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Dynamic scaling and optical properties of Zn(S, O, OH) thin film grown by chemical bath deposition |
Zhang Yi(张毅)a)†, Li Bo-Yan(李博研)a), Dang Xiang-Yu(党向瑜)a), Wu Li(武莉)b), Jin Jing(金晶)a), Li Feng-Yan(李凤岩)a), Ao Jian-Ping(敖建平)a), and Sun Yun(孙云)a) |
a Institute of Photoelectronic Thin Film Devices and Technology, Tianjin Key Laboratory for Photoelectronic Thin Film Devices and Technology, and Key Laboratory of Optoelectronic Information Science & Technology of Ministry of Education, Nankai University, Tianjin 300071, China; b Institute of Physics, Nankai University, Tianjin 300071, China |
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Abstract The scaling behavior and optical properties of Zn(S, O and OH) thin films deposited on soda-lime glass substrates by chemical bath deposition method were studied by combined roughness measurements, scanning electron microscopy and optical properties measurement. From the scaling behaviour, the value of growth scaling exponent β , 0.38±0.06, was determined. This value indicated that the Zn(S, O, OH) film growth in the heterogeneous process was influenced by the surface diffusion and shadowing effect. Results of the optical properties measurements disclosed that the transmittance of the film was in the region of 70%-88% and the optical properties of the film grown for 40 min were better than those grown under other conditions. The energy band gap of the film deposited with 40 min was around 3.63 eV.
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Received: 04 January 2011
Revised: 14 July 2011
Accepted manuscript online:
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PACS:
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68.55.A-
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(Nucleation and growth)
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78.20.-e
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(Optical properties of bulk materials and thin films)
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81.15.Aa
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(Theory and models of film growth)
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81.15.Lm
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(Liquid phase epitaxy; deposition from liquid phases (melts, solutions, And surface layers on liquids))
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Fund: Project supported by the National High Technology Research and Development Program of China (Grant No. 2004AA513020), the National Basic Research Program of China (Grant No. 2010CB933803), and the National Natural Science Foundation of China (Grant Nos. 60906033, 50902074, and 90922037). |
Cite this article:
Zhang Yi(张毅), Li Bo-Yan(李博研), Dang Xiang-Yu(党向瑜), Wu Li(武莉), Jin Jing(金晶), Li Feng-Yan(李凤岩), Ao Jian-Ping(敖建平), and Sun Yun(孙云) Dynamic scaling and optical properties of Zn(S, O, OH) thin film grown by chemical bath deposition 2011 Chin. Phys. B 20 116802
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[1] |
Bar M, Ennaoui A, Klaer J, Kropp T, Saez-Araoz R, Allsop N, Lauermann I, Schock H W and Lux-Steiner M C 2006 J. Appl. Phys. 99 123503
|
[2] |
Islam M M, Ishizuka S, Yamada A, Sakurai K, Niki S, Sakurai T and Akimoto K 2009 Solar Energy Mater. Solar Cells 93 970
|
[3] |
Vidal J, Vigil O, de Melo O, Lopez N and Zelaya-ngel O 1999 Mater. Chem. Phys. 61 139
|
[4] |
Ma H, Ma G H, Wang W J, Gao X X and Ma H L 2008 Chin. Phys. B 17 1280
|
[5] |
Pavaskar N R, Menezes C A and Sinha A P B 1977 J. Electrochem. Soc. 124 743
|
[6] |
Kaur I, Pandya D K and Chopra K L 1980 J. Electrochem. Soc. 127 943
|
[7] |
Dona J M and Herrero J 1992 J. Electrochem. Soc. 139 2810
|
[8] |
Lincot D, Ortega-Borges R and Froment M 1994 Appl. Phys. Lett. 64 569
|
[9] |
Cortes R, Froment M, Mokilim B and Lincot D 1996 Phil. Mag. Lett. 73 209
|
[10] |
Zhang Y, Dang X Y, Jin J, Yu T, Li B Z, He Q, Li F Y and Sun Y 2010 Appl. Surf. Sci. 256 6871
|
[11] |
Bhattacharya R N, Contreras M A and Teeter G 2004 Jpn. J. Appl. Phys. 43B L1475
|
[12] |
Vasseur K, Rollin C, Vandezande S, Temst K, Froyen L and Heremans P 2010 J. Phys. Chem. C 114 2730
|
[13] |
He J F, Niu Z C, Chang X Y, Ni H Q, Zhu Y, Li M F and Shang X J 2010 Chin. Phys. B 20 018102
|
[14] |
Barabasi A L and Stanley H E 1995 Fractal Concepts in Surface Growth (Cambridge: Cambridge University Press) p. 20
|
[15] |
Krug J 1997 Adv. Phys. 46 139
|
[16] |
Bray K R and Parsons G N 2001 Phys. Rev. B 65 035311
|
[17] |
Zhang Y, Barrena E, Zhang X N, Turak A, Maye F and Dosch H 2010 J. Phys. Chem. C 114 13752
|
[18] |
Chen L, Zhang D and Chen Q 2006 Proceedings of the 1st IEEE International Conference on Nano/micro Engineered and Molecular Systems p. 599
|
[19] |
Nakada T, Furumi K and Kunioka A 1999 IEEE Trans. On Elec. Dev. 46 2093
|
[20] |
Sirringhaus H, Brown P J, Friend R H, Nielsen M M, Bechgaard K, Langeveld-Voss B M W, Spiering A J, Janssen R A J, Herwig P and de Leeuw D M 1999 Nature 401 685
|
[21] |
Kardar M, Parisi G and Zhang Y C 1986 Phys. Rev. Lett. 56 889
|
[22] |
Lafouresse M C, Heard P J and Schwarzacher W 2007 Phys. Rev. Lett. 98 236101
|
[23] |
Roennow D, Isidorsson J and Niklasson G A 1996 Phys. Rev. E 54 4021
|
[24] |
Drotar J T, Zhao Y P, Lu T M and Wang G C 2000 Phys. Rev. B 62 2118
|
[25] |
Duerr A C, Schreiber F, Ritley K A, Kruppa V, Krug J, Dosch H and Struth B 2003 Phys. Rev. Lett. 90 016104
|
[26] |
das Sarma S and Tamborenea P 1991 Phys. Rev. Lett. 66 325
|
[27] |
Wolf D and Villanin J 1990 Europhys. Lett. 13 389
|
[28] |
Krug K, Stettner J and Magnussen O M 2006 Phys. Rev. Lett. 96 246101
|
[29] |
Hayakawa R, Turak A, Zhang X N, Hiroshiba N, Dosch H, Chikyow T and Wakayama Y 2010 J. Chem. Phys. 133 034706
|
[30] |
Dolatshahi-Pirouz A, Hovgaard M B, Rechendorff K, Chevallier J, Foss M and Besenbacher F 2008 Phys. Rev. B 77 115427
|
[31] |
Platzer-Bjorkman C, Tomdahl T, Abou-Ras D, Malmstrom J, Kessler J and Stolt L 2006 J. Appl. Phys. 100 044506
|
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