CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES |
Prev
Next
|
|
|
Pattern dependence in synergistic effects of total dose onsingle-event upset hardness |
Hongxia Guo(郭红霞), Lili Ding(丁李利), Yao Xiao(肖尧), Fengqi Zhang(张凤祁), Yinhong Luo(罗尹虹), Wen Zhao(赵雯), Yuanming Wang(王园明) |
State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an 710072, China |
|
|
Abstract The pattern dependence in synergistic effects was studied in a 0.18 μ static random access memory (SRAM) circuit. Experiments were performed under two SEU test environments: 3 MeV protons and heavy ions. Measured results show different trends. In heavy ion SEU test, the degradation in the peripheral circuitry also existed because the measured SEU cross section decreased regardless of the patterns written to the SRAM array. TCAD simulation was performed. TID-induced degradation in nMOSFETs mainly induced the imprint effect in the SRAM cell, which is consistent with the measured results under the proton environment, but cannot explain the phenomena observed under heavy ion environment. A possible explanation could be the contribution from the radiation-induced GIDL in pMOSFETs.
|
Received: 02 January 2016
Revised: 08 May 2016
Accepted manuscript online:
|
PACS:
|
61.80.-x
|
(Physical radiation effects, radiation damage)
|
|
73.40.Qv
|
(Metal-insulator-semiconductor structures (including semiconductor-to-insulator))
|
|
Fund: Project supported by the National Natural Science Foundation of China (Grant No. U1532261). |
Corresponding Authors:
Hongxia Guo
E-mail: guohxnint@126.com
|
Cite this article:
Hongxia Guo(郭红霞), Lili Ding(丁李利), Yao Xiao(肖尧), Fengqi Zhang(张凤祁), Yinhong Luo(罗尹虹), Wen Zhao(赵雯), Yuanming Wang(王园明) Pattern dependence in synergistic effects of total dose onsingle-event upset hardness 2016 Chin. Phys. B 25 096109
|
[1] |
Knudson A R, Campbell A B and Hammond E C 1983 IEEE Trans. Nucl. Sci. NS-30 4508
|
[2] |
Campbell A B and Stapor W J 1984 IEEE Trans. Nucl. Sci. NS-31 1175
|
[3] |
Schwank J R, Dodd P E, Shaneyfelt M R, Felix J R, Hash G L, Ferlet-Cavrois V, Paillet P, Baggio J, Tangyunyong P and Blackmore E 2004 IEEE Trans. Nucl. Sci. 51 3692
|
[4] |
Barnaby H J 2006 IEEE Trans. Nucl. Sci. 53 3103
|
[5] |
Schwank J R, Shaneyfelt M R, Felix J A, Dodd P E, Baggio J, Ferlet-Cavrois V, Paillet P, Hash G J, Flores R S, Massengill L W and Blackmore E 2006 IEEE Trans. Nucl. Sci. 53 1772
|
[6] |
Xiao Y, Guo H, Zhang F, Zhao W, Wang Y, Zhang K, Ding L, Fan X, Luo Y and Wang Y 2014 Chin. Phys. B 23 118503
|
[7] |
Xiao Y, Guo H, Zhang F, Zhao W, Wang Y, Wang Y, Ding L, Fan X, Luo Y and Zhang K 2014 Acta Phys. Sin. 63 018501 (in Chinese)
|
[8] |
Bhuva B L, Johnson Jr R L, Gyurcsik R S, Fernald K W and Kerna S E 1987 IEEE Trans. Nucl. Sci. NS-34 1414
|
[9] |
Koga R, Yu P, Crawford K, George J and Zakrzewski M 2009 IEEE Radiation Effects Data Workshop, July 20-24, 2009, Quebec, p. 127
|
[10] |
Matsukawa T, Kishida A, Tanii T, Koh M, Horital K, Haral K, Shigeta B, Goto M, Matsuda S, Kuboyama S and Ohdomari I 1994 IEEE Trans. Nucl. Sci. 41 2071
|
[11] |
Guo H, Luo Y, Yao Z, Zhang F, Zhang K, He B and Wang Y 2010 Atomic Energy Science and Technology 44 1495 (in Chinese)
|
[12] |
Dale C J, Marshall P W, Burke E A, Summers G P and Wolicki E A 1988 IEEE Trans. Nucl. Sci. 35 1208
|
[13] |
Ma T P and Dressendorfer P V 1989 John Wiley Sons Press p. 36
|
[14] |
Integrated Systems Engineering Inc. 2004, ISE TCAD Release 10.0, DESSIS Manual
|
[15] |
Paillet P, Gaillardin M, Ferlet-Cavrois V, Torres A, Faynot O, Jahan C, Tosti L and Cristoloveanu S 2005 IEEE Trans. Nucl. Sci. 52 2345
|
[16] |
Peng C, Hu Z, Ning B, Dai L, Bi D and Zhang Z 2015 Solid-State Electron. 106 81
|
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|