Behaviors of Zn2GeO4 under high pressure and high temperature

doi:10.1088/1674-1056/25/7/076101

Abstract

The structural stability of Zn₂GeO₄ was investigated by in-situ synchrotron radiation angle dispersive x-ray diffraction. The pressure-induced amorphization is observed up to 10 GPa at room temperature. The high-pressure and high-temperature sintering experiments and the Raman spectrum measurement firstly were performed to suggest that the amorphization is caused by insufficient thermal energy and tilting Zn-O-Ge and Ge-O-Ge bond angles with increasing pressure, respectively. The calculated bulk modulus of Zn₂GeO₄ is 117.8 GPa from the pressure-volume data. In general, insights into the mechanical behavior and structure evolution of Zn₂GeO₄ will shed light on the micro-mechanism of the materials variation under high pressure and high temperature.

Keywords: pressure-induced amorphization high pressure and high temperature phase transition x-ray diffraction

Received: 29 January 2016
Revised: 21 March 2016
Accepted manuscript online:

PACS:	61.05.cp	(X-ray diffraction)
	31.15.ae	(Electronic structure and bonding characteristics)

Fund:

Project supported by the Joint Fund of the National Natural Science Foundation of China and Chinese Academy of Sciences (Grant No. U1332104).

Corresponding Authors: Fang Peng
E-mail: pengfang@scu.edu.cn

Cite this article:

Shu-Wen Yang(杨淑雯), Fang Peng(彭放), Wen-Tao Li(李文涛), Qi-Wei Hu(胡启威), Xiao-Zhi Yan(晏小智), Li Lei(雷力), Xiao-Dong Li(李晓东), Duan-Wei He(贺端威) Behaviors of Zn₂GeO₄ under high pressure and high temperature 2016 Chin. Phys. B 25 076101

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Behaviors of Zn2GeO4 under high pressure and high temperature

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Behaviors of Zn₂GeO₄ under high pressure and high temperature