Chin. Phys. B
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Chin. Phys. B  2017, Vol. 26 Issue (8): 088503    DOI: 10.1088/1674-1056/26/8/088503
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An investigation of ionizing radiation damage in different SiGe processes
Pei Li(李培)1, Mo-Han Liu(刘默寒)3, Chao-Hui He(贺朝会)1, Hong-Xia Guo(郭红霞)2, Jin-Xin Zhang(张晋新)1, Ting Ma(马婷)1
1 School of Energy and Power Engineering, Xi'an Jiaotong University, Xi'an 710049, China;
2 Northwest Institution of Nuclear Technology, Xi'an 710024, China;
3 Key Laboratory of Functional Materials and Devices for Special Environments of Chinese Academy of Sciences, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China

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