Growth of threaded AlN whiskers by a physical vapor transport method

doi:10.1088/1674-1056/23/8/088103

Abstract Threaded aluminum nitride (AlN) whiskers are grown by a physical vapor transport method in a radio-frequency induction heating furnace. The resultant whiskers are characterized by X-ray diffraction, Raman scattering, scanning electron microscopy, transmission electron microscopy and photoluminescence. The analysis shows that the whiskers are single-crystalline, wurtzite AlN. The threaded AlN whiskers are 0.5 μm～ 100 μm in diameter and several millimeters in length in the fiber direction, and have lots of tiny sawteeth on the surface. The morphology of this threaded AlN whisker is beneficial for bonding when the whisker is used in composite. The growth of the whiskers is dominated by the vapor-solid (VS) mechanism, and the particular morphology might result from an oscillating condition produced in the radio-frequency induction heating furnace.

Keywords: AlN whisker threaded morphology physical vapor transport

Received: 04 September 2013
Revised: 17 December 2013
Accepted manuscript online:

PACS:	81.05.Ea	(III-V semiconductors)
	81.10.Bk	(Growth from vapor)

Fund: Project supported by the National Basic Research Program of China (Grant No. 2013CB932901), the National Natural Science Foundation of China (Grant Nos. 51210105026 and 51172270), and the Funds from the Chinese Academy of Sciences.

Corresponding Authors: Wang Wen-Jun
E-mail: wjwang@aphy.iphy.ac.cn

Cite this article:

Wang Jun (王军), Zhao Meng (赵萌), Zuo Si-Bin (左思斌), Wang Wen-Jun (王文军) Growth of threaded AlN whiskers by a physical vapor transport method 2014 Chin. Phys. B 23 088103

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