CLASSICAL AREAS OF PHENOMENOLOGY |
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Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer |
Wu Jun-Fang(吴俊芳)a)b) and Zhang Chun-Min(张淳民)a)† |
a School of Science, Xi'an Jiaotong University, Xi'an 710049, China; b School of Science, Xi'an Polytechnic University, Xi'an 710048, China |
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Abstract The static large field of the view polarization interference imaging spectrometer is based on the modified Savart polariscope. There appears a dispersion between the ordinary ray and extraordinary ray when light passes through the modified Savart polariscope. The dispersion greatly influences the intensities and the results of the interferogram and target image in the static large field of the view polarization interference imaging spectrometer. At the same time, the incident angle determines the dispersion. When the light goes through the modified Savart polariscope, the dispersion occurs in the left plate, the half-wave plate and the right plate of the modified Savart polariscope. Using the extension of Snell's law, the dispersion in the crystal is theoretically calculated and numerically simulated separately. The relationship curve between incident angle and the dispersion is obtained by simulation.
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Received: 06 February 2009
Accepted manuscript online:
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PACS:
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07.60.Fs
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(Polarimeters and ellipsometers)
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42.30.-d
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(Imaging and optical processing)
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02.60.Cb
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(Numerical simulation; solution of equations)
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Fund: Project supported by the State Key
Program of National Natural Science of China (Grant No.~40537031),
National High Technology Research and Development Program of China
(Grant No.~2006AA12Z152), the National Natural Science Foundation of
China (Grant Nos.~40875013, 40375010 and 60278019), the Science and
Technology Plan Foundation of Shaanxi Province, China (Grant
No.~2005K04-G18). |
Cite this article:
Wu Jun-Fang(吴俊芳) and Zhang Chun-Min(张淳民) Relationship between incident angle and dispersion in static large field of view polarization interference imaging spectrometer 2010 Chin. Phys. B 19 034201
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