CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
Prev
Next
|
|
|
Thermal effect mechanism of magnetoresistance in p-type diamond films |
Qin Guo-Ping(秦国平)a), Kong Chun-Yang(孔春阳)a)†, Ruan Hai-Bo(阮海波)a), Huang Gui-Juan(黄桂娟)a), Cui Yu-Ting(崔玉亭)a), and Fang Liang(方亮)b) |
a Key Laboratory of Optical Engineering, Chongqing Normal University, Chongqing 400047, China; b Department of Applied Physics, Chongqing University, Chongqing 400044, China |
|
|
Abstract Based on the analysis and the discussion of the influence of thermal ionization energy and various scatterings on magnetoresistance(MR) of p-type diamond films, a revised model of valence band split-off over temperature is put forward, and a corresponding calculation formula is given for the MR of p-type diamond films (Corbino discs). It is shown that the theoretical calculation that the MR of diamond films changes with temperature is consistent with the experiment. The influence of Fermi energy level on MR of diamond films is discussed. Additionally, the thermal effect mechanism of MR in p-type diamond films is also explored.
|
Received: 22 March 2010
Revised: 17 May 2010
Accepted manuscript online:
|
PACS:
|
71.20.Nr
|
(Semiconductor compounds)
|
|
73.50.Jt
|
(Galvanomagnetic and other magnetotransport effects)
|
|
73.61.Cw
|
(Elemental semiconductors)
|
|
Fund: Project supported by the Chongqing City Education Commission of China (Grant No. 040804). |
Cite this article:
Qin Guo-Ping(秦国平), Kong Chun-Yang(孔春阳), Ruan Hai-Bo(阮海波), Huang Gui-Juan(黄桂娟), Cui Yu-Ting(崔玉亭), and Fang Liang(方亮) Thermal effect mechanism of magnetoresistance in p-type diamond films 2010 Chin. Phys. B 19 117501
|
[1] |
Zhang Z Y, Lu X C and Luo J B 2007 Chin. Phys. 16 3790
|
[2] |
Wang L, Ouyang X P, Fan R Y, Jin Y J, Zhang Z B, Pan H B, Liu L Y, L"u F X and Bu R A 2008 Chin. Phys. B 17 3644
|
[3] |
Kamiya S, Sato M, Saka M and Hiroyuki A 1999 Appl. Phys. 86 224
|
[4] |
Vermeeren V, Bijnens N, Wenmackers S, Daenen M, Haenen K, Williams O A, Ameloot M, VandeVen M, Wagner P and Michiels L 2007 Langmuir 23 13193
|
[5] |
Mitsuda Y and Kobauashi K 1999 Thin Solid Films 345 55
|
[6] |
Ye H, Tumilty N, Bevilacqua M, Curat S, Nesladek M, Bazin B, Bergonzo P, and Jackman R B 2008 J. Appl. Phys. 103 054503
|
[7] |
Willems B L, Dao V H, Vanacken J, Chibotaru L F, Moshchalkov V V, Guillam'on I, Suderow H, Vieira S, Janssens S D, Williams O A, Haenen K and Wagner P 2009 Phys. Rev. B 80 224518
|
[8] |
Nesl'adek M, Tromson D, Mer C, Bergonzo P, Hubik P and Mares J J 2006 Appl. Phys. Lett. 88 232111
|
[9] |
Jiang X, Schiffmann K and Klages C P 1994 Phys. Rev. B bf50 8403
|
[10] |
Jiang X and Klages C P 1993 Appl. Phys. Lett. 62 3438
|
[11] |
Marevs J J, Hub'hik P, Krivstofik J, Kindl D, Fanta M, Nesl'adek M, Williams O and Gruen D M 2006 Appl. Phys. Lett. bf88 092107
|
[12] |
Liao K J, Wang W L and Wang B B 2000 Microfabreication Technology 1 75
|
[13] |
Wang W L, Liao K J and Wang B B 2000 Diam. Relat. Mater. bf9 1612
|
[14] |
Fei Y J, Yang D, Wang X, Meng Q B, Wang X J, Xiong Y Y, Nie Y X and Feng K A 2002 Diam. Relat. Mater. bf11 49
|
[15] |
Kong C Y, Wang W L, Liao K J, Wang S X and Fang L 2002 J. Appl. Phys. 91 3044
|
[16] |
Kong C Y, Wang W L, Liao K J, Wang S X and Fang L 2002 J. Phys. Cond. Matt. 14 1765 endfootnotesize
|
No Suggested Reading articles found! |
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
Cited |
|
|
|
|
Altmetric
|
blogs
Facebook pages
Wikipedia page
Google+ users
|
Online attention
Altmetric calculates a score based on the online attention an article receives. Each coloured thread in the circle represents a different type of online attention. The number in the centre is the Altmetric score. Social media and mainstream news media are the main sources that calculate the score. Reference managers such as Mendeley are also tracked but do not contribute to the score. Older articles often score higher because they have had more time to get noticed. To account for this, Altmetric has included the context data for other articles of a similar age.
View more on Altmetrics
|
|
|