Energy band alignment at ferroelectric/electrode interface determined by photoelectron spectroscopy

doi:10.1088/1674-1056/23/1/017702

Abstract The most important interface-related quantities determined by band alignment are the barrier heights for charge transport, given by the Fermi level position at the interface. Taking Pb(Zr,Ti)O₃ (PZT) as a typical ferroelectric material and applying X-ray photoelectron spectroscopy (XPS), we briefly review the interface formation and barrier heights at the interfaces between PZT and electrodes made of various metals or conductive oxides. Polarization dependence of the Schottky barrier height at a ferroelectric/electrode interface is also directly observed using XPS.

Keywords: ferroelectric band alignment Schottky barrier X-ray photoelectron spectroscopy

Received: 29 November 2013
Revised: 27 December 2013
Accepted manuscript online:

PACS:	77.55.fg	(Pb(Zr,Ti)O3-based films)
	73.30.+y	(Surface double layers, Schottky barriers, and work functions)
	79.60.Jv	(Interfaces; heterostructures; nanostructures)
	77.80.Fm	(Switching phenomena)

Fund: Project supported by the German Science Foundation (DFG) within the Collaborative Research Center SFB 595 (Electrical Fatigue of Functional Materials), the National Natural Science Foundation of China (Grant Nos. 11274287, 11174001, and 11204313), and the National Basic Research Program of China (Grant No. 2012CB927402).

Corresponding Authors: Chen Feng
E-mail: fchen@hmfl.ac.cn

Cite this article:

Chen Feng (陈峰), Wu Wen-Bin (吴文彬), Li Shun-Yi (李舜怡), Andreas Klein Energy band alignment at ferroelectric/electrode interface determined by photoelectron spectroscopy 2014 Chin. Phys. B 23 017702

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Energy band alignment at ferroelectric/electrode interface determined by photoelectron spectroscopy

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