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Chin. Phys. B, 2014, Vol. 23(2): 025204    DOI: 10.1088/1674-1056/23/2/025204
PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES Prev   Next  

Mechanical properties of Al/a-C nanocomposite thin films synthesized using a plasma focus device

Z. A. Umara b, R. S. Rawata, R. Ahmadc, A. K. Kumard, Y. Wanga, T. Hussainc, Z. Chend, L. Shene, Z. Zhange
a NSSE, National Institute of Education, Nanyang Technological University, Singapore 637616, Singapore;
b Department of Physics, GC University, 54000 Lahore, Pakistan;
c Center for Advanced Studies in Physics (CASP), GC University, 54000 Lahore, Pakistan;
d School of Materials Science and Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore;
e Institute of Materials Research and Engineering, A*STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602, Singapore
Abstract  The Al/a-C nanocomposite thin films are synthesized on Si substrates using a dense plasma focus device with aluminum fitted anode and operating with CH4/Ar admixture. X-ray diffractometer results confirm the formation of metallic crystalline Al phases using different numbers of focus shots. Raman analyses show the formation of D and G peaks for all thin film samples, confirming the presence of a-C in the nanocomposite thin films. The formation of Al/a-C nanocomposite thin films is further confirmed using X-ray photoelectron spectroscopy analysis. The scanning electron microscope results show that the deposited thin films consist of nanoparticles and their agglomerates. The sizes of th agglomerates increase with increasing numbers of focus deposition shots. The nanoindentation results show the variations in hardness and elastic modulus values of nanocomposite thin film with increasing the number of focus shots. Maximum values of hardness and elastic modulus of the composite thin film prepared using 20 focus shots are found to be about 10.7 GPa and 189.2 GPa, respectively.
Keywords:  dense plasma focus      X-ray photoelectron spectroscopy      field emission scanning electron microscope      elastic modulus  
Received:  04 February 2013      Revised:  20 May 2013      Accepted manuscript online: 
PACS:  52.59.Hq (Dense plasma focus)  
  79.60.-i (Photoemission and photoelectron spectra)  
  68.37.Vj (Field emission and field-ion microscopy)  
  62.20.de (Elastic moduli)  
Corresponding Authors:  R. Ahmad     E-mail:  ahriaz@gcu.edu.pk
About author:  52.59.Hq; 79.60.-i; 68.37.Vj; 62.20.de

Cite this article: 

Z. A. Umar, R. S. Rawat, R. Ahmad, A. K. Kumar, Y. Wang, T. Hussain, Z. Chen, L. Shen, Z. Zhang Mechanical properties of Al/a-C nanocomposite thin films synthesized using a plasma focus device 2014 Chin. Phys. B 23 025204

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