Enhanced reflection chiroptical effect of planar anisotropic chiral metamaterials placed on the interface of two media

doi:10.1088/1674-1056/ab9def

Abstract

The strong chiroptical effect is highly desirable and has a wide range of applications in biosensing, chiral catalysis, polarization tuning, and chiral photo detection. In this work, we find a simple method to enhance the reflection circular dichroism (CD_R) by placing the planar anisotropic chiral metamaterials (i.e., Z-shaped PACMs) on the interface of two media (i.e., Z-PCMI) with a large refractive index difference. The maximum reflection CD_R from the complex system can reach about 0.840 when the refractive index is set as n_top = 4.0 and n_bottom = 1.49, which is approximately three times larger than that of placing the Z-shaped PACMs directly on the substrate (i.e., Z-PCMS). While the minimum reflection CD_R is 0.157 when the refractive index is set as n_bottom = 1.49. So we can get a large available range of reflection CD_R from –0.840 to –0.157. Meanwhile, the transmission CD_T remains unchanged with the refractive index n_top increment. Our in-depth research indicates that the large reflection CD_R is derived from the difference of non-conversion components of the planar anisotropic chiral metamaterials’ reflection matrices. In short, we provide a simple and practical method to enhance the chiroptical effect by changing the refractive index difference between two media without having to design a complex chiral structure.

Keywords: chiroptical effect chiral metamaterials refractive index

Received: 06 April 2020
Revised: 05 June 2020
Accepted manuscript online: 18 June 2020

PACS:	81.05.Xj	(Metamaterials for chiral, bianisotropic and other complex media)
	42.25.Bs	(Wave propagation, transmission and absorption)
	78.20.Ci	(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
	42.25.-p	(Wave optics)

Corresponding Authors: ^†Corresponding author. E-mail: dujl@scu.edu.cn第一通讯作者 ^‡Corresponding author. E-mail: houyd@scu.edu.cn

About author:

†Corresponding author. E-mail: dujl@scu.edu.cn

‡Corresponding author. E-mail: houyd@scu.edu.cn

* Project supported by the National Natural Science Foundation of China (Grant No. 11604227).

Cite this article:

Xiu Yang(杨秀), Tao Wei(魏涛), Feiliang Chen(陈飞良), Fuhua Gao(高福华), Jinglei Du(杜惊雷)†, and Yidong Hou(侯宜栋)‡ Enhanced reflection chiroptical effect of planar anisotropic chiral metamaterials placed on the interface of two media 2020 Chin. Phys. B 29 107303

Fig. 1.

Simulated reflection intensities of the Z-PCMI and Z-PCMS. (a) Schematic diagram of the Z-PCMI. The structure parameters are set as w₁ = 115 nm, w₂ = 85 nm, L₁ = 125 nm, L₂ = 105 nm, P_x = 235 nm, and P_y = 335 nm. The thickness h of the Z-shaped PACMs is 40 nm. (b) Schematic diagram of the Z-PCMS. (c)–(f) The simulated reflection intensities and CD_R of the Z-PCMI and Z-PCMS, respectively.

Fig. 2.

The distribution of the electric field of the (a), (b) Z-PCMI and (c), (d) Z-PCMS at the resonant wavelengths of 1582 nm and 578 nm under the illumination of LCP and RCP.

Fig. 3.

The charge distribution of the (a), (b) Z-PCMI and (c), (d) Z-PCMS at the resonant wavelengths of 1582 nm and 578 nm under the illumination of the LCP and RCP.

Fig. 4.

The influence of the refractive index n_top on CD peaks. (a), (b) The reflection CD_R and transmission CD_T intensities of the Z-PCMI for the light illuminating along –Z direction. (c), (d) The reflection CD_R and transmission CD_T intensities of the Z-PCMI for the light illuminating along +Z direction.

Fig. 5.

(a), (c), (e) The reflection intensities and (b), (d), (f) transmission intensities of the Z-PCMI. The reflection and transmission intensities are obtained for the light illuminating along –Z direction.

Fig. 6.

The dispersion relation of the off-diagonal elements (r_xy and r_yx) of the linear reflection coefficients. (a)–(c) The linear polarization light illuminates the Z-PCMI along –Z direction. (d)–(f) The linear polarization light illuminates the Z-PCMI along +Z direction.

Fig. 7.

The reflection intensities of the G-PCMI and 卍-PCMI. (a) Schematic diagram of the G-PCMI, the structure parameters are set as W₃ = 115 nm, L₃ = 335 nm, P_x = 235 nm, and P_y = 335 nm. (b) Schematic diagram of the 卍-PCMI, the structure parameters are set as W₄ = 50 nm, L₄ = 250 nm, L₅ = 125 nm, and P_x = P_y = 450 nm. The thickness h for both of the Ag-metal-grating and the 卍-shaped structures is 40 nm. The reflection intensities of (c), (e), (g) the G-PCMI; and (d), (f) (h) the 卍-PCMI. The refractive index n_top is increased from 1 to 4, while the refractive index n_bottom keeps at 1.49.

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Enhanced reflection chiroptical effect of planar anisotropic chiral metamaterials placed on the interface of two media

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