Raman spectroscopy characterization of two-dimensional materials

doi:10.1088/1674-1056/27/3/037802

Abstract Two-dimensional (2D) materials have become a hot study topic in recent years due to their outstanding electronic, optical, and thermal properties. The unique band structures of strong in-plane chemical bonds and weak out-of-plane van der Waals (vdW) interactions make 2D materials promising for nanodevices and various other applications. Raman spectroscopy is a powerful and non-destructive characterization tool to study the properties of 2D materials. In this work, we review the research on the characterization of 2D materials with Raman spectroscopy. In addition, we discuss the application of the Raman spectroscopy technique to semiconductors, superconductivity, photoelectricity, and thermoelectricity.

Keywords: Raman MoS₂ graphene 2D materials non-destructive characterization

Received: 16 November 2017
Revised: 22 December 2017
Accepted manuscript online:

PACS:	78.66.-w	(Optical properties of specific thin films)
	78.20.-e	(Optical properties of bulk materials and thin films)

Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 11504111, 61574060, and 61574056), the Projects of Science and Technology Commission of Shanghai Municipality of China (Grant Nos. 15JC1401800 and 14DZ2260800), the Program for Professor of Special Appointment (Eastern Scholar), Shanghai Rising-Star Program, China (Grant No. 17QA1401400), and the Fundamental Research Funds for the Central Universities of China.

Corresponding Authors: Xing Wu
E-mail: xwu@ee.ecnu.edu.cn

Cite this article:

Fang Liang(梁芳), Hejun Xu(徐何军), Xing Wu(吴幸), Chaolun Wang(王超伦), Chen Luo(骆晨), Jian Zhang(张健) Raman spectroscopy characterization of two-dimensional materials 2018 Chin. Phys. B 27 037802

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