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Chinese Physics, 2005, Vol. 14(5): 1036-1040    DOI: 10.1088/1009-1963/14/5/032
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Influence of external voltage on electronic transport properties of molecular junctions: the nonlinear transport behaviour 

Li Zong-Liang (李宗良)a, Wang Chuan-Kui (王传奎)a, Luo Yi (罗毅)b, Xue Qi-Kun (薛其坤)c
a College of Physics and Electronics, Shandong Normal University, Jinan 250014, China; b Laboratory of Theoretical Chemistry, Royal Institute of Technology, SCFAB S-10691 Stockholm, Sweden; c State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Science, Beijing 100080, China
Abstract  The influence of external voltage on the charge transport properties of benzene-1,4-dithiolate molecular junction has been investigated. Variations of the geometric and electronic structures for the molecule caused by the applied voltage are calculated at ab initio level. Based on the numerical results, we find that the energy shift and expansion coefficients in the end-site of the molecule for the frontier molecular orbitals show nearly linear dependence on voltage in the interesting voltage interval. The charge transport properties of the molecular junction are then studied by employing the elastic scattering Green’s function method. It is shown that the voltage has an obvious effect on the I-V characteristic of the molecular junction, particularly the shape of the conductance curves. The I-V curves are consistent with the experimental measurement quite well.
Keywords:  electric field      current-voltage curves      molecular electronics  
Received:  25 November 2004      Revised:  21 January 2005      Accepted manuscript online: 
PACS:  7340G  
  7115A  
  3450D  
  7200  
Fund: 国家自然科学基金(10274044)和瑞典国际发展合作局资助

Cite this article: 

Li Zong-Liang (李宗良), Wang Chuan-Kui (王传奎), Luo Yi (罗毅), Xue Qi-Kun (薛其坤) Influence of external voltage on electronic transport properties of molecular junctions: the nonlinear transport behaviour  2005 Chinese Physics 14 1036

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