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Experimental and simulation studies of single-event transient in partially depleted SOI MOSFET |
Wei-Wei Yan(闫薇薇)1,2, Lin-Chun Gao(高林春)1,2, Xiao-Jing Li(李晓静)1,2, Fa-Zhan Zhao(赵发展)1,2, Chuan-Bin Zeng(曾传滨)1,2, Jia-Jun Luo(罗家俊)1,2, Zheng-Sheng Han(韩郑生)1,2 |
1 Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China; 2 Key Laboratory of Silicon Device Technology, Chinese Academy of Sciences, Beijing 100029, China |
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Abstract In this study, we investigate the single-event transient (SET) characteristics of a partially depleted silicon-on-insulator (PDSOI) metal-oxide-semiconductor (MOS) device induced by a pulsed laser.We measure and analyze the drain transient current at the wafer level. The results indicate that the body-drain junction and its vicinity are more SET sensitive than the other regions in PD-SOI devices.We use ISE 3D simulation tools to analyze the SET response when different regions of the device are hit. Then, we discuss in detail the characteristics of transient currents and the electrostatic potential distribution change in devices after irradiation. Finally, we analyze the parasitic bipolar junction transistor (p-BJT) effect by performing both a laser test and simulations.
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Received: 17 April 2017
Revised: 15 May 2017
Accepted manuscript online:
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PACS:
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85.30.Tv
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(Field effect devices)
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94.05.Dd
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(Radiation processes)
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61.80.Ed
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(γ-ray effects)
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Fund: Project supported by Funds of Key Laboratory, China (Grant No. y7ys011001) and Youth Innovation Promotion Association, Chinese Academy of Sciences (Grant No. y5yq01r002). |
Corresponding Authors:
Chuan-Bin Zeng
E-mail: chbzeng@ime.ac.cn
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Cite this article:
Wei-Wei Yan(闫薇薇), Lin-Chun Gao(高林春), Xiao-Jing Li(李晓静), Fa-Zhan Zhao(赵发展), Chuan-Bin Zeng(曾传滨), Jia-Jun Luo(罗家俊), Zheng-Sheng Han(韩郑生) Experimental and simulation studies of single-event transient in partially depleted SOI MOSFET 2017 Chin. Phys. B 26 098505
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