CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Different influences of Schottky metal on the strain and relative permittivity of barrier layer between AlN/GaN and AlGaN/GaN heterostructure Schottky diodes |
Lü Yuan-Jie (吕元杰)a, Feng Zhi-Hong (冯志红)a, Gu Guo-Dong (顾国栋)a, Dun Shao-Bo (敦少博)a, Yin Jia-Yun (尹甲运)a, Wang Yuan-Gang (王元刚)a, Xu Peng (徐鹏)a, Han Ting-Ting (韩婷婷)a, Song Xu-Bo (宋旭波)a, Cai Shu-Jun (蔡树军)a, Luan Chong-Biao (栾崇彪)b, Lin Zhao-Jun (林兆军)b |
a National Key Laboratory of Application Specific Integrated Circuit, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China; b School of Physics, Shandong University, Jinan 250100, China |
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Abstract Ni/Au Schottky contacts on AlN/GaN and AlGaN/GaN heterostructures are fabricated. Based on the measured current–voltage and capacitance-voltage curves, the polarization sheet charge density and relative permittivity are analyzed and calculated by self-consistently solving Schrödinger’s and Poisson’s equations. It is found that the values of relative permittivity and polarization sheet charge density of AlN/GaN diode are both much smaller than the ones of AlGaN/GaN diode, and also much lower than the theoretical values. Moreover, by fitting the measured forward I–V curves, the extracted dislocations existing in the barrier layer of the AlN/GaN diode are found to be much more than those of the AlGaN/GaN diode. As a result, the conclusion can be made that compared with AlGaN/GaN diode the Schottky metal has an enhanced influence on the strain of the extremely thinner AlN barrier layer, which is attributed to the more dislocations.
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Received: 29 March 2013
Revised: 06 May 2013
Accepted manuscript online:
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PACS:
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71.55.Eq
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(III-V semiconductors)
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77.80.bn
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(Strain and interface effects)
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77.22.Ch
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(Permittivity (dielectric function))
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73.30.+y
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(Surface double layers, Schottky barriers, and work functions)
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Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 61306113, 60876009, and 11174182). |
Corresponding Authors:
Feng Zhi-Hong
E-mail: 917vv@163.com
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About author: 71.55.Eq; 77.80.bn; 77.22.Ch; 73.30.+y |
Cite this article:
Lü Yuan-Jie (吕元杰), Feng Zhi-Hong (冯志红), Gu Guo-Dong (顾国栋), Dun Shao-Bo (敦少博), Yin Jia-Yun (尹甲运), Wang Yuan-Gang (王元刚), Xu Peng (徐鹏), Han Ting-Ting (韩婷婷), Song Xu-Bo (宋旭波), Cai Shu-Jun (蔡树军), Luan Chong-Biao (栾崇彪), Lin Zhao-Jun (林兆军) Different influences of Schottky metal on the strain and relative permittivity of barrier layer between AlN/GaN and AlGaN/GaN heterostructure Schottky diodes 2014 Chin. Phys. B 23 027102
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