| ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS |
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Impact of amplified spontaneous emission noise on the SRS threshold of high-power fiber amplifiers |
| Wei Liu(刘伟)1,2,3, Shuai Ren(任帅)1, Pengfei Ma(马鹏飞)1,2,3,†, and Pu Zhou(周朴)1 |
1 College of Advanced Interdisciplinary Studies, National University of Defense Technology, Changsha 410073, China;
2 Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, China;
3 Hunan Provincial Key Laboratory of High Energy Laser Technology, National University of Defense Technology, Changsha 410073, China |
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Abstract Impact of amplified spontaneous emission (ASE) noise on the stimulated Raman scattering (SRS) threshold of high-power fiber amplifiers is demonstrated numerically through a spectral evolution approach. The simulation results confirm that ASE noise in the Raman wavelength band could reduce the SRS threshold of high-power fiber amplifiers significantly. As for ASE noise originated the main amplifier, it becomes stronger and reduces the SRS threshold at shorter operation wavelength below 1052 nm. As for ASE noise originated from the seed laser, it reduces the SRS threshold at different operation wavelength under the condition that the Raman ratio is over -90 dB in the seed laser. The theoretical method and results in this work could provide a well reference to extend the operation wavelength of high-power fiber lasers.
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Received: 07 June 2022
Revised: 20 July 2022
Accepted manuscript online: 22 July 2022
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PACS:
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42.55.Wd
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(Fiber lasers)
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42.60.Da
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(Resonators, cavities, amplifiers, arrays, and rings)
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42.65.Dr
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(Stimulated Raman scattering; CARS)
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| Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 62005313 and 62061136013). |
Corresponding Authors:
Pengfei Ma
E-mail: shandapengfei@126.com
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Cite this article:
Wei Liu(刘伟), Shuai Ren(任帅), Pengfei Ma(马鹏飞), and Pu Zhou(周朴) Impact of amplified spontaneous emission noise on the SRS threshold of high-power fiber amplifiers 2023 Chin. Phys. B 32 034202
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