Chin. Phys. B
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Chin. Phys. B  2018, Vol. 27 Issue (6): 067802    DOI: 10.1088/1674-1056/27/6/067802
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Current Issue| Next Issue| Archive| Adv Search |
Variable angle spectroscopic ellipsometry and its applications in determining optical constants of chalcogenide glasses in infrared
Ning-Ning Wei(韦宁宁)1,2, Zhen Yang(杨振)1,2, Hong-Bo Pan(潘宏波)1,2, Fan Zhang(张凡)1,2, Yong-Xing Liu(刘永兴)1,2, Rong-Ping Wang(王荣平)1,2, Xiang Shen(沈祥)1,2, Shi-Xun Dai(戴世勋)1,2, Qiu-Hua Nie(聂秋华)1,2
1 Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;
2 Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China

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