Please wait a minute...
Chin. Phys. B, 2015, Vol. 24(4): 046103    DOI: 10.1088/1674-1056/24/4/046103
CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES Prev   Next  

Comparative research on “high currents” induced by single event latch-up and transient-induced latch-up

Chen Rui (陈睿)a b, Han Jian-Wei (韩建伟)a, Zheng Han-Sheng (郑汉生)a b, Yu Yong-Tao (余永涛)a b, Shangguan Shi-Peng (上官士鹏)a, Feng Guo-Qiang (封国强)a, Ma Ying-Qi (马英起)a
a National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China;
b University of Chinese Academy of Sciences, Beijing 100049, China
Abstract  By using the pulsed laser single event effect facility and electro-static discharge (ESD) test system, the characteristics of the “high current”, relation with external stimulus and relevance to impacted modes of single event latch-up (SEL) and transient-induced latch-up (TLU) are studied, respectively, for a 12-bit complementary metal-oxide semiconductor (CMOS) analog-to-digital converter. Furthermore, the sameness and difference in physical mechanism between “high current” induced by SEL and that by TLU are disclosed in this paper. The results show that the minority carrier diffusion in the PNPN structure of the CMOS device which initiates the active parasitic NPN and PNP transistors is the common reason for the “high current” induced by SEL and for that by TLU. However, for SEL, the minority carrier diffusion is induced by the ionizing radiation, and an underdamped sinusoidal voltage on the supply node (the ground node) is the cause of the minority carrier diffusion for TLU.
Keywords:  single event latch-up      transient-induced latch-up      electro-static discharge      pulsed laser  
Received:  19 August 2014      Revised:  10 October 2014      Accepted manuscript online: 
PACS:  61.80.Jh (Ion radiation effects)  
  85.30.De (Semiconductor-device characterization, design, and modeling)  
  73.40.Qv (Metal-insulator-semiconductor structures (including semiconductor-to-insulator))  
Fund: Project supported by the National Natural Science Foundation of China (Grant No. 41304148).
Corresponding Authors:  Chen Rui     E-mail:  chenrui632@sina.com

Cite this article: 

Chen Rui (陈睿), Han Jian-Wei (韩建伟), Zheng Han-Sheng (郑汉生), Yu Yong-Tao (余永涛), Shangguan Shi-Peng (上官士鹏), Feng Guo-Qiang (封国强), Ma Ying-Qi (马英起) Comparative research on “high currents” induced by single event latch-up and transient-induced latch-up 2015 Chin. Phys. B 24 046103

[1] Kolasinski W A, Blake J B, Anthony J K, Price W E and Smith E C 1979 IEEE Trans. Nucl. Sci. 26 5087
[2] Leavy J F and Poll R A 1969 IEEE Trans. Nucl. Sci. 16 96
[3] Iwata H and Ohzone T 1995 IEEE Trans. Nucl. Sci. 42 148
[4] Voldman S H, Gebreselasie E, Zierak M, Hershberger D, Collins D, Feilchenfeld N, Onge S St and Dunn J 2005 Proceedings of the 43th Annual International Reliability Physics Symposium, April 17-21, 2005, San Jose, USA, p. 129
[5] Dodds N A, Hooten N C, Reed R A, Schrimpf R D, Warner J H, Roche N J H, McMorrow D, Wen S J, Wong R, Salzman J F, Jordan S, Pellish J A, Marshall C J, Gaspard N J, Bennett W G, Zhang E X and Bhuva B L 2012 IEEE Trans. Nucl. Sci. 59 2642
[6] Ker M D and Hsu S F 2005 IEEE Trans. Electron Dev. 52 1821
[7] Ker M D and Hsu S F 2006 IEEE Trans. Dev. Mater. Reliab. 6 461
[8] Voldman S H 2007 Latchup (Hobenken: John Wiley & Sons Inc.) pp. 125-184
[9] Chen R, Yu Y T, Shangguan S P, Feng G Q and Han J W 2014 Acta Phys. Sin. 63 128501 (in Chinese)
[10] Chen J J, Chen S M, Liang B and Deng K F 2012 Chin. Phys. B 21 016103
[11] Han J W, Zhang Z L, Feng G Q and Ma Y Q 2009 Spacecraft Environment Engineering 26 125 (in Chinese)
[12] Gaspard N J, Witulski A F, Atkinson N, Ahlbin J R, Holman W T, Bhuva B L, Loveless T D and Massengill L W 2011 IEEE Trans. Nucl. Sci. 58 2614
[13] Sukhaseum N, Samaras A, Du D L, Vandevelde B, Chatry N and Bezerra F 2012 Proceedings of the 13th European Conference on Radiation and Its Effects on Components and Systems, September 24-28, 2012, Biarritz, France
[14] Dodds N A 2012 "Single event latchup hardening strategies, trigging mechanisms, and testing considerations", Ph. D. Thesis (Nathaniel: Graduate School of Vanderbilt University)
[15] Burnell A J, Chugg A M and Harboe-Sorensen R 2010 IEEE Trans. Nucl. Sci. 57 1973
[1] Pulsed laser ablation in liquid of sp-carbon chains: Status and recent advances
Pietro Marabotti, Sonia Peggiani, Alessandro Vidale, and Carlo Spartaco Casari. Chin. Phys. B, 2022, 31(12): 125202.
[2] Simulation and experiment of the cooling effect of trapped ion by pulsed laser
Chang-Da-Ren Fang(方长达人), Yao Huang(黄垚), Hua Guan(管桦), Yuan Qian(钱源), and Ke-Lin Gao(高克林). Chin. Phys. B, 2021, 30(7): 073701.
[3] Microstructure, optical, and photoluminescence properties of β -Ga2O3 films prepared by pulsed laser deposition under different oxygen partial pressures
Rui-Rui Cui(崔瑞瑞), Jun Zhang(张俊), Zi-Jiang Luo(罗子江), Xiang Guo(郭祥), Zhao Ding(丁召), and Chao-Yong Deng(邓朝勇). Chin. Phys. B, 2021, 30(2): 028505.
[4] A synaptic transistor with NdNiO3
Xiang Wang(汪翔), Chen Ge(葛琛), Ge Li(李格), Er-Jia Guo(郭尔佳), Meng He(何萌), Can Wang(王灿), Guo-Zhen Yang(杨国桢), Kui-Juan Jin(金奎娟). Chin. Phys. B, 2020, 29(9): 098101.
[5] Synthesis of new silicene structure and its energy band properties
Wei-Qi Huang(黄伟其), Shi-Rong Liu(刘世荣), Hong-Yan Peng(彭鸿雁), Xin Li(李鑫), Zhong-Mei Huang(黄忠梅). Chin. Phys. B, 2020, 29(8): 084202.
[6] Gastroscopy-conjugated photoacoustic and ultrasonic dual-mode imaging for detection of submucosal gastric cancer: in vitro study
Huaqin Wu(吴华钦), Haiyang Song(宋海洋), Yudian Huang(黄玉钿), Zhifang Li(李志芳), Shulian Wu(吴淑莲), Xiaoman Zhang(章小曼), Hui Li(李晖). Chin. Phys. B, 2020, 29(6): 064205.
[7] Processes underlying the laser photochromic effect in colloidal plasmonic nanoparticle aggregates
A E Ershov, V S Gerasimov, I L Isaev, A P Gavrilyuk, S V Karpov. Chin. Phys. B, 2020, 29(3): 037802.
[8] Growth of high quality Sr2IrO4 epitaxial thin films onconductive substrates
Hui Xu(徐珲), Zhangzhang Cui(崔璋璋), Xiaofang Zhai(翟晓芳), Yalin Lu(陆亚林). Chin. Phys. B, 2019, 28(7): 078102.
[9] Preparation of Ga2O3 thin film solar-blind photodetectors based on mixed-phase structure by pulsed laser deposition
Y M Lu(吕有明), C Li(李超), X H Chen(陈相和), S Han(韩瞬), P J Cao(曹培江), F Jia(贾芳), Y X Zeng(曾玉祥), X K Liu(刘新科), W Y Xu(许望颖), W J Liu(柳文军), D L Zhu(朱德亮). Chin. Phys. B, 2019, 28(1): 018504.
[10] Experimental and simulation studies of single-event transient in partially depleted SOI MOSFET
Wei-Wei Yan(闫薇薇), Lin-Chun Gao(高林春), Xiao-Jing Li(李晓静), Fa-Zhan Zhao(赵发展), Chuan-Bin Zeng(曾传滨), Jia-Jun Luo(罗家俊), Zheng-Sheng Han(韩郑生). Chin. Phys. B, 2017, 26(9): 098505.
[11] Formation of high-Sn content polycrystalline GeSn films by pulsed laser annealing on co-sputtered amorphous GeSn on Ge substrate
Lu Zhang(张璐), Hai-Yang Hong(洪海洋), Yi-Sen Wang(王一森), Cheng Li(李成), Guang-Yang Lin(林光杨), Song-Yan Chen(陈松岩), Wei Huang(黄巍), Jian-Yuan Wang(汪建元). Chin. Phys. B, 2017, 26(11): 116802.
[12] Convenient synthesis of stable silver quantum dots with enhanced photoluminescence emission by laser fragmentation
Shuang Li(李爽), Ming Chen(陈明). Chin. Phys. B, 2016, 25(4): 046103.
[13] Plasma induced by pulsed laser and fabrication of silicon nanostructures
Hang Wei-Qi (黄伟其), Dong Tai-Ge (董泰阁), Wang Gang (王刚), Liu Shi-Rong (刘世荣), Huang Zhong-Mei (黄忠梅), Miao Xin-Jian (苗信建), Lv Quan (吕泉), Qin Chao-Jian (秦朝建). Chin. Phys. B, 2015, 24(8): 084205.
[14] Al-doping influence on crystal growth of Ni-Al alloy: Experimental testing of a theoretical model
Rong Xi-Ming (荣曦明), Chen Jun (陈骏), Li Jing-Tian (李菁田), Zhuang Jun (庄军), Ning Xi-Jing (宁西京). Chin. Phys. B, 2015, 24(12): 128706.
[15] Yb-doped passively mode-locked fiber laser with Bi2Te3-deposited
Li Lu (李璐), Yan Pei-Guang (闫培光), Wang Yong-Gang (王勇刚), Duan Li-Na (段利娜), Sun Hang (孙航), Si Jin-Hai (司金海). Chin. Phys. B, 2015, 24(12): 124204.
No Suggested Reading articles found!