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Magnetic-field-induced photoluminescence enhancement in type-I quantum wells: A quantitative probe for interface flatness |
| Jun Shao(邵军)1,2,†, Man Wang(王嫚)1,3, Xiren Chen(陈熙仁)4,5,‡, Liangqing Zhu(朱亮清)6, F. X. Zha(查访星)7, H. Zhao8, Shumin Wang(王庶民)8,§, and Wei Lu(陆卫)1,2 |
1 State Key Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China; 2 Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, China; 3 University of Chinese Academy of Sciences, Beijing 100049, China; 4 National Key Laboratory of Infrared Detection Technologies, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China; 5 Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China; 6 Key Laboratory of Polar Materials and Devices, Ministry of Education, East China Normal University, Shanghai 200062, China; 7 Physics Department, Shanghai University, Shanghai 200444, China; 8 Department of Microtechnology and Nanoscience, Chalmers University of Technology, S-41296 G?teborg, Sweden |
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Abstract Interfacial disorders in semiconductor quantum wells (QWs) determine material properties and device performance and have attracted great research efforts using different experimental methods. However, so far, there has been no way to quantify the lateral length distribution of the interfacial disorders in QWs. Since photoluminescence (PL) is sensitive to exciton localization, the evolutions of PL energy and linewidth under external perpendicular magnetic fields have served as effective measurement methods for QW analysis; however, the evolution of PL intensity has not played a matching role. In this paper, we develop a theoretical model correlating the PL intensity with the interfacial disorders of type-I QWs under an external perpendicular magnetic field. We verify the model's rationality and functionality using InGa(N)As/GaAs single QWs. In addition, we derive the Urbach energy and determine the lateral length distribution of interfacial disorders. The results show that the magnetic field-dependent PL intensity, as described by our model, serves as a valid probe for quantifying the interface flatness. The model also reveals that the mechanism of magnetic-field-induced intensity enhancement is a joint effect of interfacial disorder-induced exciton localization and the transfer of excitons from dark to bright states. These insights may benefit performance improvements of type-I QW materials and devices.
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Received: 17 June 2025
Revised: 11 July 2025
Accepted manuscript online: 30 July 2025
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PACS:
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78.55.-m
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(Photoluminescence, properties and materials)
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78.67.De
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(Quantum wells)
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79.60.-i
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(Photoemission and photoelectron spectra)
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79.60.Jv
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(Interfaces; heterostructures; nanostructures)
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| Fund: The work was partially supported by the National Natural Science Foundation of China (Grant Nos. 12227901, 12393830, and 12274429) and the STCSM (Grant No. 22QA1410600). |
Corresponding Authors:
Jun Shao, Xiren Chen, Shumin Wang
E-mail: jshao@mail.sitp.ac.cn;xrchen@mail.sitp.ac.cn;shumin@chalmers.se
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Cite this article:
Jun Shao(邵军), Man Wang(王嫚), Xiren Chen(陈熙仁), Liangqing Zhu(朱亮清), F. X. Zha(查访星), H. Zhao, Shumin Wang(王庶民), and Wei Lu(陆卫) Magnetic-field-induced photoluminescence enhancement in type-I quantum wells: A quantitative probe for interface flatness 2025 Chin. Phys. B 34 107802
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