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A novel stack-HfO2 top-gate structure for improving performance of network carbon nanotube transistor |
| Bowen Zhang(张博文)1, Yimin Lei(雷毅敏)1,2,†, Jiejie Zhu(祝杰杰)1,‡, Weiwei Wang(王巍巍)2, Yuxiang Wei(魏宇翔)1, Lingjie Qin(秦灵洁)1, Mingchen Zhang(张明辰)1, Jiaxiang Xu(徐佳响)2, Hong Wang(王宏)1, Xiaohua Ma(马晓华)1, and Yue Hao(郝跃)1 |
1 National Engineering Research Center of Wide Band-Gap Semiconductor, Faculty of Integrated Circuit, Xidian University, Xi'an 710126, China; 2 School of Advanced Materials and Nanotechnology, Xidian University, Xi'an 710071, China |
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Abstract Carbon nanotubes (CNTs) are regarded as a powerful contender to replace Si transistors after Moore's law due to their advantages such as quasi-ballistic transport, high carrier mobility, and low power consumption. In the traditional CNT preparation process, CNTs are deposited on SiO$_{2}$ substrate and then the gate dielectric is deposited. In this structure, pinholes will appear between CNTs and dielectric layer, which will affect the gate-control and increase the gate leakage current. Therefore, in this paper, we designed a new stack-HfO$_{2}$ top-gate (STG) network CNTFET. By filling the pinholes between CNTs and dielectric layer, the contact interface condition is improved, reducing the subthreshold swing and improving $I_{\rm on}/I_{\rm off}$ of the device. Meanwhile, through first-principles calculations, compared with the conventional structure, the interface charge transfer value of the CNT/HfO$_{2}$ interface for STG is about 5 times smaller than that of CNT/SiO$_{2}$ interface. Specifically, the mobility and $SS$, and $I_{\rm on}/I_{\rm off}$ of the STG structure are 130 cm$^{2}$/V$\cdot$s, 156 mV/dec, and 10$^{7}$, respectively. Taking into account the above advantages, the proposed STG structure has reference value for improving the performance of CNTFET.
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Received: 17 July 2025
Revised: 09 September 2025
Accepted manuscript online: 15 September 2025
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PACS:
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61.46.-w
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(Structure of nanoscale materials)
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61.05.-a
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(Techniques for structure determination)
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68.47.Gh
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(Oxide surfaces)
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73.63.-b
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(Electronic transport in nanoscale materials and structures)
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| Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 62188102, 62174125, and 62274130) and the Innovation Fund of Xidian University (Grant No. YJSJ23019). |
Corresponding Authors:
Yimin Lei, Jiejie Zhu
E-mail: leiym@xidian.edu.cn;jjzhu@mail.xidian.edu.cn
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Cite this article:
Bowen Zhang(张博文), Yimin Lei(雷毅敏), Jiejie Zhu(祝杰杰), Weiwei Wang(王巍巍), Yuxiang Wei(魏宇翔), Lingjie Qin(秦灵洁), Mingchen Zhang(张明辰), Jiaxiang Xu(徐佳响), Hong Wang(王宏), Xiaohua Ma(马晓华), and Yue Hao(郝跃) A novel stack-HfO2 top-gate structure for improving performance of network carbon nanotube transistor 2026 Chin. Phys. B 35 056103
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