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Enhanced thermal stability of OLEDs based on an organic n-p heterojunction and its derivative |
| Wei Shi(施薇)1,2, Wei Zhao(赵微)1,2, Bingjia Zhao(赵冰佳)1,2,3, Yangyang Zhu(朱杨洋)1,2, Yang Lin(林洋)1,2, Yachen Xu(徐亚晨)1,2, Weixia Lan(兰伟霞)1,2,4,†, and Bin Wei(魏斌)1,2,4 |
1 School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200072, China; 2 Key Laboratory of Advanced Display and System Applications, Ministry of Education, Shanghai University, Shanghai 200072, China; 3 School of Microelectronics, Shanghai University, Shanghai 200444, China; 4 Nanan Institute of Shanghai University, Nan'an 362300, China |
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Abstract To address the issues of insufficient thermal stability in charge generation layers (CGLs) and carrier imbalance induced by high-temperature annealing in organic light-emitting diodes (OLEDs), this study proposes a metal oxide-doped organic n-p heterojunction (BPhen:Ag$_{2}$O/NPB:MoO$_{3}$) as the core functional layer and designs novel device structures based on its derivatives. By analyzing the performance evolution of heterojunction thin films and OLEDs under annealing treatments ranging from 27 $^\circ$C to 100 $^\circ$C, it was found that after high-temperature annealing, the surface MoO$_{3}$ particles became uniformly dispersed in the heterojunction films, with reduced roughness and no crystallization observed, demonstrating excellent thermal stability. Single-carrier device tests revealed that the current density reached its maximum value at 80 $^\circ$C annealing. In comparison, at 100 $^\circ$C annealing, the current density decreased due to the dissociation of charge-transfer complexes (CTCs), yet it remained higher than that under ambient conditions. Furthermore, the performance degradation of the newly developed p-i-n-p structure OLEDs after high-temperature annealing was significantly smaller compared to conventional p-i-n structures.
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Received: 20 June 2025
Revised: 01 August 2025
Accepted manuscript online: 21 August 2025
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PACS:
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85.30.-z
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(Semiconductor devices)
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73.40.Kp
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(III-V semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions)
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72.80.Le
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(Polymers; organic compounds (including organic semiconductors))
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68.60.Dv
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(Thermal stability; thermal effects)
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| Fund: This work was financially supported by the National Natural Science Foundation of China (Grant No. 62304127) and the Natural Science Foundation of Shanghai Municipality (Grant No. 24ZR1422300). |
Corresponding Authors:
Weixia Lan
E-mail: weixia_lan@shu.edu.cn
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Cite this article:
Wei Shi(施薇), Wei Zhao(赵微), Bingjia Zhao(赵冰佳), Yangyang Zhu(朱杨洋), Yang Lin(林洋), Yachen Xu(徐亚晨), Weixia Lan(兰伟霞), and Bin Wei(魏斌) Enhanced thermal stability of OLEDs based on an organic n-p heterojunction and its derivative 2026 Chin. Phys. B 35 038502
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