Surface solitonic charge distribution on 2D materials investigated using Kelvin probe force microscopy technique based on qplus atomic force microscopy
Rui Song(宋睿)2, Feng Hao(郝峰)2, Jie Yang(杨杰)2, Lifeng Yin(殷立峰)1,2,3,4,†, and Jian Shen(沈健)1,2,3,4,‡
1 Shanghai Research Center for Quantum Sciences, Shanghai 201315, China; 2 State Key Laboratory of Surface Physics, Institute for Nanoelectronic Devices and Quantum Computing, and Department of Physics, Fudan University, Shanghai 200438, China; 3 Zhangjiang Fudan International Innovation Center, Fudan University, Shanghai 201210, China; 4 Collaborative Innovation Center of Advanced Microstructures, Nanjing 210093, China
Abstract Recently, charged solitons have been found in a two-dimensional CoCl/HOPG system, whose microscopic nature remains to be elusive. In this work, we investigate the charged solitons in monolayer CoCl using scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Moreover, we study the electrical properties of the charged solitons at zero electric field by measuring local contact potential difference (LCPD) via Kelvin probe force microscopy (KPFM) using the method. The compensation voltage corresponding to the vertex of the parabola is obtained by fitting the quadratic relationship between and sample bias. The results show that, without an external electric field, the solitons behave as negatively charged entities. Meanwhile, the LCPD mapping characterizes the spatial distribution of the potential at the charged solitons, which agrees well with those obtained from STM band bending measurements.
Fund: Project supported by the National Key Research and Development Program of China (Grant Nos. 2022YFA1403300 and 2019YFA0308404), the National Natural Science Foundation of China (Grant Nos. 11427902, 11991060, 12074075, 12474165, 12274084, and 12241402), Shanghai Municipal Science and Technology Major Project (Grant No. 2019SHZDZX01), Shanghai Municipal Natural Science Foundation (Grant No. 22ZR1407400), Innovation Program for Quantum Science and Technology (Grant No. 2024ZD0300104), Innovation Program of Shanghai Municipal Education Commission (Grant No. 2023ZKZD03), Science and Technology Commission of Shanghai Municipality (Grant No. 20JC1415900), and China Postdoctoral Science Foundation (Grant No. KLH1512149).
Rui Song(宋睿), Feng Hao(郝峰), Jie Yang(杨杰), Lifeng Yin(殷立峰), and Jian Shen(沈健) Surface solitonic charge distribution on 2D materials investigated using Kelvin probe force microscopy technique based on qplus atomic force microscopy 2025 Chin. Phys. B 34 056802
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