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A novel power UMOSFET with a variable K dielectric layer |
Wang Ying(王颖)†, Lan Hao(兰昊), Cao Fei(曹菲), Liu Yun-Tao(刘云涛), and Shao Lei(邵雷) |
College of Information and Communication Engineering, Harbin Engineering University, Harbin 150001, China |
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Abstract A novel split-gate power UMOSFET with a variable K dielectric layer is proposed. This device shows a 36.2% reduction in the specific on-state resistance at a breakdown voltage of 115 V, as compared with the SGE-UMOS device. Numerical simulation results indicate that the proposed device features high performance with an improved figure of merit of Qg ? RON and BV2/RON, as compared with the previous power UMOSFET.
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Received: 24 October 2011
Revised: 11 November 2011
Accepted manuscript online:
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PACS:
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85.30.Tv
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(Field effect devices)
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85.30.De
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(Semiconductor-device characterization, design, and modeling)
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85.30.-z
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(Semiconductor devices)
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Fund: Project supported by the National Natural Science Foundation of China (Grant No. 60906048), the Program for New Century Excellent Talents in University, China (Grant No. NCET-10-0052), and the Fundamental Research Funds for the Central Universities, China (Grant No. HEUCFT1008). |
Corresponding Authors:
Wang Ying
E-mail: wangying7711@yahoo.com
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Cite this article:
Wang Ying(王颖), Lan Hao(兰昊), Cao Fei(曹菲), Liu Yun-Tao(刘云涛), and Shao Lei(邵雷) A novel power UMOSFET with a variable K dielectric layer 2012 Chin. Phys. B 21 068503
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