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Atomic-level characterization of liquid/solid interface |
Jiani Hong(洪嘉妮)1 and Ying Jiang(江颖)1,2,3, † |
1 International Center for Quantum Materials, School of Physics, Peking University, Beijing 100871, China 2 Collaborative Innovation Center of Quantum Matter, Beijing 100871, China 3 CAS Center for Excellence in Topological Quantum Computation, University of Chinese Academy of Sciences, Beijing 100190, China |
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Abstract The detailed understanding of various underlying processes at liquid/solid interfaces requires the development of interface-sensitive and high-resolution experimental techniques with atomic precision. In this perspective, we review the recent advances in studying the liquid/solid interfaces at atomic level by electrochemical scanning tunneling microscope (EC-STM), non-contact atomic force microscopy (NC-AFM), and surface-sensitive vibrational spectroscopies. Different from the ultrahigh vacuum and cryogenic experiments, these techniques are all operated in situ under ambient condition, making the measurements close to the native state of the liquid/solid interface. In the end, we present some perspectives on emerging techniques, which can defeat the limitation of existing imaging and spectroscopic methods in the characterization of liquid/solid interfaces.
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Received: 08 May 2020
Revised: 06 July 2020
Accepted manuscript online: 28 July 2020
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Corresponding Authors:
†Corresponding author. E-mail: yjiang@pku.edu.cn
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Cite this article:
Jiani Hong(洪嘉妮) and Ying Jiang(江颖) Atomic-level characterization of liquid/solid interface 2020 Chin. Phys. B 29 116803
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