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Chinese Physics, 2004, Vol. 13(10): 1597-1600    DOI: 10.1088/1009-1963/13/10/002
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Electron behaviour in CH4/H2 gas mixture in electron-assisted chemical vapour deposition

Dong Li-Fang (董丽芳), Ma Bo-Qin (马博琴), Wang Zhi-Jun (王志军)
College of Physics Science and Technology, Hebei University, Baoding 071002, China
Abstract  The behaviour of electrons in CH$_{4}$/H$_{2}$ gas mixture in electron-assisted chemical vapour deposition of diamond is investigated using Monte Carlo simulation. The electron drift velocity in gas mixture is obtained over a wide range of E/P (the ratio of the electric field to gas pressure) from 1500 to 300000 (V/m kPa$^{-1}$). The electron energy distribution and average energy under different gas pressure (0.1-20kPa) and CH$_{4}$ concentration (0.5%-10.0%) are calculated. Their effects on the diamond growth are also discussed. It is believed that these results will be helpful to the selection of optimum experimental conditions for high quality diamond film deposition.
Keywords:  Monte Carlo simulation      chemical vapour deposition      electron swarm      drift velocity  
Received:  14 January 2004      Revised:  10 March 2004      Accepted manuscript online: 
PACS:  81.15.Aa (Theory and models of film growth)  
  81.15.Gh (Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.))  
  68.55.Ac  
Fund: Project supported by the Natural Science Foundation of Hebei Province, China (Grant No 502121).

Cite this article: 

Dong Li-Fang (董丽芳), Ma Bo-Qin (马博琴), Wang Zhi-Jun (王志军) Electron behaviour in CH4/H2 gas mixture in electron-assisted chemical vapour deposition 2004 Chinese Physics 13 1597

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