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Micromagnetic simulation with three models of FeCo/L10 FePt exchange-coupled particles for bit-patterned media |
Wang Ying (王颖), Wang Rui (王锐), Xie Hai-Long (谢海龙), Bai Jian-Min (白建民), Wei Fu-Lin (魏福林) |
Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 730000, China |
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Abstract Compositing soft and hard materials is a promising method to decrease the coercivity of L10 FePt, which is considered to be a suitable material for bit patterned media. This paper reports the simulation of three models of FeCo/L10 FePt exchange-coupled composite particles for bit patterned media by micromagnetic simulation software OOMMF. The three models are: enclosed model, side-enclosed model, and top-covered model. All of them have the same volumes of soft and hard parts but different shapes. Simulation results show that the switching fields for the three models can be reduced to about 10 kOe (1 Oe = 79.5775 A/m) and the factor gain can be improved to 1.4 when the interface exchange coefficient has a proper value. Compared to the other models, the enclosed model has a wider range of interface exchange coefficient values in which low switching field and high gain can be obtained. The dependence of switching fields on the angle of the applied field shows that none of the three models are easily affected by the stray field of a magnetic head.
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Received: 12 October 2012
Revised: 13 November 2012
Accepted manuscript online:
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PACS:
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85.70.Ay
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(Magnetic device characterization, design, and modeling)
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Fund: Project supported by the National Natural Science Foundation of China (Grant Nos. 61003041, 51171086, and 61272076) and the Fundamental Research Funds for the Central Universities (Grant No. lzujbky-2010-81). |
Corresponding Authors:
Wang Ying
E-mail: yingw@lzu.edu.cn
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Cite this article:
Wang Ying (王颖), Wang Rui (王锐), Xie Hai-Long (谢海龙), Bai Jian-Min (白建民), Wei Fu-Lin (魏福林) Micromagnetic simulation with three models of FeCo/L10 FePt exchange-coupled particles for bit-patterned media 2013 Chin. Phys. B 22 068506
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