CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Prev
Next
|
|
|
Stoney formula for piezoelectric film/elastic substrate system |
Wang-Min Zhou(周旺民)1, Wang-Jun Li(李望君)1, Sheng-Yun Hong(洪圣运)1, Jie Jin(金杰)2, Shu-Yuan Yin(尹姝媛)3 |
1 College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou 310014, China; 2 College of Materials Science and Engineering, Zhejiang University of Technology, Hangzhou 310014, China; 3 College of Science, Zhejiang University of Technology, Hangzhou 310023, China |
|
|
Abstract With the trends in miniaturization, and particularly the introduction of micro- and nano-electro-mechanical system, piezoelectric materials used in microelectronic devices are deposited usually in the form of thin film on elastic substrates. In this work, the bending of a bilayer comprising a piezoelectric film deposited on an elastic substrate, due to the mismatch, is investigated. An analytic formula relating the curvature of the bilayer to the mismatch, the electroelastic constants and the film thickness is obtained, and from this formula, a transverse piezoelectric constant d31 can be estimated. Meanwhile the influence of electromechanical coupling coefficient on the curvature is discussed.
|
Received: 08 October 2016
Revised: 06 December 2016
Accepted manuscript online:
|
PACS:
|
77.65.-j
|
(Piezoelectricity and electromechanical effects)
|
|
77.65.Ly
|
(Strain-induced piezoelectric fields)
|
|
46.25.Hf
|
(Thermoelasticity and electromagnetic elasticity (electroelasticity, magnetoelasticity))
|
|
Fund: Project supported by the Zhejiang Provincial Natural Science Foundation, China (Grant No. Y6100440). |
Corresponding Authors:
Wang-Min Zhou
E-mail: zhouwm@zjut.edu.cn
|
Cite this article:
Wang-Min Zhou(周旺民), Wang-Jun Li(李望君), Sheng-Yun Hong(洪圣运), Jie Jin(金杰), Shu-Yuan Yin(尹姝媛) Stoney formula for piezoelectric film/elastic substrate system 2017 Chin. Phys. B 26 037701
|
[1] |
Wilson S A, Jourdain R P J, Zhang Q, Dorey R A, Bowen C R, Willander M, Wahab Q U, Al-hilli S M, Nur O and Quandt E 2007 Mater. Sci. Eng. R 56 1
|
[2] |
Damjanovic D, Muralt P and Setter N 2001 IEEE Sens. J. 1 191
|
[3] |
Muralt P 2000 J. Micromech. Microeng. 10 136
|
[4] |
Scott J F 2007 Science 315 954
|
[5] |
Setter N and Waser R 2000 Acta Mater. 48 151
|
[6] |
Muralt P, Polcawich R and Trolier-McKinstry S 2009 MRS Bull. 34 658
|
[7] |
Newns D, Elmegreen B, Liu X H and Martyna G 2012 J. Appl. Phys. 111 084509
|
[8] |
Stoney G G 1909 Proceedings of the Royal Society (London) A82 172
|
[9] |
Freund L B and Suresh S 2003 Thin Film Materials: Stress, Defect Formation, and Surface Evolution (Cambridge: Cambridge University Press)
|
[10] |
Wikstrom A, Gudmundson P and Suresh S 1999 J. Mech. Phys. Solids 47 1113
|
[11] |
Shen Y L, Suresh S and Blech I A 1996 J. Appl. Phys. 80 1388
|
[12] |
Wikstrom A, Gudmundson P and Suresh S 1999 J. Appl. Phys. 86 6088
|
[13] |
Park T S and Suresh S 2000 Acta Mater. 48 3169
|
[14] |
Masters C B and Salamon N J 1993 Int. J. Eng. Sci. 31 915
|
[15] |
Salamon N J and Masters C B 1995 Int. J. Solids Struct. 32 473
|
[16] |
Finot M, Blech I A, Suresh S and Fijimoto H 1997 J. Appl. Phys. 81 3457
|
[17] |
Freund L B 2000 J. Mech. Phys. Solids 48 1159
|
[18] |
Huang Y and Rosakis A J 2005 J. Mech. Phys. Solids 53 2483
|
[19] |
Feng X, Huang Y, Jiang H, et al. 2006 J. Mech. Mater. Struct. 1 1041
|
[20] |
Liu D Y and Chen W Q 2012 J. Eng. Mater. Tech. 134 031002
|
[21] |
Haftbaradaran H, Soni S K and Sheldon B W 2012 J. Appl. Mech.-Trans. Asme 79 031018
|
[22] |
Kholkin A L, Wutchrich Ch, Taylor D V and Setter N 1996 Rev. Sci. Instrum. 67 1935
|
[23] |
Iijima T, Ito S and Matsuda H 2002 Jpn. J. Appl. Phys. 41 6735
|
[24] |
Sato Harumichi and Akedo J 2006 J. Am. Ceram. Soc. 89 3715
|
[25] |
Wang Z H and Miao J M 2008 J. Phys. D: Appl. Phys. 41 035306
|
[26] |
Lefki K and Dormans G J M 1994 J. Appl. Phys. 76 1764
|
[27] |
Barzegar A, Damjanovic D, Ledermann N and Muralta P 2003 J. Appl. Phys. 93 4756
|
[28] |
McCartney L N, Wright L, Cain M G, Crain J, Martyna G J and Newns D M 2014 J. Appl. Phys. 116 014104
|
[29] |
Fernandes J R, de Sa F A, Sandos J L and Joanni E 2002 Rev. Sci. Instrum. 73 2073
|
[30] |
Herdier R, Jenkins D, Dogheche E, Remiens D and Sulc M 2006 Rev. Sci. Instrum. 77 093905
|
[31] |
Prume K, Muralt P, Calame F, Schmitz-Kempen T and Tiedke S 2007 IEEE Trans. Ultrason. Ferroelectr. Freq. Control 54 8
|
[32] |
Timoshenko S P and Woinowsky-Krieger S 1959 Theory of Plates and Shells (New York: McGraw-Hill)
|
[33] |
Wang C L, Li J C and Zhao M L 2009 Physics of Piezoelectricity and Ferroelectricity (Beijing: Science Press) (in Chinese)
|
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|