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Effect of vacancy charge state on positron annihilation in silicon |
Liu Jian-Dang (刘建党)a b, Cheng Bin (成斌)a b, Kong Wei (孔伟)a b, Ye Bang-Jiao (叶邦角)a b |
a State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China; b Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China |
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Abstract The charge-state-dependent lattice relaxation of mono-vacancy in silicon is studied using the first-principles pseudopotential plane-wave method. We observe that the structural relaxation for the first-neighbor atoms of the mono-vacancy is strongly dependent on its charge state. The difference in total electron density between with and without charge states in mono-vacancy and its relevant change due to the localized positron are also examined by means of first-principles simulation, demonstrating the strong interplay between positron and electron. Our calculations reveal that the positron lifetime decreases with absolute charge value increasing.
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Received: 15 December 2012
Revised: 07 April 2013
Accepted manuscript online:
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PACS:
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61.72.jd
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(Vacancies)
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71.55.-i
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(Impurity and defect levels)
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78.70.Bj
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(Positron annihilation)
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Fund: Project supported by the Fundamental Research Funds for the Central Universities and the National Natural Science Fundation of China (Grant Nos. 11105139 and 11175171). |
Corresponding Authors:
Ye Bang-Jiao
E-mail: bjye@ustc.edu.cn
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Cite this article:
Liu Jian-Dang (刘建党), Cheng Bin (成斌), Kong Wei (孔伟), Ye Bang-Jiao (叶邦角) Effect of vacancy charge state on positron annihilation in silicon 2013 Chin. Phys. B 22 106104
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