Field-ion microscopy observation of single-walled carbon nanotubes
Zhang Zhao-Xiang (张兆祥)a, Zhang Geng-Min (张耿民)a, Du Min (杜民)a, Jin Xin-Xi (金新喜)a, Hou Shi-Min (侯士敏)a, Sun Jian-Ping (孙建平)a , Gu Zhen-Nan (顾镇南)b, Zhao Xing-Yu (赵兴钰)a, Liu Wei-Min (刘惟敏)a, Wu Jin-Lei (吴锦雷)a, Xue Zeng-Quan (薛增泉)a
a Department of Electronics, Beijing University, Beijing 100871, China; b College of Chemistry and Molecular Engineering, Beijing University, Beijing 100871, China
Abstract Field-ion microscopy (FIM), a tool for surface analysis with atomic resolution, has been employed to observe the end structure of single-walled carbon nanotubes (SWCNTs). FIM images revealed the existence of open SWCNT ends. Amorphous carbon atoms were also observed to occur around SWCNTs and traditional field evaporation failed to remove them. Heat treatment was found to be efficacious in altering the end structures of SWCNT bundles. Carbon and oxygen atoms released from heated tungsten filament are believed to be responsible for the decoration imposed on the SWCNT ends.
Received: 23 December 2001
Revised: 10 March 2002
Accepted manuscript online:
Fund: Project supported by the National Natural Science Foundation of China (Grant Nos 69890221, 69971003 and 60128101), the MOST of China (No 2001CB610503) and the Key Foundation for Science and Technology Research of Education Ministry (No 00005).
Cite this article:
Zhang Zhao-Xiang (张兆祥), Zhang Geng-Min (张耿民), Du Min (杜民), Jin Xin-Xi (金新喜), Hou Shi-Min (侯士敏), Sun Jian-Ping (孙建平), Gu Zhen-Nan (顾镇南), Zhao Xing-Yu (赵兴钰), Liu Wei-Min (刘惟敏), Wu Jin-Lei (吴锦雷), Xue Zeng-Quan (薛增泉) Field-ion microscopy observation of single-walled carbon nanotubes 2002 Chinese Physics 11 804
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