OSCILLATORY INTERLAYER COUPLING WITH Cu AND Zr UNDERLAYER THICKNESS FOR Co/Cu MULTILAYERS
Zhao Tong-yun (赵同云)abc, Shan Zheng-sheng (单郑生)b, Shen Bao-gen (沈保根)a, Zhao Jian-gao (赵见高)a, D. J. Sellmyerb
a State Key Laboratory for Magnetism, Institute of Physics, Academia Sinica, Beijing 100080, China; b Behlen Laboratory of Physics and Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE 68588-0113, USA; c Department of Physics, Wuhan University, Wuhan 430072, China
Abstract Oscillatory behavior (with a period of about 9 nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.
Received: 02 December 1997
Revised: 25 February 1998
Accepted manuscript online:
PACS:
75.70.Cn
(Magnetic properties of interfaces (multilayers, superlattices, heterostructures))
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