| CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES |
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Effect of microstructure on 3He migration in TiT1.9 films |
| Haifeng Wang(王海峰), Shuming Peng(彭述明), Wei Ding(丁伟), Huahai Shen(申华海), Weidu Wang(王维笃), Xiaosong Zhou(周晓松), Xinggui Long(龙兴贵) |
| Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang 621900, China |
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Abstract Two kinds of films were prepared to study the effect of microstructure on helium migration in Ti tritides. Both films showed different release behaviors and helium bubble distributions. In the film consisting of columnar grains, a two-layered structure was observed. Inclusions with a strip feature were found at the grain boundary, and no helium bubbles were distributed in these inclusions. However, helium preferred to migrate to the boundaries of these inclusions. Bubble linkage as a ribbon-like feature developed parallel to the film surface in the film consisting of columnar grains. More cracks were developed at the grain boundaries of the film consisting of columnar grains, although the helium content in the film consisting of columnar grains was less than that in the film consisting of equiaxed grains. A surface region with a small number of bubbles, or “depleted zone”, was observed near the surface. The cracks extending to the film surface were the pathways of the critical helium released from the film. The helium migration was strongly influenced by the grain microstructure.
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Received: 11 March 2018
Revised: 27 May 2018
Accepted manuscript online:
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PACS:
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61.72.Qq
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(Microscopic defects (voids, inclusions, etc.))
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81.40.Wx
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(Radiation treatment)
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68.55.-a
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(Thin film structure and morphology)
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Corresponding Authors:
Shuming Peng
E-mail: pengshuming@caep.cn
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Cite this article:
Haifeng Wang(王海峰), Shuming Peng(彭述明), Wei Ding(丁伟), Huahai Shen(申华海), Weidu Wang(王维笃), Xiaosong Zhou(周晓松), Xinggui Long(龙兴贵) Effect of microstructure on 3He migration in TiT1.9 films 2018 Chin. Phys. B 27 096103
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