Ionization for Hf- and W-L-shell by electron impact
Yang Dai-Lun, Luo Xiao-Bing, Fu Yu-Chuan, He Fu-Qing, Long Xian-Guan, Peng Xiu-Feng, Luo Zheng-Ming
Key Laboratory for Radiation Physics and Technology of the Education Ministry of China, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China
Abstract Electron-induced Hf-, W-L-shell partial, total production cross sections, mean ionization cross sections and Hf-L_3-shell ionization cross sections (at two energies) have been measured as functions of electron energies (from near threshold to 36keV). The influence of electrons reflected from the backing of the thin targets on measured results was corrected using a model to relate to the electron transport process. The mean paths of electron multi-scattered in the target itself (including forward and backward scattering) were calculated by means of Monte Carlo program (EGS4) and they were used to correct measured results. A comparison with both theoretical predictions was given.
Received: 30 May 2003
Revised: 26 November 2003
Published: 06 July 2005
PACS:
34.80.Dp
(Atomic excitation and ionization)
Fund: Project supported in part by the National Natural Science Foundation of China (Grant No 19874045), and by the International Atomic Energy Agency, IAEA Research Contract No. 12354/RO/RBF.
Cite this article:
Yang Dai-Lun, Luo Xiao-Bing, Fu Yu-Chuan, He Fu-Qing, Long Xian-Guan, Peng Xiu-Feng, Luo Zheng-Ming Ionization for Hf- and W-L-shell by electron impact 2004 Chin. Phys. 13 670
