Yin-Long Hou(侯银龙) Quantum-mathematical model of edge and peak point in Fresnel diffraction through a slit 2017 Chin. Phys. B 26 054202
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