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Chin. Phys. B, 2008, Vol. 17(4): 1454-1460    DOI: 10.1088/1674-1056/17/4/051
CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES Prev   Next  

Comparison between photoluminescence spectroscopy and photoreflectance spectroscopy in CuGaSe2 epilayer

Zhen Guo-Yong(甄国涌), Jian Ao-Qun(菅傲群), Xu Hong-Yan(徐宏妍),Xue Chen-Yang(薛晨阳), and Zhang Wen-Dong(张文栋)
Key Laboratory of Instrumentation Science & Dynamic Measurement (North University of China), Ministry of Education and National Key Laboratory For Electronic Measurement Technology North University of China, Taiyuan 030051, China
Abstract  Photoluminescence (PL) spectroscopy and photoreflectance (PR) spectroscopy are very useful techniques for studying the properties of materials. In this paper, the same material of Cu-rich metal-organic vapour phase epitaxy (MOVPE) grown CuGaSe$_{2}$ layer is investigated in a temperature range from 20 to 300 K to compare these two techniques. Both PL and PR spectra appear red shifted, less intense and broadened. The temperature dependence of interband transitions is studied by using the Manoogian--Leclerc equation. The values of the band gap energy at $T$=0 K and the effective phonon temperature are estimated. The temperature dependences of intensities and broadenings of PL and PR spectral lines are also analysed. Based on the results of the comparison, the features and applications of the PL and PR can be shown in detail.
Keywords:  photoluminescence      photoreflectance      comparison      CuGaSe$_{2}$  
Received:  10 July 2007      Revised:  18 October 2007      Accepted manuscript online: 
PACS:  78.55.Hx (Other solid inorganic materials)  
  78.66.Li (Other semiconductors)  
  81.15.Gh (Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, ALD, etc.))  
  81.15.Kk (Vapor phase epitaxy; growth from vapor phase)  
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos 50405025 and 50535030) and the Program for New Century Excellent Talents in University.

Cite this article: 

Zhen Guo-Yong(甄国涌), Jian Ao-Qun(菅傲群), Xu Hong-Yan(徐宏妍), Xue Chen-Yang(薛晨阳), and Zhang Wen-Dong(张文栋) Comparison between photoluminescence spectroscopy and photoreflectance spectroscopy in CuGaSe2 epilayer 2008 Chin. Phys. B 17 1454

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