Moiré patterns and step edges on few-layer graphene grown on nickel films
Ke Fen (柯芬)a, Yin Xiu-Li (尹秀丽)a, Tong Nai (佟鼐)a, Lin Chen-Fang (林陈昉)a, Liu Nan (刘楠)b, Zhao Ru-Guang (赵汝光)a, Fu Lei (付磊)b, Liu Zhong-Fan (刘忠范)b, Hu Zong-Hai (胡宗海)a c
a State Key Laboratory for Artificial Microstructures and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871, China;
b Center for Nanochemistry (CNC), Beijing National Laboratory for Molecular Sciences, State Key Laboratory for Structural Chemistry of Unstable and Stable Species, College of Chemistry and Molecular Engineering, Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871, China;
c Collaborative Innovation Center for Quantum Matter, Beijing 100871, China
Abstract Few-layer graphene grown on Ni thin films has been studied by scanning tunneling microscopy. In most areas on the surfaces, moiré patterns resulted from rotational stacking faults were observed. At a bias lower than 200 mV, only one sublattice shows up in regions without moiré patterns while both sublattices are seen in regions with moiré pattens. This phenomenon can be used to identify AB stacked regions. The scattering characteristics at various types of step edges are different from those of monolayer graphene edges, either armchair or zigzag.
Fund: Project supported by the National Basic Research Program of China (Grant No. 2012CB921300), the National Natural Science Foundation of China (Grant Nos. 11074005 and 91021007), and the Chinese Ministry of Education.
Corresponding Authors:
Hu Zong-Hai
E-mail: zhhu@pku.edu.cn
Cite this article:
Ke Fen (柯芬), Yin Xiu-Li (尹秀丽), Tong Nai (佟鼐), Lin Chen-Fang (林陈昉), Liu Nan (刘楠), Zhao Ru-Guang (赵汝光), Fu Lei (付磊), Liu Zhong-Fan (刘忠范), Hu Zong-Hai (胡宗海) Moiré patterns and step edges on few-layer graphene grown on nickel films 2014 Chin. Phys. B 23 116801
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